公开(公告)号：US20200284660A1

公开(公告)日：2020-09-10

申请号：US16809275

申请日：2020-03-04

Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY ,  Center for Advanced Meta-Materials

Inventor： Minah SEO ,  Sang-Hun LEE ,  Chulki KIM ,  Jae Hun KIM ,  Taikjin LEE ,  Deok Ha WOO

IPC: G01J5/08 ,  G02B1/00

Abstract: One embodiment of the present invention provides an optical imaging apparatus using a metamaterial including a metamaterial array sensor which includes a plurality of unit cells made of a metamaterial and is positioned adjacent to an observation object, an imaging beam providing unit which provides an imaging beam toward the metamaterial array sensor, a control beam providing unit which controls a control beam provided to the unit cell to block the imaging beam incident on the unit cell, and an imaging beam measuring unit which measures a unit cell imaging beam transmission amount passing through the unit cell by measuring an imaging beam transmission amount of the metamaterial array sensor when the imaging beam passes through the unit cell and an imaging beam transmission amount of the metamaterial array sensor when the control beam is focused on the unit cell to block the imaging beam incident on the unit cell.

公开(公告)号：US20200274048A1

公开(公告)日：2020-08-27

申请号：US16666401

申请日：2019-10-29

Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY

Inventor： Chulki KIM ,  Jae Hun KIM ,  Taikjin LEE ,  Minah SEO ,  Donggeun LEE

IPC: H01L39/10 ,  H01L39/22

Abstract: According to one aspect of the present invention, a switching device using an electron shuttle includes a substrate, a center portion fixed onto the substrate, a first wing portion extending from the center portion in a first direction and spaced apart from the substrate, a second wing portion extending from the center portion in a second direction and spaced apart from the substrate, a conductive first electron shuttle connected to the first wing portion and disposed to be spaced apart from the substrate, and a conductive second electron shuttle connected to the second wing portion and disposed to be spaced apart from the substrate.

公开(公告)号：US20200158576A1

公开(公告)日：2020-05-21

申请号：US16292328

申请日：2019-03-05

Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY

Inventor： Young Min JHON ,  Minah SEO ,  Young In JHON

IPC: G01J5/02 ,  G01J5/34 ,  G01J5/12

Abstract: The present invention relates to a terahertz (THz) wave detecting sensor including a MXene material represented by the following Formula 1 as a sensing material: M(n+1)Xn,  [Formula 1] wherein, in Formula 1, M is at least one transition metal selected from early transition metal elements, X is at least one selected from C and N, and n is an integer selected from 1 to 3.

公开(公告)号：US20190086458A1

公开(公告)日：2019-03-21

申请号：US15874415

申请日：2018-01-18

Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY

Inventor： Minah SEO ,  Sanghun LEE ,  Chulki KIM ,  Q-Han PARK ,  Jongho CHOE ,  Jinsoo KIM

IPC: G01R27/26 ,  G01N21/3563

CPC classification number: G01R27/2682 ,  G01N21/3563 ,  G01N21/3581 ,  G01N21/8422

Abstract: Disclosed herein is a system for non-contact measurement of an optoelectronic property. The system includes a sensing element configured to amplify an electromagnetic wave having a specific frequency, a thin film disposed on the sensing element such that an optoelectronic property of the thin film is measured, and an optoelectronic property measuring server configured to extract a physical property of the thin film based on the optoelectronic property of the thin film obtained when the electromagnetic wave amplified by the sensing element passes through the thin film.