摘要:
A mechanism for measuring duty cycle of a signal under test in an integrated circuit device, such as a microprocessor or system-on-a-chip is provided. The mechanism generates a frequency which is proportional to the duty cycle and which can be measured using common lab or manufacturing equipment. The mechanism may be implemented using simple circuits in a standard complementary metal oxide semiconductor process which requires very little area and can be powered off when it is not being used. The mechanism may include, for example, a low pass filter, a voltage divider for providing calibration reference voltage signals, a voltage to frequency converter, a frequency divider for dividing a frequency signal output so that the frequency of the signal is within a predetermined range, and an output driver and output pad. From the frequency output signal, a duty cycle of the signal under test may be calculated using off-chip equipment.
摘要:
The disclosed methodology and apparatus measures the duty cycle of a reference clock signal that a clock circuit supplies to a duty cycle measurement (DCM) circuit located “on-chip”, namely on an integrated circuit (IC) in which the DCM circuit is incorporated. In one embodiment, the DCM circuit includes a capacitor driven by a charge pump. The reference clock signal drives the charge pump. The clock circuit varies the duty cycle of the reference clock signal among a number of known duty cycle values. The DCM circuit stores resultant capacitor voltage values corresponding to each of the known duty cycle values in a data store. The DCM circuit applies a test clock signal having an unknown duty cycle to the capacitor via the charge pump, thus charging the capacitor to a new voltage value that corresponds to the duty cycle of the test clock signal. Control software accesses the data store to determine the duty cycle to which the test clock signal corresponds.
摘要:
A mechanism for measuring duty cycle of a signal under test in an integrated circuit device, such as a microprocessor or system-on-a-chip is provided. The mechanism generates a frequency which is proportional to the duty cycle and which can be measured using common lab or manufacturing equipment. The mechanism may be implemented using simple circuits in a standard complementary metal oxide semiconductor process which requires very little area and can be powered off when it is not being used. The mechanism may include, for example, a low pass filter, a voltage divider for providing calibration reference voltage signals, a voltage to frequency converter, a frequency divider for dividing a frequency signal output so that the frequency of the signal is within a predetermined range, and an output driver and output pad. From the frequency output signal, a duty cycle of the signal under test may be calculated using off-chip equipment.
摘要:
An apparatus and method for providing a reprogrammable electrically programmable fuse (eFuse) are provided. With the apparatus and method, a pair of eFuses are provided coupled to programming current sources and sensing current sources. When the pair of eFuses is to be programmed, a first programming current is applied to a first eFuse to thereby increase the resistance of the first eFuse by an incremental amount. When the pair of eFuses is to be returned to an unprogrammed state, a second programming current source is applied to a second eFuse to thereby increase a resistance of the second eFuse to be greater than the resistance of the first eFuse. When the sensing current is applied to the eFuses, a difference in the resulting voltages across the eFuses is identified and used to indicate whether the reprogrammable eFuse is in a programmed state or unprogrammed state.
摘要:
An apparatus and method for verifying glitch-free operation of a multiplexer are provided. The apparatus includes a circuit having a plurality of flip-flop elements that receive as inputs the plurality of clock signals that are inputs to the multiplexer, and a corresponding synchronized output signal of a decoder generated based on control inputs to the decoder. The synchronized output signals from the decoder are used as trigger signals to the plurality of flip-flops. The flip-flops sample the clock signals based upon the trigger signals and provide outputs to a logic gate. The logic gate operates on the outputs from the flip-flops to generate an output signal indicative of whether glitch-free operation is verified or is not verified.
摘要:
A method, an apparatus, and a computer program are provided to reduce transient current swings during mode transitions. Traditionally, transient supply voltage fluctuations on a chip account for a large portion of the power supply. The number of series inductances and resistances are typically minimized, while adding large decoupling capacitances between the supply voltage and ground. However, situations may arise where reduction of series inductances and resistances cannot be accomplished. Therefore, to assist in controlling the transient current swings, reduction of clocking frequencies are performed in a controlled manner.
摘要:
An apparatus is provided to reduce transient current swings during mode transitions. Traditionally, transient supply voltage fluctuations on a chip account for a large portion of the power supply. The number of series inductances and resistances are typically minimized, while adding large decoupling capacitances between the supply voltage and ground. However, situations may arise where reduction of series inductances and resistances cannot be accomplished. Therefore, to assist in controlling the transient current swings, reduction of clocking frequencies are performed in a controlled manner.
摘要:
The present invention provides for correcting excessive pulse widths using incremental delays. The pulse width is evaluated through a correction block and leak detector. An acceptable pulse passes through an interconnect directly to the clock output. Unacceptable pulses are sent through a block delay module that incorporates a series of delay sub-blocks that disconnect and reset in accordance with a pre-programmed total delay time. The conditioned clock pulse is resent through a node to the correction block and leak detector where it is reevaluated. If the pulse is acceptable, it is sent to the clock output. If the pulse is found unacceptable, it is recycled again. A high low clock pulse shuttle determines and alters the high or low state of the clock pulse to ensure a correct output to downstream dependent devices.
摘要:
A random number generator, a method, and a computer program product are provided for producing a random number seed. Each oscillator within an array of oscillators operates at a different frequency. The operating frequencies of each oscillator are not harmonically related, such that no integer multiple exists between the frequencies of any two oscillators. In one embodiment, the outputs of the array of oscillators connect to a multiple input latch. The multiple input latch also receives a sample signal, which is a clock signal. The clock signal samples the outputs of the array of oscillators, and the multiple input latch in conjunction with the random number determination logic (“RNDL”) produces a digital output (0 or 1) for each oscillator within the array. The RNDL uses these digital outputs to create a random number seed.
摘要:
A circuit for transitioning clocking speeds, or frequencies, is provided. With this circuit, a clocking circuit providing a first clock signal at a first clock frequency is coupled to a counter. A comparator and a first divider are coupled to an output of the counter. The first divider outputs a second clock signal at a second clock frequency. A second divider is interposed between the clocking circuit and the counter. A processor is coupled to an output of the first divider.