公开(公告)号：US06794963B2

公开(公告)日：2004-09-21

申请号：US10063457

申请日：2002-04-24

申请人： Thomas Gary O'Keeffe ,  Christian Daehler ,  Shridhar Champaknath Nath ,  Anitha Bochala

发明人： Thomas Gary O'Keeffe ,  Christian Daehler ,  Shridhar Champaknath Nath ,  Anitha Bochala

IPC分类号： H01H900

CPC分类号： H01H71/7463 ,  H01H1/2041 ,  H01H71/2463

摘要： A magnetic trip unit for actuating a latching mechanism to trip a circuit breaker upon an overcurrent condition, the magnetic trip unit includes: a flux return component in electromagnetic communication with an electrically conductive strap; a tube disposed within the flux return component; a stator disposed at a first end of the tube and connected to the flux return component, the stator having a stator surface at one end; and a plunger slidably extending from a second end of the tube, the plunger comprises a plunger surface at one end facing the stator surface, the plunger further includes another end adapted to operably interact with the latching mechanism, the plunger is biased to a predetermined gap position.

摘要翻译： 一种用于致动闭锁机构以在过电流状态下使断路器跳闸的磁脱扣单元，所述磁脱扣单元包括：与导电带电磁连通的磁通返回部件; 设置在所述通量返回部件内的管; 定子，其设置在所述管的第一端并连接到所述磁通返回部件，所述定子在一端具有定子表面; 以及柱塞，其从所述管的第二端部可滑动地延伸，所述柱塞包括在面向所述定子表面的一端处的柱塞表面，所述柱塞还包括适于与所述闭锁机构可操作地相互作用的另一端，所述柱塞被偏压到预定间隙 位置。

公开(公告)号：US06670808B2

公开(公告)日：2003-12-30

申请号：US09682376

申请日：2001-08-27

申请人： Shridhar Champaknath Nath ,  Curtis Wayne Rose ,  Carl Stephen Lester ,  Thomas James Batzinger

发明人： Shridhar Champaknath Nath ,  Curtis Wayne Rose ,  Carl Stephen Lester ,  Thomas James Batzinger

IPC分类号： G01B706

CPC分类号： G01B7/105 ,  G01N27/904

摘要： A self referencing eddy current probe for determining conductive coating thickness includes a housing having a reference sample area, for accommodating a reference sample, and a testing edge, for positioning on a component during a coating thickness measurement. The eddy current probe further includes a reference eddy current coil situated in the housing adjacent to the reference sample area and a test eddy current coil, which is located at the testing edge. A self referencing eddy current measurement system, for measuring a thickness of a conductive coating on a component, includes the self referencing eddy current probe. The system further includes a signal generator for energizing the test and reference coils and a comparison module for comparing a test signal received from the test coil and a reference signal received from the reference coil and outputting a compared signal.

摘要翻译： 用于确定导电涂层厚度的自参考涡流探针包括具有用于容纳参考样品的参考样品区域的壳体和用于在涂层厚度测量期间在组件上定位的测试边缘。 涡流探头还包括位于壳体中的参考涡流线圈，其与参考样品区域相邻，并且测试涡流线圈位于测试边缘。 用于测量部件上的导电涂层的厚度的自参考涡流测量系统包括自参考涡流探针。 该系统还包括用于激励测试和参考线圈的信号发生器和用于比较从测试线圈接收的测试信号和从参考线圈接收的参考信号并输出​​比较信号的比较模块。

公开(公告)号：US06414483B1

公开(公告)日：2002-07-02

申请号：US09627049

申请日：2000-07-27

申请人： Shridhar Champaknath Nath ,  Thomas James Batzinger ,  Curtis Wayne Rose ,  Paul Peter Stryjek

发明人： Shridhar Champaknath Nath ,  Thomas James Batzinger ,  Curtis Wayne Rose ,  Paul Peter Stryjek

IPC分类号： G01N2782

CPC分类号： G01N27/9006

摘要： A method of inspecting a preselected area of an electrically conductive component to determine whether flaws are present. The method includes the steps of permanently mounting an eddy current element on the component over the preselected area and energizing the element to generate alternating magnetic fields proximate the component. An electrical signal generated by a secondary magnetic field formed proximate the component is detected using the element and the detected electrical signal is compared to a reference signal to determine whether the detected signal is different than the reference signal. Differences indicate the presence of a flaw in the component. Inspection apparatus for performing this method is also disclosed.

摘要翻译： 检查导电部件的预选区域以确定是否存在缺陷的方法。 该方法包括以下步骤：将涡流元件永久性地安装在预选区域上的部件上，并激励该元件以产生接近该部件的交变磁场。 使用元件检测由邻近分量形成的次级磁场产生的电信号，并将检测到的电信号与参考信号进行比较，以确定检测信号是否不同于参考信号。 差异表明组件中存在缺陷。 还公开了用于执行该方法的检查装置。

公开(公告)号：US06545469B1

公开(公告)日：2003-04-08

申请号：US09682902

申请日：2001-10-31

申请人： Thomas James Batzinger ,  Shridhar Champaknath Nath ,  Kenneth Gordon Herd

发明人： Thomas James Batzinger ,  Shridhar Champaknath Nath ,  Kenneth Gordon Herd

IPC分类号： G01N2790

CPC分类号： G01N27/9046

摘要： An embedded eddy current inspection apparatus includes a substrate having an opening, and a test eddy current coil (“test coil”) affixed to the substrate near the opening. An internally inspected multilayer component structure includes an upper layer, a lower layer, and an eddy current probe embedded between the upper and lower layers. The eddy current probe includes the test coil facing a subject layer selected from the upper and lower layers. A method of inspecting a multilayer component structure includes simultaneously energizing the test coil and a reference eddy current coil (“reference coil”) embedded between the upper and lower layers and facing the subject layer. The reference coil is located in a reference region of the multilayer structure. A test signal from the test coil is compared with a reference signal from the reference coil, to determine whether a flaw is present in the subject layer near the test coil.

摘要翻译： 嵌入式涡流检查装置包括具有开口的基板和在开口附近固定到基板的测试涡流线圈（“测试线圈”）。 内部检查的多层组件结构包括上层，下层和嵌入在上层和下层之间的涡流探针。 涡流探针包括面向从上层和下层选择的被摄体层的测试线圈。 检查多层部件结构的方法包括同时激励测试线圈和嵌入在上层和下层之间并面向主体层的参考涡流线圈（“参考线圈”）。 参考线圈位于多层结构的参考区域中。 将来自测试线圈的测试信号与来自参考线圈的参考信号进行比较，以确定在测试线圈附近的被摄体层中是否存在缺陷。