公开(公告)号：US20090210839A1

公开(公告)日：2009-08-20

申请号：US12031106

申请日：2008-02-14

申请人： Nathan C. Buck ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Kerim Kalafala ,  Gregory M. Schaeffer ,  Chandramouli Visweswariah

发明人： Nathan C. Buck ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Kerim Kalafala ,  Gregory M. Schaeffer ,  Chandramouli Visweswariah

IPC分类号： G06F17/50

CPC分类号： G06F17/5031 ,  G06F2217/84

摘要： A method of timing closure for integrated circuit designs uses multiple timing runs which distribute the frequency of identified fails per timing corner (between starting timing corners and remaining timing corners) to maximize efficiency in timing analysis. More specifically, the method closes timing for a chosen set of starting timing corners, verifies the remaining timing corners are orthogonal to the starting timing corners, closes timing for the remaining timing corners using multi-corner analysis, and verifies that all timing corners have positive slack margin.

摘要翻译： 用于集成电路设计的定时闭合方法使用多个定时运行，其分配每个定时角点（在起始时间角和剩余时间角之间）识别的故障的频率，以最大化定时分析的效率。 更具体地，该方法关闭所选择的一组起始定时角的定时，验证剩余的定时角与起始正时角正交，关闭使用多角分析的剩余定时角的定时，并且验证所有定时角均为正 松弛边缘

公开(公告)号：US07555740B2

公开(公告)日：2009-06-30

申请号：US11679251

申请日：2007-02-27

申请人： Nathan C. Buck ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Kerim Kalafala ,  Peihua Qi ,  Chandramouli Visweswariah ,  Xiaoyue Wang

发明人： Nathan C. Buck ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Kerim Kalafala ,  Peihua Qi ,  Chandramouli Visweswariah ,  Xiaoyue Wang

IPC分类号： G06F17/50

CPC分类号： G06F17/5031

摘要： Methods, systems and computer program products for analyzing a timing design of an integrated circuit are disclosed. According to an embodiment, a method for analyzing a timing design of an integrated circuit comprises: providing an initial static timing analysis of the integrated circuit; selecting a static timing test with respect to a static timing test point based on the initial static timing analysis; selecting a timing path leading to the static timing test point for the static timing test; determining an integrated slack path variability for the timing path based on a joint probability distribution of at least one statistically independent parameter; and analyzing the timing design based on the integrated slack path variability.

摘要翻译： 公开了用于分析集成电路的时序设计的方法，系统和计算机程序产品。 根据实施例，用于分析集成电路的定时设计的方法包括：提供集成电路的初始静态时序分析; 基于初始静态时序分析，选择静态定时测试点的静态定时测试; 选择通过静态定时测试的静态定时测试点的定时路径; 基于至少一个统计学独立参数的联合概率分布来确定所述定时路径的综合松弛路径可变性; 并基于综合的松弛路径变异性分析时序设计。

公开(公告)号：US20080209375A1

公开(公告)日：2008-08-28

申请号：US11679834

申请日：2007-02-27

申请人： Nathan C. Buck ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Kerim Kalafala ,  Peihua Qi ,  Chandramouli Visweswariah ,  Xiaoyue Wang

发明人： Nathan C. Buck ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Kerim Kalafala ,  Peihua Qi ,  Chandramouli Visweswariah ,  Xiaoyue Wang

IPC分类号： G06F17/50

CPC分类号： G06F17/5031

摘要： A method and system for decreasing processing time in multi-corner static timing analysis. In one embodiment, slack cutoff values are assigned across a parameter process space. For example, a slack cutoff value is assigned to each parameter in a process space by determining an estimated maximum slack change between a starting corner and any other corner in a corresponding process sub-space. In another embodiment, parameters are ordered in a parameter order by decreasing magnitude of impact on variability of timing.

摘要翻译： 一种用于减少多角静态时序分析中处理时间的方法和系统。 在一个实施例中，在参数处理空间上分配松弛截止值。 例如，通过确定起始角和对应的处理子空间中的任何其他角之间的估计的最大松弛变化，将一个松弛截止值分配给处理空间中的每个参数。 在另一个实施例中，通过减小对定时可变性的影响的大小，以参数顺序排列参数。

公开(公告)号：US20080209374A1

公开(公告)日：2008-08-28

申请号：US11679831

申请日：2007-02-27

申请人： Nathan C. Buck ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Kerim Kalafala ,  Peihua Qi ,  Chandramouli Visweswariah ,  Xiaoyue Wang

发明人： Nathan C. Buck ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Kerim Kalafala ,  Peihua Qi ,  Chandramouli Visweswariah ,  Xiaoyue Wang

IPC分类号： G06F17/50

CPC分类号： G06F17/5031

摘要： A method and system for decreasing processing time in multi-corner static timing analysis. In one embodiment, parameters are ordered in a parameter order by decreasing magnitude of impact on variability of timing. In one example, a decreasing parameter order is utilized to order slack cutoff values that are assigned across a parameter process space. In another example, a decreasing parameter order is utilized to perform a multi-corner timing analysis on one or more dependent parameters in an independent fashion.

