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1.
公开(公告)号:US11709518B2
公开(公告)日:2023-07-25
申请号:US17150316
申请日:2021-01-15
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kyung-Min Kim , Haesick Sul , Sunyool Kang , Yunhong Kim , Seungmin Suh , Hyeonji Lee , Yunhwan Jung
Abstract: Disclosed is a bandgap reference circuit, which includes a first current generator that generates a first current proportional to a temperature, a second current generator that outputs a second current obtained by mirroring the first current to a first node at which a reference voltage is formed, a first resistor that is connected with the first node and is supplied with the second current, and a first bipolar junction transistor (BJT) that includes an emitter node connected with the first resistor, a base node supplied with a first power, and a collector node supplied with a second power different from the first power.
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公开(公告)号:US20210344861A1
公开(公告)日:2021-11-04
申请号:US17375100
申请日:2021-07-14
Applicant: Samsung Electronics Co., Ltd.
Inventor: Minji Hwang , Hyosang Kim , Haesick Sul , Seung Hyun Lim
IPC: H04N5/378 , H04N5/345 , H04N5/347 , H04N5/3745 , H04N9/04 , H04N5/369 , H01L27/146
Abstract: Disclosed is an image sensor. The image sensor includes an active pixel sensor array including first to fourth pixel units sequentially arranged in a column direction, and each of the first to fourth pixel units is composed of a plurality of pixels. A first pixel group including the first and second pixel units is connected to a first column line, and a second pixel group including the third pixel unit and the fourth pixel unit is connected to a second column line. The image sensor includes a correlated double sampling circuit including first and second correlated double samplers and configured to convert a first sense voltage sensed from a selected pixel of the first pixel group and a second sense voltage sensed from a selected pixel of the second pixel group into a first correlated double sampling signal and a second correlated double sampling signal, respectively.
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公开(公告)号:US12143739B2
公开(公告)日:2024-11-12
申请号:US17857812
申请日:2022-07-05
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yunhong Kim , Yunhwan Jung , Heesung Chae , Mooyoung Kim , Haesick Sul
IPC: H04N25/75 , H04N25/63 , H04N25/633
Abstract: An image sensor may include a pixel array a pixel array including an active pixel and an optical black pixel, the active pixel configured to generate a first pixel signal, and the optical black pixel configured to generate a second pixel signal, a first biasing circuit configured to bias the first pixel signal based on a first bias voltage, a first analog-to-digital converter configured to convert the biased first pixel signal into a first digital signal, a second biasing circuit configured to bias the second pixel signal based on a second bias voltage, and a second analog-to-digital converter configured to convert the biased second pixel signal into a second digital signal, the second digital signal configured to generate smaller random noise than the first analog-to-digital converter.
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公开(公告)号:US20210120200A1
公开(公告)日:2021-04-22
申请号:US16890422
申请日:2020-06-02
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sunyool Kang , Yongjun Cho , Yunhwan Jung , Heesung Chae , Kyungmin Kim , Haesick Sul , Sukki Yoon
IPC: H04N5/3745 , H01L27/146
Abstract: An image sensor, including a pixel array including a plurality of pixels connected to row lines extending in a first direction and column lines extending in a second direction intersecting the first direction; a ramp voltage generator configured to output a ramp voltage; a sampling circuit including a plurality of comparators, each comparator of the plurality of comparators having a first input terminal connected to a column of the column lines and a second input terminal configured to receive the ramp voltage; and an analog-to-digital converter configured to convert an output of the plurality of comparators to a digital signal, wherein the plurality of comparators include a first comparator connected to a first column line, and a second comparator connected to a second column line adjacent to the first column line in the first direction, wherein each of the first comparator and the second comparator includes a first transistor and a second transistor disposed sequentially in the second direction, and wherein a gap between the first transistor of the first comparator and the second transistor of the first comparator is different from a gap between the first transistor of the second comparator and the second transistor of the second comparator.
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公开(公告)号:US11606523B2
公开(公告)日:2023-03-14
申请号:US16890422
申请日:2020-06-02
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sunyool Kang , Yongjun Cho , Yunhwan Jung , Heesung Chae , Kyungmin Kim , Haesick Sul , Sukki Yoon
IPC: H04N5/3745 , H01L27/146
Abstract: An image sensor, including a pixel array including a plurality of pixels connected to row lines extending in a first direction and column lines extending in a second direction intersecting the first direction; a ramp voltage generator configured to output a ramp voltage; a sampling circuit including a plurality of comparators, each comparator of the plurality of comparators having a first input terminal connected to a column of the column lines and a second input terminal configured to receive the ramp voltage; and an analog-to-digital converter configured to convert an output of the plurality of comparators to a digital signal, wherein the plurality of comparators include a first comparator connected to a first column line, and a second comparator connected to a second column line adjacent to the first column line in the first direction, wherein each of the first comparator and the second comparator includes a first transistor and a second transistor disposed sequentially in the second direction, and wherein a gap between the first transistor of the first comparator and the second transistor of the first comparator is different from a gap between the first transistor of the second comparator and the second transistor of the second comparator.
