Method and System for Determining One or More Optical Characteristics of Structure of a Semiconductor Wafer
    101.
    发明申请
    Method and System for Determining One or More Optical Characteristics of Structure of a Semiconductor Wafer 有权
    确定半导体晶片结构的一个或多个光学特性的方法和系统

    公开(公告)号:US20130215420A1

    公开(公告)日:2013-08-22

    申请号:US13734506

    申请日:2013-01-04

    Abstract: Determination of one or more optical characteristics of a structure of a semiconductor wafer includes measuring one or more optical signals from one or more structures of a sample, determining a background optical field associated with a reference structure having a selected set of nominal characteristics based on the one or more structures, determining a correction optical field suitable for at least partially correcting the background field, wherein a difference between the measured one or more optical signals and a signal associated with a sum of the correction optical field and the background optical field is below a selected tolerance level, and extracting one or more characteristics associated with the one or more structures utilizing the correction optical field.

    Abstract translation: 半导体晶片的结构的一个或多个光学特性的确定包括测量来自样品的一个或多个结构的一个或多个光学信号,基于所述样品的一个或多个结构确定与具有所选择的一组标称特征的参考结构相关联的背景光学场 一个或多个结构,确定适合于至少部分校正背景场的校正光场,其中所测量的一个或多个光信号与与校正光场和背景光场之和相关联的信号之间的差异在以下 选择的公差等级,以及利用所述校正光场提取与所述一个或多个结构相关联的一个或多个特征。

    Electron-Bombarded Charge-Coupled Device And Inspection Systems Using EBCCD Detectors
    102.
    发明申请
    Electron-Bombarded Charge-Coupled Device And Inspection Systems Using EBCCD Detectors 审中-公开
    使用EBCCD检测器的电子轰击电荷耦合器件和检测系统

    公开(公告)号:US20130148112A1

    公开(公告)日:2013-06-13

    申请号:US13710315

    申请日:2012-12-10

    Abstract: A focusing EBCCD includes a control device positioned between a photocathode and a CCD. The control device has a plurality of holes therein, wherein the plurality of holes are formed perpendicular to a surface of the photocathode, and wherein a pattern of the plurality of holes is aligned with a pattern of pixels in the CCD. Each hole is surrounded by at least one first electrode, which is formed on a surface of the control device facing the photocathode. The control device may include a plurality of ridges between the holes. The control device may be separated from the photocathode by approximately half a shorter dimension of a CCD pixel or less. A plurality of first electrodes may be provided, wherein each first electrode surrounds a given hole and is separated from the given hole by a gap.

    Abstract translation: 聚焦EBCCD包括位于光电阴极和CCD之间的控制装置。 控制装置具有多个孔,其中多个孔垂直于光电阴极的表面形成,并且其中多个孔的图案与CCD中的像素图案对准。 每个孔被形成在面向光电阴极的控制装置的表面上的至少一个第一电极包围。 控制装置可以包括孔之间的多个脊。 控制装置可以与光电阴极分离CCD像素的大约一半的较短尺寸或更小。 可以提供多个第一电极,其中每个第一电极围绕给定的孔并且通过间隙与给定的孔分离。

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