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公开(公告)号:US20210279379A1
公开(公告)日:2021-09-09
申请号:US17029087
申请日:2020-09-23
Inventor: Yuehang XU , Shuman MAO , Yunqiu WU , Ruimin XU , Bo YAN
IPC: G06F30/20
Abstract: A parameter extraction method for quasi-physical large-signal model for microwave gallium nitride high-electron-mobility transistors (GaN HEMTs). The method includes: 1) acquiring a data set of parameters for a large-signal model for a plurality of different microwave transistors GaN HEMTs having the same size; 2) performing statistical analysis of physical parameters of the large-signal model and sub-models thereof: 3) characterizing the correlation between the physical parameters by factor analysis; and 4) predicting the output characteristics of the GaN HEMTs.