Abstract:
The subject matter described herein relates to a semiconductor circuit arrangement with a semiconductor substrate with an integrated Hall sensor circuit. During a first clock phase PHspin1 a first electrical voltage signal ±VHallout(PHspin1) or ±VHallbias(PHspin1) can be generated in the Hall effect region that has a first dependency on a mechanical stress of the semiconductor substrate. During a second clock phase PHspin2 a second electrical voltage signal ±VHallout(PHspin2) or ±VHallbias(PHspin2) can be generated in the Hall effect region that has a second dependency on a mechanical stress of the semiconductor substrate. The semiconductor circuit arrangement is designed to ascertain a specific mechanical stress component based on a combination of the first electrical voltage signal +VHallout(PHspin1) or ±VHallbias(PHspin1) and of the second electrical voltage signal ±VHallout(PHspin2) or ±VHallbias(PHspin2).
Abstract:
An integrated circuit includes a first bandgap voltage reference sub-circuit configured to provide a first bandgap reference voltage; a second bandgap voltage reference sub-circuit configured to provide a second bandgap reference voltage; a voltage regulator sub-circuit configured to derive a first supply voltage using the first bandgap reference voltage and a second supply voltage using the second bandgap reference voltage; a bandgap comparator sub-circuit configured to derive a first internal voltage and a second internal voltage from the first supply voltage, wherein the first internal voltage decreases at a higher rate than the second internal voltage with respect to a decreasing first supply voltage, wherein the bandgap comparator sub-circuit is configured indicate which of the first and the second internal voltages is larger; and a comparator sub-circuit configured to indicate whether a difference between the first supply voltage and the second supply voltage is larger than a predefined threshold.
Abstract:
Magnetic field sensors and sensing methods are provided. A magnetic sensor includes at least one magnetic field sensor element configured to generate an analog input sensor signal in response to a magnetic field; an inverting amplifier arranged on an analog signal path and configured to generate an analog output sensor signal having a gained value with respect to the analog input sensor signal; a switchable compensation capacitor disposed in a negative feedback path of the inverting amplifier, where the switchable compensation capacitor is configured to control a bandwidth of the analog signal path based on configuration information; and a digital controller configured to receive at least one measurement parameter, generate the configuration information based on the at least one measurement parameter, and transmit the configuration information to the switchable compensation capacitor for adjusting the bandwidth of the analog signal path.
Abstract:
A stress compensated oscillator circuitry comprises a sensor arrangement for providing a sensor output signal SSensor, wherein the sensor output signal SSensor is based on an instantaneous stress or strain component σ in the semiconductor substrate, a processing arrangement for processing the sensor output signal SSensor and providing a control signal SControl depending on the instantaneous stress or strain component σ in the semiconductor substrate, and an oscillator arrangement for providing an oscillator output signal Sosc having an oscillator frequency fosc based on the control signal SControl, wherein the control signal SControl controls the oscillator output signal Sosc, and wherein the control signal SControl reduces the influence of the instantaneous stress or strain component σ in the semiconductor substrate onto the oscillator output signal Sosc, so that the oscillator circuitry provides a stress compensated oscillator output signal.
Abstract:
The present disclosure relates to chopper amplifier circuits with inherent chopper ripple suppression. Example implementations can realize a doubly utilized chopper amplifier circuit that is a current-saving circuit with a wake-up function that is capable of providing a self-wake signal in order to change into a fast, low-jitter/low-latency mode, and to provide a wake-up signal for a sleeping microprocessor or a system in response to signal changes.
Abstract:
The present disclosure relates to a sensor circuit including a control circuit configured to control a constant first signal to a ratiometric second signal using a first amplifier adjustable by an actuating signal, and an adjustable second amplifier for a sensor signal, the gain of which is adjustable by the actuating signal.
Abstract:
The present disclosure relates to chopper amplifier circuits with inherent chopper ripple suppression. Example implementations can realize a doubly utilized chopper amplifier circuit that is a current-saving circuit with a wake-up function that is capable of providing a self-wake signal in order to change into a fast, low-jitter/low-latency mode, and to provide a wake-up signal for a sleeping microprocessor or a system in response to signal changes.
Abstract:
Methods and apparatuses are provided, in which a magnetic field is measured using a coil in a first operating mode and a magnetic field is generated using the coil in a second operating mode in order to test a further magnetic field sensor.
Abstract:
A sensor device comprises an electrically conductive chip carrier, wherein the chip carrier comprises an auxiliary structure, wherein the auxiliary structure comprises a first precalibration current terminal and a second precalibration current terminal, a magnetic field sensor chip arranged on a mounting surface of the chip carrier, wherein the magnetic field sensor chip comprises a sensor element, wherein the shape of the auxiliary structure is embodied such that an electrical precalibration current flowing from the first precalibration current terminal to the second precalibration current terminal through the auxiliary structure induces a predefined precalibration magnetic field at the location of the sensor element, wherein during measurement operation of the precalibrated sensor device, no precalibration current flows between the first precalibration current terminal and the second precalibration current terminal.