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29 条记录 (耗时 0.016 秒)

    High frequency deflection measurement of IR absorption
    11.
    发明授权
    High frequency deflection measurement of IR absorption 有权
    红外吸收的高频偏转测量

    公开(公告)号：US08001830B2

    公开(公告)日：2011-08-23

    申请号：US11803421

    申请日：2007-05-15

    申请人： Alexandre Dazzi ,  Rui Prazeres ,  Kevin Kjoller ,  Michael Reading

    发明人： Alexandre Dazzi ,  Rui Prazeres ,  Kevin Kjoller ,  Michael Reading

    IPC分类号： G01B5/28 ,  G01N21/84 ,  G01Q80/00

    CPC分类号： G01Q60/38 ,  G01N21/35 ,  G01N21/3563 ,  G01Q30/02 ,  G01Q60/32

    摘要： An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.

    摘要翻译： 已经证明了基于AFM的技术用于在样品表面上进行高度局部化的IR光谱。 在商业可行的分析仪器中实施的这种技术将是非常有用的。 必须改变实验设置的各个方面，以创建商业版本。 本发明解决了许多这些问题，从而产生了一般可用于科学界的驾驶室的分析技术的版本。

    Microcantilever with Reduced Second Harmonic While in Contact with a Surface and Nano Scale Infrared Spectrometer
    12.
    发明申请
    Microcantilever with Reduced Second Harmonic While in Contact with a Surface and Nano Scale Infrared Spectrometer 有权
    在与表面和纳米级红外光谱仪接触的同时减少二次谐波的微型悬臂梁

    公开(公告)号：US20110061452A1

    公开(公告)日：2011-03-17

    申请号：US12558150

    申请日：2009-09-11

    申请人： William P. King ,  Jonathan R. Felts ,  Craig Prater ,  Kevin Kjoller

    发明人： William P. King ,  Jonathan R. Felts ,  Craig Prater ,  Kevin Kjoller

    IPC分类号： G01B5/28

    CPC分类号： G01Q60/38 ,  G01Q60/32

    摘要： Described herein are devices and methods for sensing pulsed forces. Some of the described devices and methods are also useful for measuring infrared absorbances and compiling spectral and chemical maps of surfaces. Also described are microcantilever having reduced harmonic frequencies when operating in contact mode. Some of the described microcantilevers comprise an internal resonator configured to vibrate substantially independent of friction between the microcantilever tip and a surface when the microcantilever operates in contact mode. A number of the described devices and methods are useful for monitoring pulsed forces with enhanced sensitivity.

    摘要翻译： 这里描述了用于感测脉冲力的装置和方法。 所描述的装置和方法中的一些也可用于测量红外吸收和编辑表面的光谱和化学图谱。 还描述了当在接触模式下操作时具有降低的谐波频率的微型悬臂梁。 所描述的微悬臂梁中的一些包括内部谐振器，其构造成当微悬臂操作在接触模式时基本上独立于微悬臂尖端和表面之间的摩擦而振动。 所描述的装置和方法中的许多用于以增强的灵敏度监测脉冲力。

    Probe for a scanning probe microscope and method of manufacture
    14.
    发明申请
    Probe for a scanning probe microscope and method of manufacture 审中-公开
    探针用于扫描探针显微镜及其制造方法

    公开(公告)号：US20060213289A1

    公开(公告)日：2006-09-28

    申请号：US11089165

    申请日：2005-03-24

    申请人： Kevin Kjoller ,  Ami Chand ,  Nihat Okulan

    发明人： Kevin Kjoller ,  Ami Chand ,  Nihat Okulan

    IPC分类号： G01B5/28 ,  G01D21/00

    CPC分类号： G01Q60/38 ,  B82Y35/00

    摘要： A probe assembly for an instrument and a method of manufacture includes a substrate and a cantilever having a length independent of typical alignment error during fabrication. In one embodiment, the probe assembly includes a buffer section interposed between the substrate and the cantilever. The cantilever extends from the buffer section and a portion of the buffer section extends beyond an edge of the substrate. The portion of the buffer section is more stiff than the cantilever. The corresponding method of producing the probe assembly facilitates batch fabrication without compromising probe performance.

