摘要:
Obtaining a functional coverage model of a System Under Test (SUT) defining all functional coverage tasks of the SUT, wherein the functional coverage model defining a test-space with respect to functional attributes; obtaining a set of covered functional coverage tasks; encoding a covered Binary Decision Diagram (BDD) to represent the set of covered functional coverage tasks within the test-space; and manipulating the covered BDD to identify one or more coverage holes, wherein a coverage hole defines a set of coverage tasks in the test-space, all having a same combination of values to a subset of the functional attributes, that are not covered by the set of covered functional coverage task.
摘要:
A method for modeling a test space is provided. The method comprises defining a coverage model including: one or more variables, wherein respective values for the variables are assigned, and one or more definitions for value combinations for said variables with assigned values, wherein at least one of said value combinations is defined as optional, and zero or more other said value combinations are defined as forbidden or mandatory for purpose of generating test scenarios to test a system for which the coverage model is defined.
摘要:
A method for refining a test plan is provided. The method comprises defining a coverage model including: one or more variables, wherein respective values for the variables are assigned, and one or more definitions for value combinations for said variables with assigned values, wherein zero or more of said value combinations are defined according to one or more restrictions for the purpose of generating a test plan to test a system for which the coverage model is constructed; determining zero or more uncovered value combinations in the test plan; and providing means to update the test plan.
摘要:
A method for modeling a test space comprising defining a coverage model including: one or more variables, wherein respective values for the variables are assigned, and restrictions based on which valid variable value combinations are determined for the purpose of testing the model, wherein at least two values that are assignable to the one or more variables are merged to reduce number of variable values in the coverage model.
摘要:
Obtaining a functional coverage model of a System Under Test (SUT) defining all functional coverage tasks of the SUT, wherein the functional coverage model defining a test-space with respect to functional attributes; obtaining a set of covered functional coverage tasks; encoding a covered Binary Decision Diagram (BDD) to represent the set of covered functional coverage tasks within the test-space; and manipulating the covered BDD to identify one or more coverage holes, wherein a coverage hole defines a set of coverage tasks in the test-space, all having a same combination of values to a subset of the functional attributes, that are not covered by the set of covered functional coverage task.
摘要:
A method for refining a test plan is provided. The method comprises defining a coverage model including: one or more variables, wherein respective values for the variables are assigned, and one or more definitions for value combinations for said variables with assigned values, wherein zero or more of said value combinations are defined according to one or more restrictions for the purpose of generating a test plan to test a system for which the coverage model is constructed; determining zero or more uncovered value combinations in the test plan; and providing means to update the test plan.
摘要:
Systems and methods for modeling test space for verifying system behavior, using one or more auxiliary variables, are provided. The method comprises implementing a functional coverage model including: one or more attributes, wherein respective values for the attributes are assigned according to a test plan, and one or more constraints defining restrictions on value combinations assigned to the attributes, wherein the restrictions are Boolean expressions defining whether said value combinations are valid; determining a set of valid value combinations for the attributes that satisfy the restrictions to define the test space for verifying the system behavior; and determining relevant auxiliary variables and a corresponding function for said auxiliary variables to reduce the complexity associated with modeling the test space.
摘要:
A novel and useful method of implementing a full coverage low power mode in a storage system comprised of one or more memory storage devices storing replicated data items. A subset of the memory storage devices is chosen whose replicated data items require the least amount of storage. If the chosen subset stores uncovered data items, these data items are copied to an auxiliary memory storage device. The storage system can enter a full coverage low power mode by powering down the chosen subset of memory storage devices.