公开(公告)号：US12096593B2

公开(公告)日：2024-09-17

申请号：US17969207

申请日：2022-10-19

申请人： CHROMA ATE INC.

发明人： Po-Kai Cheng

IPC分类号： H05K7/20

CPC分类号： H05K7/20145 ,  H05K7/20172 ,  H05K7/20436

摘要： An inlet module is adapted to be disposed on a housing of an electronic device, and includes an insert board and at least one adjusting plate. The insert board has a plurality of first air passages, at least one second air passage, and at least one positioning unit. The second air passage is located between two of the first air passages, and has an area larger than that of each first air passage. The adjusting plate has an opening having an area smaller than that of the second air passage. The adjusting plate is operable to be positioned at a position where the opening and the second air passage are overlapped with each other, thereby reducing an area of the airflow passing through the second air passage.

公开(公告)号：US20240219435A1

公开(公告)日：2024-07-04

申请号：US18395276

申请日：2023-12-22

申请人： CHROMA ATE INC.

发明人： Jyun-Yi SU ,  Sheng-Shiuan JIAN ,  Ting-Ting CHANG ,  Wen-Yue CHUANG

IPC分类号： G01R19/165

CPC分类号： G01R19/16566

摘要： A source measure device includes a current sampling circuit, a voltage sampling circuit, an overvoltage detecting circuit, and a comparing circuit. The current sampling circuit is configured to sample a current of a device under test. The voltage sampling circuit is configured to sample a voltage of the device under test. The overvoltage detecting circuit is coupled to the current sampling circuit and the voltage sampling circuit, and receives a first operation voltage of the current sampling circuit and a second operation voltage of the voltage sampling circuit so as to generate a detection voltage. The comparing circuit is coupled to the overvoltage detecting circuit, and determines whether the detection voltage is within a voltage range. If the detection voltage is not within the voltage range, the comparing circuit generates an abnormal signal.

公开(公告)号：US12015239B2

公开(公告)日：2024-06-18

申请号：US17536153

申请日：2021-11-29

申请人： CHROMA ATE INC.

发明人： Sheng-Hung Wang ,  Po-Hsiang Chang

IPC分类号： H01S5/00 ,  G01R31/26

CPC分类号： H01S5/0014 ,  G01R31/2635

摘要： The present invention relates to a laser diode testing system and a laser diode testing method. The method comprises the steps of moving a laser bar or a plurality of laser diodes to a first test station by means of a first transfer device; then, electrically contacting each laser diode by a first probe module in sequence; measuring electrical and optical characteristics of the laser diodes electrically contacted by the first probe module sequentially by means of a first measuring device; moving the laser bar or the plurality of laser diodes out of the first test station by means of the first transfer device, wherein a magnetic field generated by an electromagnetic generating unit of an electromagnetic slide interacts with a magnetic field of a permanent magnet of the first transfer device, so that the first transfer device is driven and moved.

公开(公告)号：US20240097216A1

公开(公告)日：2024-03-21

申请号：US18207171

申请日：2023-06-08

申请人： CHROMA ATE INC.

发明人： CHUAN-TSE LIN ,  CHEN-CHOU WEN ,  SHIH-CHIN TAN ,  WEN-CHUAN CHANG ,  YING-CHENG CHEN

IPC分类号： H01M10/42 ,  H01M10/48

CPC分类号： H01M10/4285 ,  H01M10/48

摘要： The present invention discloses a detection device and a probe module thereof, wherein an electrical connection path between a battery detection frame and a battery under test is provided via the probe module. The probe module includes a base, a first polarity plate, a second polarity plate, a first upper connection group, a second upper connection group, a first lower connection member and a second lower connection member. Via the first polarity plate, the first upper connection group is correspondingly coupled to the battery detection frame, and the first lower connection member is correspondingly coupled to the battery under test. Via the second polarity plate, the second upper connection group is correspondingly coupled to the battery detection frame, and the second lower connection member is correspondingly coupled to the battery under test. Thus, it is not necessary to process a cable having been fixed on the battery detection frame when the probe module is replaced. Moreover, since each polarity has dedicated coupling elements respectively corresponding to the battery detection frame and the battery under test, reliability is enhanced.

公开(公告)号：US11901833B2

公开(公告)日：2024-02-13

申请号：US17938055

申请日：2022-10-05

申请人： CHROMA ATE INC.

发明人： Cheng Chung Lee ,  Szu Chieh Su ,  Wen Chih Chen ,  Chih Hsing Lin ,  Jhen Wei Gong

IPC分类号： H02M5/44 ,  H02M1/00

CPC分类号： H02M5/44 ,  H02M1/0009

摘要： Systems and methods for switching between a power supply mode and an electronic load mode are disclosed. For switching from the power supply mode to the electronic load mode, the method comprises the steps of: deactivating a power element; activating a current control module and a phase-locked loop to obtain a voltage phase of a device under test; calculating a turn-on amount of the power element according to a current setting value and the voltage phase; and causing the power element to generate a load current for the device under test. For switching from the electronic load mode to the power supply mode, the method comprises the steps of: deactivating the power element; activating a voltage control module; calculating the turn-on amount of the power element according to a voltage setting value; and causing the power element to input a corresponding voltage to the device under test.