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公开(公告)号:US11516424B2
公开(公告)日:2022-11-29
申请号:US17375100
申请日:2021-07-14
Applicant: Samsung Electronics Co., Ltd.
Inventor: Minji Hwang , Hyosang Kim , Haesick Sul , Seung Hyun Lim
IPC: H04N5/378 , H04N5/345 , H04N5/347 , H04N5/3745 , H04N9/04 , H04N5/369 , H01L27/146
Abstract: Disclosed is an image sensor. The image sensor includes an active pixel sensor array including first to fourth pixel units sequentially arranged in a column direction, and each of the first to fourth pixel units is composed of a plurality of pixels. A first pixel group including the first and second pixel units is connected to a first column line, and a second pixel group including the third pixel unit and the fourth pixel unit is connected to a second column line. The image sensor includes a correlated double sampling circuit including first and second correlated double samplers and configured to convert a first sense voltage sensed from a selected pixel of the first pixel group and a second sense voltage sensed from a selected pixel of the second pixel group into a first correlated double sampling signal and a second correlated double sampling signal, respectively.
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公开(公告)号:US20200154071A1
公开(公告)日:2020-05-14
申请号:US16740545
申请日:2020-01-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Minji Hwang , Hyosang Kim , Haesick Sul , Seung Hyun Lim
IPC: H04N5/378 , H01L27/146 , H04N9/04 , H04N5/3745 , H04N5/347 , H04N5/345
Abstract: Disclosed is an image sensor. The image sensor includes an active pixel sensor array including first to fourth pixel units sequentially arranged in a column direction, and each of the first to fourth pixel units is composed of a plurality of pixels. A first pixel group including the first and second pixel units is connected to a first column line, and a second pixel group including the third pixel unit and the fourth pixel unit is connected to a second column line. The image sensor includes a correlated double sampling circuit including first and second correlated double samplers and configured to convert a first sense voltage sensed from a selected pixel of the first pixel group and a second sense voltage sensed from a selected pixel of the second pixel group into a first correlated double sampling signal and a second correlated double sampling signal, respectively.
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8.
公开(公告)号:US11924569B2
公开(公告)日:2024-03-05
申请号:US17824607
申请日:2022-05-25
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yunhong Kim , Heesung Chae , Yunhwan Jung , Haesick Sul
IPC: H04N25/75 , H04N25/701 , H04N25/772
CPC classification number: H04N25/75 , H04N25/701 , H04N25/772
Abstract: An image sensor for sampling a pixel signal a plurality of times during a readout time includes an analog comparator configured to compare a signal level of the pixel signal with a signal level of a target ramp signal that is any one of a plurality of ramp signals, a counter configured to output counting data based on a comparison result of the analog comparator, and a digital comparing circuit configured to compare a binary value of a target reference code corresponding to the target ramp signal with a binary value of the counting data and determine whether to output a digital signal corresponding to the counting data to a data output circuit based on a result of the comparison between the binary value of the counting data and the binary value of the target reference code.
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公开(公告)号:US10574929B2
公开(公告)日:2020-02-25
申请号:US16523021
申请日:2019-07-26
Applicant: Samsung Electronics Co., Ltd.
Inventor: Minji Hwang , Hyosang Kim , Haesick Sul , Seung Hyun Lim
IPC: H04N5/378 , H04N9/04 , H04N5/3745 , H04N5/345 , H01L27/146 , H04N5/347
Abstract: Disclosed is an image sensor. The image sensor includes an active pixel sensor array including first to fourth pixel units sequentially arranged in a column direction, and each of the first to fourth pixel units is composed of a plurality of pixels. A first pixel group including the first and second pixel units is connected to a first column line, and a second pixel group including the third pixel unit and the fourth pixel unit is connected to a second column line. The image sensor includes a correlated double sampling circuit including first and second correlated double samplers and configured to convert a first sense voltage sensed from a selected pixel of the first pixel group and a second sense voltage sensed from a selected pixel of the second pixel group into a first correlated double sampling signal and a second correlated double sampling signal, respectively.
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公开(公告)号:US20170163920A1
公开(公告)日:2017-06-08
申请号:US15252596
申请日:2016-08-31
Applicant: Samsung Electronics Co., Ltd.
Inventor: Minji Hwang , Hyosang Kim , Haesick Sul , Seung Hyun Lim
IPC: H04N5/378 , H01L27/146
CPC classification number: H04N5/378 , H01L27/14605 , H01L27/14612 , H04N5/3456 , H04N5/347 , H04N5/37457 , H04N9/045 , H04N9/04511
Abstract: Disclosed is an image sensor. The image sensor includes an active pixel sensor array including first to fourth pixel units sequentially arranged in a column direction, and each of the first to fourth pixel units is composed of a plurality of pixels. A first pixel group including the first and second pixel units is connected to a first column line, and a second pixel group including the third pixel unit and the fourth pixel unit is connected to a second column line. The image sensor includes a correlated double sampling circuit including first and second correlated double samplers and configured to convert a first sense voltage sensed from a selected pixel of the first pixel group and a second sense voltage sensed from a selected pixel of the second pixel group into a first correlated double sampling signal and a second correlated double sampling signal, respectively.
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