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11.发明公开公开(公告)号：US20240054626A1
公开(公告)日：2024-02-15
申请号：US18022668
申请日：2020-08-28
Applicant: NEC Corporation
Inventor： Yoshimasa ONO , Akira TSUJI
CPC classification number: G06T7/0002 , G06T7/74 , G06T2207/10028
Abstract: Provided is a processing device capable of accurately identifying an abnormal part. A processing device (1) according to the present disclosure includes a first difference calculation unit (11) that calculates a difference between a plurality of reference point groups, a dynamic point group extraction unit (15) that extracts a dynamic point group being a point group involving a change from the reference point groups on the basis of a calculation result in the first difference calculation unit (11), a second difference calculation unit (12) that calculates a difference between an inspection point group acquired after the reference point group and the reference point group and generates a differential point group, a point group removal unit (16) that removes a point group corresponding to the dynamic point group from the differential point group generated in the second difference calculation unit (12), and an abnormal part identification unit (17) that identifies an abnormal part of the object to be measured on the basis of a differential point group from which the point group corresponding to the dynamic point group is removed.
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公开(公告)号：US20230375709A1
公开(公告)日：2023-11-23
申请号：US17912945
申请日：2020-03-31
Applicant: NEC Corporation
Inventor： Akira TSUJI , Yoshimasa ONO , Junichi ABE , Jiro ABE
CPC classification number: G01S17/89 , G01S7/4808
Abstract: A detection device (10) according to the present disclosure includes an acquisition unit (11) that acquires point cloud data indicating a distance from a measurement device to an object and luminance information obtained from reflected light of a beam emitted when the point cloud data is measured, an edge detection unit (12) that performs edge detection based on the luminance information, and a crack determination unit (13) that determines whether an area indicates a crack by using a shape of the area in which, of a plurality of points indicated by the point cloud data, points having luminance within a predetermined range of difference from luminance of a point detected as an edge are distributed.
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公开(公告)号：US20230036969A1
公开(公告)日：2023-02-02
申请号：US17778496
申请日：2019-11-29
Applicant: NEC Corporation
Inventor： Jiro ABE , Akira TSUJI , Junichi ABE , Yoshimasa ONO
Abstract: An object is to provide a measurement apparatus adapted to correctly integrate three-dimensional data acquired at a plurality of points. A measurement apparatus (10) according to the present disclosure includes a position specifying unit (11) configured to specify, using an apparatus reference coordinate system having a position of the measurement apparatus set as a reference, a position of each of a plurality of other measurement apparatuses; a candidate specifying unit (12) configured to extract at least three measurement apparatuses out of the measurement apparatus and the plurality of the other measurement apparatuses and to specify, based on the positions of the extracted measurement apparatuses, a candidate region that serves as a candidate of a common region referred to in performing alignment of data captured by the measurement apparatus and the plurality of the other measurement apparatuses; and a common region determining unit (13) configured to determine the common region based on the distribution of the plurality of the candidate regions obtained by changing combinations of the measurement apparatuses to be extracted.
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公开(公告)号：US20220343628A1
公开(公告)日：2022-10-27
申请号：US17637132
申请日：2019-08-28
Applicant: NEC Corporation
Inventor： Yoshimasa ONO , Akira TSUJI , Junichi ABE
IPC: G06V10/764 , G06V10/762
Abstract: A processing apparatus (10) includes classification means (12) for classifying three-dimensional point group data acquired based on a reflected light from a structure to be inspected illuminated by light into clusters, which are units of a shape that corresponds to the structure to be inspected, based on positional information at each point of the data; and cluster association means (13) for determining whether a first cluster and a second cluster included in the classified clusters correspond to one structure to be inspected based on a positional relation between the classified clusters.
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公开(公告)号：US20250091623A1
公开(公告)日：2025-03-20
申请号：US18820903
申请日：2024-08-30
Applicant: NEC Corporation
Inventor： Shingo YAMANOUCHI , Toshiyuki NOMURA , Junichi ABE , Hidemi NOGUCHI , Yoshimasa ONO , Tatsuya FUJIMOTO
Abstract: An obstacle monitoring system includes: a sensing means; a first obstacle detection means; and a control means for selectively executing a plurality of control modes including a first control mode in which a moving speed of a moving body is a first moving speed and a sensing field of view of the sensing means is a first field of view, and a second control mode in which a moving speed of the moving body is a second moving speed and a sensing field of view of the sensing means is a second field of view. When the first obstacle detection means detects the obstacle while the control means is executing the first control mode, the control means executes the second control mode in such a way as to capture the obstacle within the second field of view.