摘要翻译： 一种用于减少多角静态时序分析中处理时间的方法和系统。 在一个实施例中，通过减小对定时可变性的影响的大小，以参数顺序排列参数。 在一个示例中，使用递减参数顺序来排序跨越参数处理空间分配的松弛截止值。 在另一示例中，使用递减参数顺序来以独立方式对一个或多个依赖参数执行多角定时分析。

公开(公告)号：US09858368B2

公开(公告)日：2018-01-02

申请号：US13182108

申请日：2011-07-13

申请人： Nathan C. Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue Wang ,  Vladmimir Zolotov

发明人： Nathan C. Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue Wang ,  Vladmimir Zolotov

IPC分类号： G06F17/50

CPC分类号： G06F17/5036 ,  G06F2217/84

摘要： Solutions for integrating manufacturing feedback into an integrated circuit design are disclosed. In one embodiment, a computer-implemented method is disclosed including: defining an acceptable yield requirement for a first integrated circuit product; obtaining manufacturing data about the first integrated circuit product; performing a regression analysis on data representing paths in the first integrated circuit product to define a plurality of parameter settings based upon the acceptable yield requirement and the manufacturing data; determining a projection corner associated with the parameter settings for satisfying the acceptable yield requirement; and modifying a design of a second integrated circuit product based upon the projection corner and the plurality of parameter settings.

公开(公告)号：US09157956B2

公开(公告)日：2015-10-13

申请号：US13614564

申请日：2012-09-13

申请人： Jeanne P. Bickford ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Clarence R. Ogilvie ,  Tad J. Wilder ,  Vladimir Zolotov

发明人： Jeanne P. Bickford ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Clarence R. Ogilvie ,  Tad J. Wilder ,  Vladimir Zolotov

IPC分类号： G06F17/50 ,  G01R31/317 ,  G01R31/30

CPC分类号： G01R31/31718 ,  G01R31/3008

摘要： A plurality of digital circuits are manufactured from an identical circuit design. A power controller is operatively connected to the digital circuits, and a non-transitory storage medium is operatively connected to the power controller. The digital circuits are classified into different voltage bins, and each of the voltage bins has a current leakage limit. Each of the digital circuits has been previously tested to operate within a corresponding current leakage limit of a corresponding voltage bin into which each of the digital circuits has been classified. The non-transitory storage medium stores boundaries of the voltage bins as speed-binning test data. The power controller controls power-supply signals applied differently for each of the digital circuits based on which bin each of the digital circuit has been classified and the speed-binning test data.

摘要翻译： 由相同的电路设计制造多个数字电路。 功率控制器可操作地连接到数字电路，并且非瞬时存储介质可操作地连接到功率控制器。 数字电路分为不同的电压箱，每个电压箱都有漏电极限。 已经对每个数字电路进行了测试，以在对应的电压仓的相应的电流泄漏极限内运行，每个数字电路已被分类到该对应的电压仓。 非瞬时存储介质存储电压仓的边界作为速度分组测试数据。 功率控制器控制基于每个数字电路已被分类的每个数字电路不同地施加的电源信号和速度合并测试数据。

公开(公告)号：US20130036395A1

公开(公告)日：2013-02-07

申请号：US13197320

申请日：2011-08-03

申请人： Eric A. Foreman ,  James C. Gregerson ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Debjit Sinha ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue Wang ,  Vladmimir Zolotov

发明人： Eric A. Foreman ,  James C. Gregerson ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Debjit Sinha ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue Wang ,  Vladmimir Zolotov

IPC分类号： G06F9/455 ,  G06F17/50

CPC分类号： G06F17/5031

摘要： Aspects of the present invention provide solutions for projecting slack in an integrated circuit. A statistical static timing analysis (SSTA) is computed to get a set of Gaussian distributions over a plurality of variation sources in the integrated circuit. Based on the Gaussian distributions, a truncated subset and a remainder subset of the Gaussian distributions are identified. Then data factors that represent a ratio between the remainder subset and the truncated subset are obtained. These data factors are applied to the SSTA to root sum square (RSS) project the slack for the integrated circuit that takes into account the absence of the truncated subset.

摘要翻译： 本发明的方面提供了用于在集成电路中突出松弛的解决方案。 计算统计静态时序分析（SSTA）以在集成电路中的多个变化源上获得一组高斯分布。 基于高斯分布，识别高斯分布的截断子集和余数子集。 然后获得表示余数子集和截断子集之间的比率的数据因子。 这些数据因子被应用于SSTA到根平方（RSS）项目，考虑到缺少截断子集的集成电路的松弛。

公开(公告)号：US20130018617A1

公开(公告)日：2013-01-17

申请号：US13182108

申请日：2011-07-13

申请人： Nathan C. Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue Wang ,  Vladmimir Zolotov

发明人： Nathan C. Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue Wang ,  Vladmimir Zolotov

IPC分类号： G06F19/00

CPC分类号： G06F17/5036 ,  G06F2217/84

摘要： Solutions for integrating manufacturing feedback into an integrated circuit design are disclosed. In one embodiment, a computer-implemented method is disclosed including: defining an acceptable yield requirement for a first integrated circuit product; obtaining manufacturing data about the first integrated circuit product; performing a regression analysis on data representing paths in the first integrated circuit product to define a plurality of parameter settings based upon the acceptable yield requirement and the manufacturing data; determining a projection corner associated with the parameter settings for satisfying the acceptable yield requirement; and modifying a design of a second integrated circuit product based upon the projection corner and the plurality of parameter settings.