公开(公告)号：US20230204659A1

公开(公告)日：2023-06-29

申请号：US17981167

申请日：2022-11-04

申请人： CHROMA ATE INC.

发明人： Chun-Lin WU ,  Kuo Wei HUANG

IPC分类号： G01R31/28

CPC分类号： G01R31/2889

摘要： A micro device under test (DUT) carrier includes a carrier main body, a pusher and a spring. The carrier main body includes a plurality of bearing stages. Each bearing stage is utilized to bear a micro DUT. The pusher, operated to move from a locking position to an opening position, includes a pusher main body and a plurality of locking elements. Each locking element corresponds to each bearing stage, and is located next to each bearing stage. The spring is utilized to send the pusher back to the locking position, so that each locking element restricts movement of each micro DUT.

公开(公告)号：US20230204260A1

公开(公告)日：2023-06-29

申请号：US17976906

申请日：2022-10-31

申请人： CHROMA ATE INC.

发明人： JIAN-HUNG LIN ,  SHAO-EN CHUNG

IPC分类号： F25B13/00 ,  F25B39/04 ,  F28C3/08

CPC分类号： F25B13/00 ,  F25B39/04 ,  F28C3/08 ,  F25B19/005

摘要： A heat exchange device and a cooling system are provided. The heat exchange device includes a low-pressure chamber and a high-pressure chamber disposed in the low-pressure chamber. The low-pressure chamber has a first wall for enabling heat exchange and an output portion in communication with the outside to output the low-pressure fluid. The high-pressure chamber has an input portion in communication with the outside to admit the high-pressure fluid and nozzles in communication with the low-pressure chamber. The fluid discharged from the nozzles undergoes a pressure drop and undergoes heat exchange through the first wall. Cooling capability is developed in the heat exchange device and works in the heat exchange device to thereby dispense with a pipeline which must be otherwise provided to link an expansion process and an evaporation process of the fluid and may otherwise cause cooling capability loss, so as to greatly enhance heat exchange capability and cooling efficiency.

公开(公告)号：US20230155497A1

公开(公告)日：2023-05-18

申请号：US18050060

申请日：2022-10-27

申请人： CHROMA ATE INC.

发明人： Chen Yuan WU ,  Chih Hsien WANG ,  Kuo Cheng WANG ,  Cheng Chung LEE

IPC分类号： H02M3/139 ,  H02M3/158 ,  H02M3/157 ,  H02M1/00

CPC分类号： H02M3/139 ,  H02M1/0025 ,  H02M3/157 ,  H02M3/1582

摘要： The present invention relates to an AC/DC power conversion module and a method of driving the same. When an AC/DC converter is electrically coupled to an external power source, a microprocessor is electrically energized by a buck auxiliary circuit, under control of the microprocessor, a DC/DC converter is activated for a certain time period, and then, the AC/DC converter is activated. Thereafter, an output voltage of the AC/DC converter is boosted, and an output voltage of the DC/DC converter is boosted accordingly. Power elements in the downstream side DC/DC converter are activated first, and then power elements in the upstream side AC/DC converter are activated, thereby an inrush current is suppressed. Once the external power source is connected, the buck auxiliary circuit will automatically reduce a voltage of the power input to activate the module. It realizes that the module will autonomously operate after being electrically energized.

公开(公告)号：US20230127994A1

公开(公告)日：2023-04-27

申请号：US17969207

申请日：2022-10-19

申请人： CHROMA ATE INC.

发明人： Po-Kai Cheng

IPC分类号： H05K7/20

摘要： An inlet module is adapted to be disposed on a housing of an electronic device, and includes an insert board and at least one adjusting plate. The insert board has a plurality of first air passages, at least one second air passage, and at least one positioning unit. The second air passage is located between two of the first air passages, and has an area larger than that of each first air passage. The adjusting plate has an opening having an area smaller than that of the second air passage. The adjusting plate is operable to be positioned at a position where the opening and the second air passage are overlapped with each other, thereby reducing an area of the airflow passing through the second air passage.

公开(公告)号：US11579170B2

公开(公告)日：2023-02-14

申请号：US17393724

申请日：2021-08-04

申请人： CHROMA ATE INC.

发明人： Chin-Yuan Chang ,  Chun-Hao Hu ,  Hsueh-Cheng Hsieh ,  Ming-Hui Chen

IPC分类号： G01R1/067

摘要： The present invention provides a probe apparatus, which comprises a signal transmission device, a probe, and a bottom fixing device. The signal transmission device includes a first transmission part and a second transmission part. An end of the probe is connected electrically below the second transmission part. The bottom fixing device is disposed below the signal transmission device. An end of the bottom fixing device includes a first penetrating hole and a first recess is disposed below the end. The probe passes through the first penetrating hole of the bottom fixing device. The probe is located in the first recess. The bottom fixing device reinforces the mechanical strength of the signal transmission device so that the width of the signal transmission device can be reduced. Thereby, the benefit of high-density arrangement of the probe apparatus can be achieved.