公开(公告)号：US20230127994A1

公开(公告)日：2023-04-27

申请号：US17969207

申请日：2022-10-19

申请人： CHROMA ATE INC.

发明人： Po-Kai Cheng

IPC分类号： H05K7/20

摘要： An inlet module is adapted to be disposed on a housing of an electronic device, and includes an insert board and at least one adjusting plate. The insert board has a plurality of first air passages, at least one second air passage, and at least one positioning unit. The second air passage is located between two of the first air passages, and has an area larger than that of each first air passage. The adjusting plate has an opening having an area smaller than that of the second air passage. The adjusting plate is operable to be positioned at a position where the opening and the second air passage are overlapped with each other, thereby reducing an area of the airflow passing through the second air passage.

公开(公告)号：US11579170B2

公开(公告)日：2023-02-14

申请号：US17393724

申请日：2021-08-04

申请人： CHROMA ATE INC.

发明人： Chin-Yuan Chang ,  Chun-Hao Hu ,  Hsueh-Cheng Hsieh ,  Ming-Hui Chen

IPC分类号： G01R1/067

摘要： The present invention provides a probe apparatus, which comprises a signal transmission device, a probe, and a bottom fixing device. The signal transmission device includes a first transmission part and a second transmission part. An end of the probe is connected electrically below the second transmission part. The bottom fixing device is disposed below the signal transmission device. An end of the bottom fixing device includes a first penetrating hole and a first recess is disposed below the end. The probe passes through the first penetrating hole of the bottom fixing device. The probe is located in the first recess. The bottom fixing device reinforces the mechanical strength of the signal transmission device so that the width of the signal transmission device can be reduced. Thereby, the benefit of high-density arrangement of the probe apparatus can be achieved.

公开(公告)号：US20220209493A1

公开(公告)日：2022-06-30

申请号：US17536153

申请日：2021-11-29

申请人： CHROMA ATE INC.

发明人： Sheng-Hung WANG ,  Po-Hsiang CHANG

IPC分类号： H01S5/00 ,  G01R31/26

摘要： The present invention relates to a laser diode testing system and a laser diode testing method. The method comprises the steps of moving a laser bar or a plurality of laser diodes to a first test station by means of a first transfer device; then, electrically contacting each laser diode by a first probe module in sequence; measuring electrical and optical characteristics of the laser diodes electrically contacted by the first probe module sequentially by means of a first measuring device; moving the laser bar or the plurality of laser diodes out of the first test station by means of the first transfer device, wherein a magnetic field generated by an electromagnetic generating unit of an electromagnetic slide interacts with a magnetic field of a permanent magnet of the first transfer device, so that the first transfer device is driven and moved.

公开(公告)号：US20220206059A1

公开(公告)日：2022-06-30

申请号：US17551246

申请日：2021-12-15

申请人： CHROMA ATE INC.

发明人： Ming Cheng HUANG ,  Tsung-I LIN ,  Hui-Jung WU ,  Chien-Ming CHEN

IPC分类号： G01R31/28 ,  G01R1/04

摘要： The present invention relates to a low-thermal resistance pressing device for a socket, which mainly comprises a housing, an inner collar, a heat conductive pressing block, a bearing collar and a locking member. The locking member on the housing is used to lock the socket. The inner collar is threadedly engaged with the housing. The bearing collar is located between the inner collar and the heat conductive pressing block. In the case of rotating the inner collar in the housing, the bearing collar drives the heat conductive pressing block to move axially so as to exert an axial force to a device to be tested. Because the heat conductive pressing block protrudes from the upper and lower surfaces of the housing, one end thereof can be in contact with a temperature control module, and the other end thereof can be in contact with the device to be tested.

公开(公告)号：US11269170B2

公开(公告)日：2022-03-08

申请号：US16719386

申请日：2019-12-18

申请人： CHROMA ATE INC.

发明人： Shih-Yao Pan ,  Yu-Yen Wang ,  Tsung-Hsien Ou ,  Kuo-Wei Huang

IPC分类号： G02B21/00 ,  G02B21/02 ,  G02B21/36

摘要： A separate microscopy system, applied to observe a specimen positioned on a stage and further to image the specimen on an imaging device, includes an ocular-lens unit, an adjustment unit and an objective-lens unit. The ocular-lens unit has an ocular-lens optical axis, and is manipulated to make the ocular-lens optical axis perpendicular to the stage. The adjustment unit is assembled to a side of the ocular-lens unit close to the stage. The objective-lens unit has an objective-lens optical axis, and is assembled to a side of the adjustment unit close to the stage. The objective-lens unit is manipulated to be adjusted by the adjustment unit to make the ocular-lens optical axis, the objective-lens optical axis and the imaging device co-axially and perpendicular to the stage, such that the specimen can be imaged at an imaging center position of the imaging device. In addition, an adjusting method thereof is also provided.

