公开(公告)号：US20090105967A1

公开(公告)日：2009-04-23

申请号：US12294076

申请日：2006-03-24

Applicant: Hiroaki Hatanaka ,  Nobukazu Ido ,  Minoru Tagami

Inventor： Hiroaki Hatanaka ,  Nobukazu Ido ,  Minoru Tagami

IPC: G01B17/08

CPC classification number: G01N29/12 ,  G01N29/0618 ,  G01N29/11 ,  G01N29/38 ,  G01N29/4445 ,  G01N29/46 ,  G01N2291/0289 ,  G01N2291/044 ,  G01N2291/2693

Abstract: An object of the present invention is to quantitatively evaluate a distribution of defects which are generated within an inspection material. In order to achieve this object, the present invention provides a defect inspection apparatus comprising: an ultrasonic wave probe; an ultrasonic wave transmitting and receiving device that irradiates ultrasonic waves via the ultrasonic wave probe onto a surface of an inspection material on which a predetermined propagation medium has been provided, and that also receives as noise signals ultrasonic waves that have been scattered by defects present in the interior of the inspection material; a frequency spectrum calculation device that performs time division on the noise signals so as to divide them into time widths that correspond to positions in the depth direction of the inspection material, and calculates a frequency spectrum for each one of the time-divided noise signals; and a defect distribution detection device that, based on the frequency spectrums, calculates values showing a level of defect progression corresponding to a position in the thickness direction of the inspection material.

Abstract translation: 本发明的目的是定量评估在检查材料内产生的缺陷的分布。 为了达到上述目的，本发明提供一种缺陷检查装置，包括：超声波探头; 超声波发送接收装置，其通过超声波探测器将超声波照射到已经设置有预定传播介质的检查材料的表面上，并且还接收作为噪声信号的超声波， 检验材料的内部; 频谱计算装置，对噪声信号进行时分，以将其分割成与检查材料的深度方向上的位置对应的时间宽度，并计算每个分时噪声信号的频谱; 以及缺陷分布检测装置，其基于所述频谱，计算显示与所述检查材料的厚度方向上的位置相对应的缺陷进展水平的值。

公开(公告)号：US5627142A

公开(公告)日：1997-05-06

申请号：US279416

申请日：1994-07-25

Applicant: Yasuji Yamada ,  Masaru Nakamura ,  Noriyuki Tatsumi ,  Jiro Tsujino ,  Kanshi Ohtsu ,  Yasuo Kanamori ,  Minoru Tagami ,  Atsushi Kume ,  Yuh Shiohara ,  Shoji Tanaka

Inventor： Yasuji Yamada ,  Masaru Nakamura ,  Noriyuki Tatsumi ,  Jiro Tsujino ,  Kanshi Ohtsu ,  Yasuo Kanamori ,  Minoru Tagami ,  Atsushi Kume ,  Yuh Shiohara ,  Shoji Tanaka

IPC: C30B19/12 ,  C04B35/45 ,  C30B15/00 ,  C30B25/02 ,  C30B29/22 ,  H01L39/24 ,  C30B15/02

CPC classification number: C30B29/225 ,  C04B35/4508 ,  C30B15/00 ,  H01L39/2422 ,  H01L39/2458 ,  Y10S428/93 ,  Y10S505/701 ,  Y10S505/704 ,  Y10S505/729 ,  Y10S505/733

Abstract: A composite material is disclosed which includes a substrate, an oriented film provided on a surface of the substrate and formed of a crystal of a Y123 metal oxide of the formula LnBa.sub.2 Cu.sub.3 O.sub.y wherein Ln stands for Y or an element belonging to the lanthanoid and y is a number of 6-7, and a layer of a Y123 metal oxide of the formula LnBa.sub.2 Cu.sub.3 O.sub.y wherein Ln stands for Y or an element belonging to the lanthanoid and y is a number of 6-7 formed on the oriented film.

Abstract translation: 公开了一种复合材料，其包括基板，设置在基板的表面上的取向膜，其由式LnBa2Cu3Oy的Y123金属氧化物的晶体形成，其中Ln表示Y或属于镧系元素，y表示 6-7的数量以及式LnBa2Cu3Oy的Y123金属氧化物层，其中Ln表示Y或属于镧系元素，y表示在取向膜上形成的数目6-7。