    摘要翻译： 用于仪器的探针组件和制造方法包括在制造期间具有独立于典型对准误差的长度的基底和悬臂。 在一个实施例中，探针组件包括介于基底和悬臂之间的缓冲部分。 悬臂从缓冲部分延伸，并且缓冲部分的一部分延伸超过基底的边缘。 缓冲部分的部分比悬臂更硬。 生产探针组件的相应方法有利于批量制作而不损害探针性能。

    High frequency deflection measurement of IR absorption
    15.
    发明授权
    High frequency deflection measurement of IR absorption 有权
    红外吸收的高频偏转测量

    公开(公告)号：US08607622B2

    公开(公告)日：2013-12-17

    申请号：US13135956

    申请日：2011-07-18

    申请人： Alexandre Dazzi ,  Rui Prazeres ,  Kevin Kjoller ,  Michael Reading

    发明人： Alexandre Dazzi ,  Rui Prazeres ,  Kevin Kjoller ,  Michael Reading

    IPC分类号： G01B5/28 ,  G01N21/84 ,  G01Q80/00

    CPC分类号： G01Q60/38 ,  G01N21/35 ,  G01N21/3563 ,  G01Q30/02 ,  G01Q60/32

    摘要： An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.

    摘要翻译： 已经证明了基于AFM的技术用于在样品表面上进行高度局部化的IR光谱。 在商业可行的分析仪器中实施的这种技术将是非常有用的。 必须改变实验设置的各个方面，以创建商业版本。 本发明解决了许多这些问题，从而产生了一般可用于科学界的分析技术的版本。

    Dynamic power control, beam alignment and focus for nanoscale spectroscopy
    16.
    发明授权
    Dynamic power control, beam alignment and focus for nanoscale spectroscopy 有权
    动态功率控制，光束对准和聚焦纳米级光谱

    公开(公告)号：US08242448B2

    公开(公告)日：2012-08-14

    申请号：US12927248

    申请日：2010-11-09

    申请人： Craig Prater ,  Michael Lo ,  Doug Gotthard ,  Anthony Kurtz ,  Kevin Kjoller

    发明人： Craig Prater ,  Michael Lo ,  Doug Gotthard ,  Anthony Kurtz ,  Kevin Kjoller

    IPC分类号： G01J5/00

    CPC分类号： G01N21/3563 ,  G01Q30/02

    摘要： Dynamic IR radiation power control, beam steering and focus adjustment for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination with a beam from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise. Beam alignment and focus optimization as a function of wavelength are automatically performed.

    摘要翻译： 动态IR辐射功率控制，光束转向和聚焦调整，用于基于原子力显微镜的纳米级红外光谱系统。 在用来自IR源的光照射期间，监测由于局部IR样品吸收而导致AFM探针尖端与样品的相互作用。 动态地降低样品照度的功率，以使吸收率高的位置/波长处的样品过热度最小化，吸收低的位置/波长增加，以保持信噪比。 自动执行光束对准和聚焦优化作为波长的函数。

    Quantitative calorimetry signal for sub-micron scale thermal analysis
    19.
    发明授权
    Quantitative calorimetry signal for sub-micron scale thermal analysis 有权
    亚微米级热分析的定量量热信号

    公开(公告)号：US07665889B2

    公开(公告)日：2010-02-23

    申请号：US11801254

    申请日：2007-05-08

    申请人： Kevin Kjoller ,  Azzedine Hammiche

    发明人： Kevin Kjoller ,  Azzedine Hammiche

    IPC分类号： G01K17/00

    CPC分类号： G01Q60/58

    摘要： The invention is a system and method for producing highly localized calorimetry data on a sample surface. The system is based on an SPM or other system with a probe and fine positioning capability. A heated probe is used to take a small sample (nano-sample) of a surface, and thereby make calorimetry measurements in a controlled manner.

    摘要翻译： 本发明是用于在样品表面上产生高度局部化的量热数据的系统和方法。 该系统基于具有探头和精细定位能力的SPM或其他系统。 使用加热的探针来取出表面的小样品（纳米样品），从而以受控的方式进行量热测量。