公开(公告)号：US11169178B2

公开(公告)日：2021-11-09

申请号：US17023445

申请日：2020-09-17

申请人： Chroma Ate Inc.

发明人： Chin-Yi Ouyang ,  Chien-Ming Chen ,  Bo-An Su ,  Yu-Hsuen Wang

IPC分类号： G01R1/04

摘要： The present invention relates to a locking mechanism for a press head, and an electronic device testing apparatus comprising the same, wherein a slider and a locking pin are disposed on the press head and a test socket substrate, respectively. When the press head is moved and engaged with the test socket substrate, an actuator drives the slider to secure the locking pin, so as to secure the press head and the test socket substrate and prevent the press head and the test socket substrate from being separated from each other. The mechanism is simple in construction, easy to install and maintain, reliable, and can be integrated into the support arms, and occupies a relatively small space. Energy is consumed only when the actuator is actuated to effect locking or unlocking. That is, only when the slider is driven and moved, energy is consumed. No extra energy is needed to persistently press down or drive the locking mechanism.

公开(公告)号：US10903618B2

公开(公告)日：2021-01-26

申请号：US16358812

申请日：2019-03-20

申请人： Chroma Ate Inc.

发明人： James E. Hopkins

IPC分类号： H01S5/00 ,  G01R31/26 ,  H01S5/024

摘要： A fixture assembly having a base, an upper cover and a latch mechanism for testing an edge-emitting laser diode and a testing apparatus having the same are provided. The base includes a pocket, and a transmission cavity in communication with and orthogonal to the pocket. The upper cover includes a body, an abutting block and a pressing member. The abutting block having an electrical contact interface is engageable with the body for slidable movement with respect to the body. The latch mechanism is disposed on the upper cover, and may selectively connect or disconnect the upper cover to or from the base. When the latch mechanism is operated to connect the upper cover to the base, the pressing member applies a force through the abutting block on the edge-emitting laser diode received in the pocket, and the edge-emitting laser diode emits the laser for inspection through the transmission cavity.

公开(公告)号：US10802070B2

公开(公告)日：2020-10-13

申请号：US15955668

申请日：2018-04-17

申请人： CHROMA ATE INC.

发明人： Ching-Hua Chu ,  Cheng-Hsien Chang

IPC分类号： G01R31/28 ,  G01R1/36

摘要： A testing device includes a switch, a sensing circuit, and a control circuit. The switch is coupled to a power supply circuit, and the power supply circuit is configured to output a supply voltage to a device under-test via the switch. The sensing circuit is coupled to the device under-test, and the sensing circuit is configured to receive an input voltage from the device under-test and to output a sensing signal according to the input voltage. The control circuit is coupled to the sensing circuit, the power supply circuit, and the switch. The control circuit is configured to control the power supply circuit to stop outputting the supply voltage at a first time and to turn off the switch at a second time according to the sensing signal.

公开(公告)号：US10712366B2

公开(公告)日：2020-07-14

申请号：US16222391

申请日：2018-12-17

申请人： CHROMA ATE INC.

发明人： Hsu-Chang Hsu ,  Kuo-Yen Hsu ,  Chuan-Tse Lin

IPC分类号： G01R1/067

摘要： An electrical probe includes a probe assembly and a second electrical connection member. The probe assembly includes a needle cylinder, a first electrical connection member, a probe head and a sub-probe. The first electrical connection member and the probe head locate to two opposite sides of the needle cylinder. The first electrical connection member and the probe head electrically connect the needle cylinder. The sub-probe penetrates the probe head, and plugs the needle cylinder to electrically connect a cable but being electrically isolated from the needle cylinder. The sub-probe is located on a side away from the first electrical connection member. When the probe head depresses the object, the needle cylinder drives the first cylinder to a contact position to allow the first electrical connection member to electrically contact the second electrical connection member, and thus the probe head connects the second electrical connection member via the needle cylinder.

公开(公告)号：US10411646B2

公开(公告)日：2019-09-10

申请号：US16013917

申请日：2018-06-20

申请人： CHROMA ATE INC.

发明人： Cheng-Ting Tsai ,  Lan-Sheng Yang

IPC分类号： H02S50/10 ,  G02B27/30 ,  H01L31/048 ,  H01L31/0224 ,  H02S50/15

摘要： A method for inspecting a solar cell and configured to inspect a peeling state of a three-dimensional pattern of the solar cell includes obliquely illuminating the three-dimensional pattern of the solar cell using a light beam. An image of the solar cell is normally captured. An intensity of the light beam is increased to increase a contrast between the three-dimensional pattern and a shadow of the three-dimensional pattern in the image and increase a contrast between an ink pattern of the solar cell and the shadow in the image to overexpose the ink pattern in the image. Determine if the three-dimensional pattern is peeling according to the shadow of the three-dimensional pattern in the image.