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公开(公告)号：US12222367B2
公开(公告)日：2025-02-11
申请号：US18130431
申请日：2023-04-04
Applicant: okins electronics Co.,Ltd
Inventor： Jin Kook Jun , Chan Ho Lee , Seung Hyun Noh
Abstract: A contact pin for a test socket is provided in the test socket for testing the electrical characteristics of a semiconductor device. The contact pin includes an elastic part elastically deformable in the longitudinal direction of the contact pin; a first contact part which includes a first support part extending from one end of the elastic part and a first contact tip connected to an end of the first support part; and a second contact part which includes a second support part extending from the other end of the elastic part and a second contact tip connected to an end of the second support part, where the elastic part and the second contact part are bent in at least one direction with respect to the first contact part.
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