公开(公告)号：US20250003797A1

公开(公告)日：2025-01-02

申请号：US18886924

申请日：2024-09-16

Applicant: Photothermal Spectroscopy Corp.

Inventor： Derek Decker ,  Craig Prater

IPC: G01J3/02 ,  G01J3/10

Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.

公开(公告)号：US20240044782A1

公开(公告)日：2024-02-08

申请号：US18452023

申请日：2023-08-18

Applicant: Photothermal Spectroscopy Corp.

Inventor： Craig Prater ,  David Grigg ,  Derek Decker

IPC: G01N21/35 ,  G02B21/00 ,  G01J3/45

CPC classification number: G01N21/35 ,  G02B21/002 ,  G01J3/45

Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.

公开(公告)号：US20240011830A1

公开(公告)日：2024-01-11

申请号：US18311748

申请日：2023-05-03

Applicant: Photothermal Spectroscopy Corp

Inventor： Derek Decker ,  Craig Prater

IPC: G01J3/02 ,  G01J3/10

CPC classification number: G01J3/0297 ,  G01J3/0216 ,  G01J3/0229 ,  G01J3/108 ,  G01J2003/102

Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.

公开(公告)号：US11774354B2

公开(公告)日：2023-10-03

申请号：US17955131

申请日：2022-09-28

Applicant: Photothermal Spectroscopy Corp

Inventor： Craig Prater ,  David Grigg ,  Derek Decker

IPC: G01J3/45 ,  G01N21/35 ,  G02B21/00

CPC classification number: G01N21/35 ,  G01J3/45 ,  G02B21/002

Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.

公开(公告)号：US20230236118A1

公开(公告)日：2023-07-27

申请号：US17955131

申请日：2022-09-28

Applicant: Photothermal Spectroscopy Corp

Inventor： Craig Prater ,  David Grigg ,  Derek Decker

IPC: G01N21/35 ,  G02B21/00 ,  G01J3/45

CPC classification number: G01N21/35 ,  G02B21/002 ,  G01J3/45

Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.

公开(公告)号：US20230131208A1

公开(公告)日：2023-04-27

申请号：US17955122

申请日：2022-09-28

Applicant: Photothermal Spectroscopy Corp.

Inventor： Derek Decker ,  Craig Prater

IPC: G01J3/02 ,  G01J3/10

Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.