Methods and systems for determining a property of an insulating film
    12.
    发明授权
    Methods and systems for determining a property of an insulating film 失效
    用于确定绝缘膜性能的方法和系统

    公开(公告)号:US07012438B1

    公开(公告)日:2006-03-14

    申请号:US10616086

    申请日:2003-07-09

    IPC分类号: G01R27/08 G01R27/26 G01N27/60

    摘要: A method for determining a property of an insulating film is provided. The method may include obtaining a charge density measurement of the film, a surface voltage potential of the film relative to a bulk voltage potential of the substrate, and a rate of voltage decay of the film. The method may also include determining the property of the film using the charge density, the surface voltage potential, and the rate of voltage decay. A method for determining a thickness of an insulating film is provided. The method may include depositing a charge on the film, measuring a surface voltage potential of the film relative to a bulk voltage potential of the substrate, and measuring a rate of voltage decay of the film. The method may also include determining a thickness of the film using the rate of voltage decay and a theoretical model relating to leakage and film thickness.

    摘要翻译: 提供一种用于确定绝缘膜的性质的方法。 该方法可以包括获得膜的电荷密度测量,膜相对于衬底的体电压电位的表面电压电势以及膜的电压衰减速率。 该方法还可以包括使用电荷密度,表面电压电位和电压衰减速率确定膜的性质。 提供一种确定绝缘膜厚度的方法。 该方法可以包括在膜上沉积电荷,测量膜相对于衬底的体电压电位的表面电压电位,以及测量膜的电压衰减速率。 该方法还可以包括使用电压衰减速率和与泄漏和膜厚度有关的理论模型来确定膜的厚度。

    Method and system for providing an activation signal based on a received RF signal
    13.
    发明申请
    Method and system for providing an activation signal based on a received RF signal 失效
    用于基于接收的RF信号提供激活信号的方法和系统

    公开(公告)号:US20050012398A1

    公开(公告)日:2005-01-20

    申请号:US10662041

    申请日:2003-09-11

    摘要: A method and apparatus are described for providing an activation signal based on a received radio frequency (RF) signal. The apparatus includes an RF receiver configured to admit a received RF signal in a given frequency band and a converter configured to convert the admitted RF signal to a proportional signal. The apparatus also includes a low power comparator that has a first and second input and an output. A biasing and offset compensation circuit is configured to bias the proportional signal higher by an offset midrange voltage and bias the second input to an offset compensated voltage based on an offset between the inputs of the comparator. The comparator is configured to receive the biased proportional signal at the first input and produce the activation signal at the output when a voltage difference between the biased proportional signal and the offset compensated voltage exceeds a comparison voltage threshold.

    摘要翻译: 描述了一种基于接收的射频(RF)信号提供激活信号的方法和装置。 该装置包括被配置为允许给定频带中的接收的RF信号的RF接收器和被配置为将允许的RF信号转换成比例信号的转换器。 该装置还包括具有第一和第二输入和输出的低功率比较器。 偏置和偏移补偿电路被配置为将比例信号偏置偏移中频电压,并且基于比较器的输入之间的偏移将第二输入偏置到偏移补偿电压。 比较器被配置为在第一输入处接收偏置的比例信号,并且当偏置比例信号和偏移补偿电压之间的电压差超过比较电压阈值时,在输出端产生激活信号。

    Flow transport analysis method and system

    公开(公告)号:US20060116829A1

    公开(公告)日:2006-06-01

    申请号:US10757446

    申请日:2004-01-15

    IPC分类号: G01F1/00

    CPC分类号: E03F7/00 G01F1/002 G01F1/708

    摘要: A method and system for analyzing flow of a substance in a sewer system determines a first flow velocity at a first location and a second flow velocity at a second location. Using a processor, the travel time between the two locations is determined using only the flow velocities and a constant. The travel time may then be used to provide a substantially accurate determination of net flow between the two locations.

    Methods and systems for determining a property of an insulating film
    16.
    发明授权
    Methods and systems for determining a property of an insulating film 有权
    用于确定绝缘膜性能的方法和系统

    公开(公告)号:US07358748B1

    公开(公告)日:2008-04-15

    申请号:US11291075

    申请日:2005-11-30

    摘要: A method for determining a property of an insulating film is provided. The method may include obtaining a charge density measurement of the film, a surface voltage potential of the film relative to a bulk voltage potential of the substrate, and a rate of voltage decay of the film. The method may also include determining the property of the film using the charge density, the surface voltage potential, and the rate of voltage decay. A method for determining a thickness of an insulating film is provided. The method may include depositing a charge on the film, measuring a surface voltage potential of the film relative to a bulk voltage potential of the substrate, and measuring a rate of voltage decay of the film. The method may also include determining a thickness of the film using the rate of voltage decay and a theoretical model relating to current leakage and film thickness.

    摘要翻译: 提供一种用于确定绝缘膜的性质的方法。 该方法可以包括获得膜的电荷密度测量,膜相对于衬底的体电压电位的表面电压电势以及膜的电压衰减速率。 该方法还可以包括使用电荷密度,表面电压电位和电压衰减速率确定膜的性质。 提供一种确定绝缘膜厚度的方法。 该方法可以包括在膜上沉积电荷,测量膜相对于衬底的体电压电位的表面电压电位,以及测量膜的电压衰减速率。 该方法还可以包括使用电压衰减速率和与电流泄漏和膜厚度有关的理论模型来确定膜的厚度。