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公开(公告)号:US12170856B2
公开(公告)日:2024-12-17
申请号:US17823125
申请日:2022-08-30
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jaeyoung Bae , Sunyool Kang , Haesick Sul , Suyong Kim
IPC: H04N25/75 , H01L27/146 , H04N25/709 , H04N25/71 , H04N25/77 , H04N25/79
Abstract: An image sensor includes a pixel array that includes a first pixel group located in a first row and including a first select transistor and a first floating diffusion region, a second pixel group located in a second row and including a second select transistor and a second floating diffusion region, and a column line connected to both the first pixel group and the second pixel group. While charges generated by a photoelectric conversion element of the first pixel group are transferred to the first floating diffusion region, the first select transistor is turned off, the second select transistor is turned on, and a first voltage is applied to the column line through the second select transistor. A photoelectric conversion element of the second pixel group generates charges prior to the photoelectric conversion element of the first pixel group, so as to be transferred to the second floating diffusion region.
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公开(公告)号:US20230016998A1
公开(公告)日:2023-01-19
申请号:US17824607
申请日:2022-05-25
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yunhong Kim , Heesung Chae , Yunhwan Jung , Haesick Sul
IPC: H04N5/378 , H04N5/3745 , H04N5/369
Abstract: An image sensor for sampling a pixel signal a plurality of times during a readout time includes an analog comparator configured to compare a signal level of the pixel signal with a signal level of a target ramp signal that is any one of a plurality of ramp signals, a counter configured to output counting data based on a comparison result of the analog comparator, and a digital comparing circuit configured to compare a binary value of a target reference code corresponding to the target ramp signal with a binary value of the counting data and determine whether to output a digital signal corresponding to the counting data to a data output circuit based on a result of the comparison between the binary value of the counting data and the binary value of the target reference code.
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公开(公告)号:US11076118B2
公开(公告)日:2021-07-27
申请号:US16740545
申请日:2020-01-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Minji Hwang , Hyosang Kim , Haesick Sul , Seung Hyun Lim
IPC: H04N5/378 , H04N9/04 , H04N5/345 , H04N5/347 , H04N5/3745 , H04N5/369 , H01L27/146
Abstract: Disclosed is an image sensor. The image sensor includes an active pixel sensor array including first to fourth pixel units sequentially arranged in a column direction, and each of the first to fourth pixel units is composed of a plurality of pixels. A first pixel group including the first and second pixel units is connected to a first column line, and a second pixel group including the third pixel unit and the fourth pixel unit is connected to a second column line. The image sensor includes a correlated double sampling circuit including first and second correlated double samplers and configured to convert a first sense voltage sensed from a selected pixel of the first pixel group and a second sense voltage sensed from a selected pixel of the second pixel group into a first correlated double sampling signal and a second correlated double sampling signal, respectively.
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公开(公告)号:US10368023B2
公开(公告)日:2019-07-30
申请号:US15252596
申请日:2016-08-31
Applicant: Samsung Electronics Co., Ltd.
Inventor: Minji Hwang , Hyosang Kim , Haesick Sul , Seung Hyun Lim
IPC: H04N5/378 , H01L27/146 , H04N5/345 , H04N5/347 , H04N5/3745 , H04N9/04
Abstract: Disclosed is an image sensor. The image sensor includes an active pixel sensor array including first to fourth pixel units sequentially arranged in a column direction, and each of the first to fourth pixel units is composed of a plurality of pixels. A first pixel group including the first and second pixel units is connected to a first column line, and a second pixel group including the third pixel unit and the fourth pixel unit is connected to a second column line. The image sensor includes a correlated double sampling circuit including first and second correlated double samplers and configured to convert a first sense voltage sensed from a selected pixel of the first pixel group and a second sense voltage sensed from a selected pixel of the second pixel group into a first correlated double sampling signal and a second correlated double sampling signal, respectively.
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