摘要翻译： 公开了将制造反馈集成到集成电路设计中的解决方案。 在一个实施例中，公开了一种计算机实现的方法，包括：为第一集成电路产品定义可接受的收益率要求; 获取关于第一集成电路产品的制造数据; 对表示第一集成电路产品中的路径的数据执行回归分析，以基于可接受的产量要求和制造数据来定义多个参数设置; 确定与参数设置相关联的投影角以满足可接受的产量要求; 以及基于投影角和多个参数设置来修改第二集成电路产品的设计。

公开(公告)号：US20130104092A1

公开(公告)日：2013-04-25

申请号：US13279373

申请日：2011-10-24

申请人： Nathan C. Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue Wang ,  Vladimir Zolotov

发明人： Nathan C. Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue Wang ,  Vladimir Zolotov

IPC分类号： G06F17/50

CPC分类号： G06F17/5031 ,  G06F2217/84

摘要： In embodiments of a statistical static timing analysis (SSTA) method, system and program storage device, the interdependence between the setup time and hold time margins of a circuit block (e.g., a latch, flip-flop, etc., which requires the checking of setup and hold timing constraints) is determined, taking into account possible variations in multiple parameters (e.g., using a variation-aware characterizing technique). A parameterized statistical static timing analysis (SSTA) of a circuit incorporating the circuit block is performed in order to determine, in statistical parameterized form, setup and hold times for the circuit block. Based on the interdependence between the setup and hold time margins, setup and hold time constraints can be determined in statistical parameterized form. Finally, the setup and hold times determined during the SSTA can be checked against the setup and hold time constraints to determine, if the time constraints are violated or not and to what degree.

摘要翻译： 在统计静态时序分析（SSTA）方法，系统和程序存储装置的实施例中，需要检查的电路块（例如，锁存器，触发器等）的建立时间和保持时间裕度之间的相互依赖关系 确定设置和保持时序约束），同时考虑到多个参数的可能变化（例如，使用变异感知特性技术）。 执行结合电路块的电路的参数化统计静态时序分析（SSTA），以便以统计参数化形式确定电路块的建立和保持时间。 基于设置和保持时间间隔之间的相互依赖性，可以以统计参数化形式确定建立和保持时间约束。 最后，可以根据建立和保持时间约束来检查SSTA期间确定的建立和保持时间，以确定是否违反时间限制，以及在何种程度上。

公开(公告)号：US08768679B2

公开(公告)日：2014-07-01

申请号：US12894286

申请日：2010-09-30

申请人： Nathan C. Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue X. Wang

发明人： Nathan C. Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue X. Wang

IPC分类号： G06F17/50 ,  G06F7/60 ,  G06F13/10 ,  G06F11/26

CPC分类号： G06F13/105 ,  G06F11/261 ,  G06F17/50 ,  G06F17/5036

摘要： A computer-implemented method that simulates NPskew effects on a combination NFET (Negative Field Effect Transistor)/PFET (Positive Field Effect Transistor) semiconductor device using slew perturbations includes performing a timing test by a computing device, by: (1) evaluating perturb slews in Strong N/Weak P directions on the combination semiconductor device for a timing test result; (2) evaluation perturb slews in Weak N/Strong P directions on the combination semiconductor device for a timing test result; and (3) evaluating unperturbed slews in a balanced condition on the combination semiconductor device for a timing test result. After each test is performed, a determination is made as to which evaluation of the perturbed and unperturbed slews produces a most conservative timing test result for the combination semiconductor device. An NPskew effect adjusted timing test result is finally output based on determining the most conservative timing test result.

摘要翻译： 使用摆动扰动模拟组合NFET（负场效应晶体管）/ PFET（正场效应晶体管）/ PFET（正场效应晶体管））半导体器件的NPskew效应的计算机实现的方法包括通过以下方式执行计算设备的定时测试：（1）评估干扰压摆 在组合半导体器件上以强N /弱P方向进行定时测试结果; （2）组合半导体器件的评估扰动在弱N /强P方向上的时序测试结果; 和（3）在组合半导体器件上对平衡状态下的非扰动压摆进行定时测试结果。 在执行每个测试之后，确定扰动和未扰动的压摆的哪个评估对组合半导体器件产生最保守的定时测试结果。 基于确定最保守的定时测试结果，最终输出NPskew效果调整的定时测试结果。