公开(公告)号：US06999897B2

公开(公告)日：2006-02-14

申请号：US10708573

申请日：2004-03-11

Applicant: Hung-En Tai ,  Chien-Chung Chen ,  Haw-Jyue Luo ,  Sheng-Jen Wang

Inventor： Hung-En Tai ,  Chien-Chung Chen ,  Haw-Jyue Luo ,  Sheng-Jen Wang

IPC: G11C7/00

CPC classification number: G05B19/41875 ,  Y02P90/22

Abstract: A method and related system for semiconductor equipment early warning management. The method includes recording process parameters of each piece of equipment, recording equipment parameters when each piece of equipment is processing, evaluating and recording the quality of semiconductor products and corresponding testing parameters, and analyzing a relationship between the corresponding process parameters, the corresponding equipment parameters, and the quality of semiconductor products of each piece of equipment.

Abstract translation: 一种半导体设备预警管理方法及相关系统。 该方法包括记录每件设备的处理参数，每台设备处理时记录设备参数，评估和记录半导体产品的质量和相应的测试参数，分析相应工艺参数，相应设备参数之间的关系 ，以及每件设备的半导体产品的质量。

公开(公告)号：US06950783B1

公开(公告)日：2005-09-27

申请号：US10708572

申请日：2004-03-11

Applicant: Hung-En Tai ,  Chien-Chung Chen ,  Sheng-Jen Wang

Inventor： Hung-En Tai ,  Chien-Chung Chen ,  Sheng-Jen Wang

IPC: G06F19/00 ,  G21C17/00

CPC classification number: H01L22/20 ,  G05B19/41875 ,  G06Q30/0283 ,  Y02P90/22

Abstract: A method and related system for semiconductor equipment prevention maintenance management. The method includes recording process parameters of each piece of equipment, recording equipment parameters when each piece of equipment is processing, evaluating and recording time and cost of prevention maintenance after each piece of equipment runs prevention maintenance, evaluating the quality of semiconductor products, and analyzing a relationship between the corresponding process parameter, the corresponding equipment parameters, prevention maintenance cost, and semiconductor products of each piece of equipment.

Abstract translation: 一种半导体设备预防维护管理方法及相关系统。 该方法包括记录每件设备的工艺参数，每台设备的加工记录设备参数，每台设备运行后的预防维护的评估和记录时间和成本预防维护，半导体产品的质量评估和分析 相应的过程参数，相应的设备参数，预防维护成本以及每件设备的半导体产品之间的关系。

公开(公告)号：US20050203715A1

公开(公告)日：2005-09-15

申请号：US10708573

申请日：2004-03-11

Applicant: Hung-En Tai ,  Chien-Chung Chen ,  Haw-Jyue Luo ,  Sheng-Jen Wang

Inventor： Hung-En Tai ,  Chien-Chung Chen ,  Haw-Jyue Luo ,  Sheng-Jen Wang

IPC: G06F19/00

CPC classification number: G05B19/41875 ,  Y02P90/22

Abstract: A method and related system for semiconductor equipment early warning management. The method includes recording process parameters of each piece of equipment, recording equipment parameters when each piece of equipment is processing, evaluating and recording the quality of semiconductor products and corresponding testing parameters, and analyzing a relationship between the corresponding process parameters, the corresponding equipment parameters, and the quality of semiconductor products of each piece of equipment.

Abstract translation: 一种半导体设备预警管理方法及相关系统。 该方法包括记录每件设备的处理参数，每台设备处理时记录设备参数，评估和记录半导体产品的质量和相应的测试参数，分析相应工艺参数，相应设备参数之间的关系 ，以及每件设备的半导体产品的质量。

公开(公告)号：US20120185620A1

公开(公告)日：2012-07-19

申请号：US13304372

申请日：2011-11-24

Applicant: Chia-Yun Cheng ,  Sheng-Jen Wang ,  Yun-Feng Tseng ,  Jun Cui

Inventor： Chia-Yun Cheng ,  Sheng-Jen Wang ,  Yun-Feng Tseng ,  Jun Cui

IPC: G06F13/14

CPC classification number: H04N19/129 ,  G06F5/10 ,  G06F13/385 ,  H04L49/90 ,  H04N19/174 ,  H04N19/176 ,  H04N19/423 ,  H04N19/436 ,  H04N19/44

Abstract: An exemplary buffering apparatus for buffering a multi-partition video/image bitstream which transmits a plurality of compressed frames each having a plurality of partitions includes a first bitstream buffer and a second bitstream buffer. The first bitstream buffer is arranged to buffer data of a first partition of the partitions of a specific compressed frame. The second bitstream buffer is arranged to buffer data of a second partition of the partitions of the specific compressed frame.

Abstract translation: 用于缓冲发送多个具有多个分区的多个压缩帧的多分区视频/图像比特流的示例性缓冲装置包括第一比特流缓冲器和第二比特流缓冲器。 第一比特流缓冲器被布置为缓冲特定压缩帧的分区的第一分区的数据。 第二比特流缓冲器被布置为缓冲特定压缩帧的分区的第二分区的数据。

公开(公告)号：US20060241802A1

公开(公告)日：2006-10-26

申请号：US11228361

申请日：2005-09-19

Applicant: Chien-Chung Chen ,  Sheng-Jen Wang ,  Yu-Wen Ho

Inventor： Chien-Chung Chen ,  Sheng-Jen Wang ,  Yu-Wen Ho

IPC: G06F19/00

CPC classification number: H01L21/67276 ,  G05B15/02 ,  G05B23/024 ,  G05B2219/1112 ,  G05B2219/45031 ,  G05B2223/02

Abstract: A real-time management method for manufacturing management and yield rate analysis integration. A plurality of yield rates relating to wafer products are summed and averaged for a historical yield rate. Multiple representational inline QC parameters are selected. A statistical process is implemented and, if no extreme value and collinear parameter exists and if analysis results satisfy normal distribution, multiple optimum inline QC parameters are selected from the representational inline QC parameters. Weights of each optimum inline QC parameter are calculated. A predicted yield rate is calculated according to the historical yield rate, weights, and a plurality of measurement and target values relating to the wafer products.

Abstract translation: 制造管理和产出率分析整合的实时管理方法。 将与晶片产品相关的多个屈服率以历史产量率相加和平均。 选择多个代表性的在线QC参数。 实施统计过程，如果没有极值和共线参数存在，并且如果分析结果满足正态分布，则从表示的在线QC参数中选择多个最佳在线QC参数。 计算每个最佳在线QC参数的权值。 根据历史收益率，权重以及与晶片产品相关的多个测量值和目标值来计算预测收益率。