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Patent Agency Ranking
公开(公告)号：US20250045985A1
公开(公告)日：2025-02-06
申请号：US18926634
申请日：2024-10-25
Applicant: NEC Corporation
Inventor： Yoshimasa ONO , Shigeru NAKAMURA , Atsufumi SHIBAYAMA , Junichi ABE
Abstract: Provided is a processing apparatus capable of obtaining a 2D image from 3D tomographic images, extracting an image for accurate authentication, and extracting an image at a high speed. A processing apparatus includes: means for calculating, from three-dimensional luminance data indicating an authentication target, depth dependence of striped pattern sharpness in a plurality of regions on a plane perpendicular to a depth direction of the target; means for calculating a depth at which the striped pattern sharpness is the greatest in the depth dependence of striped pattern sharpness; rough adjustment means for correcting the calculated depth on the basis of depths of other regions positioned respectively around the plurality of regions; fine adjustment means for selecting a depth closest to the corrected depth and at which the striped pattern sharpness is at an extreme; and means for extracting an image with a luminance on the basis of the selected depth.
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17.发明公开公开(公告)号：US20230333250A1
公开(公告)日：2023-10-19
申请号：US18025808
申请日：2020-09-16
Applicant: NEC Corporation
Inventor： Yoshimasa ONO , Junichi ABE , Hidemi NOGUCHI , Akira TSUJI , Jiro ABE
IPC: G01S17/66
CPC classification number: G01S17/66
Abstract: A monitoring system according to the present disclosure includes: a straight line calculation unit configured to calculate a straight line connecting three-dimensional coordinates of a light source and three-dimensional coordinates of a three-dimensional measuring device configured to measure a target to be measured; an invalid region determination unit configured to define a three-dimension invalid region in which point cloud data acquired by the three-dimensional measuring device is invalid based on the straight line; and a point cloud data processing unit configured to monitor the target to be measured based on the acquired point cloud data and the three-dimension invalid region.
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公开(公告)号：US20220277498A1
公开(公告)日：2022-09-01
申请号：US17630228
申请日：2019-08-01
Applicant: NEC Corporation
Inventor： Yoshimasa ONO , Shigeru NAKAMURA , Atsufumi SHIBAYAMA , Junichi ABE
Abstract: Provided is a processing apparatus capable of obtaining a 2D image from 3D tomographic images, extracting an image for accurate authentication, and extracting an image at a high speed. A processing apparatus includes:
means for calculating, from three-dimensional luminance data indicating an authentication target, depth dependence of striped pattern sharpness in a plurality of regions on a plane perpendicular to a depth direction of the target; means for calculating a depth at which the striped pattern sharpness is the greatest in the depth dependence of striped pattern sharpness; rough adjustment means for correcting the calculated depth on the basis of depths of other regions positioned respectively around the plurality of regions; fine adjustment means for selecting a depth closest to the corrected depth and at which the striped pattern sharpness is at an extreme; and means for extracting an image with a luminance on the basis of the selected depth.-
19.发明申请公开(公告)号：US20220276181A1
公开(公告)日：2022-09-01
申请号：US17635523
申请日：2019-08-26
Applicant: NEC Corporation
Inventor： Yoshimasa ONO , Akira TSUJI , Junichi ABE
Abstract: The present disclosure is directed to providing a surface anomaly detecting device, a system, a method, and a non-transitory computer-readable medium that can identify an anomalous portion on a surface of a complex structure. A surface anomaly detecting device according to the present disclosure includes: dividing means configured to divide a structure into a plurality of clusters based on position information of a plurality of points on a surface of the structure; coupling means configured to create a cluster group by coupling together two or more of the clusters; determining means configured to determine a reflection luminance normal value of the cluster group based on a distribution of reflection luminance values at a plurality of points on a surface of the cluster group; and identifying means configured to identify an anomalous portion on the surface of the cluster group.
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公开(公告)号：US20220156914A1
公开(公告)日：2022-05-19
申请号：US17599757
申请日：2020-03-17
Applicant: NEC Corporation
Inventor： Yoshimasa ONO , Akira TSUJI , Hidemi NOGUCHI , Junichi ABE
IPC: G06T7/00 , G06V10/764 , G06T7/70 , G01B11/30 , G01S17/89
Abstract: There is provided a surface abnormality detection device, and a system, capable of detecting an abnormal portion having a displacement below the distance measurement accuracy when detecting the abnormal portion on the surface of a structure. A surface abnormality detection device includes a classification means for classifying an object under measurement into one or more clusters having the same structure, based on position information at a plurality of points on a surface of the object under measurement; a determination means for determining a reflection brightness normal value of the cluster based on a distribution of reflection brightness values at a plurality of points on a surface of the cluster; and an identification means for identifying an abnormal portion on the surface of the cluster based on a difference between the reflection brightness normal value and the reflection brightness value at each of the plurality of points.
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