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    Memory controller, operating method of the memory controller, and storage device including the memory controller
    13.
    发明授权
    Memory controller, operating method of the memory controller, and storage device including the memory controller 有权

    公开(公告)号：US10990536B2

    公开(公告)日：2021-04-27

    申请号：US16506308

    申请日：2019-07-09

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Jung-Hoon Kim ,  Young-Sik Lee

    IPC: G06F12/1009

    Abstract: A memory controller, an operating method of the memory controller, and a storage device including the memory controller are disclosed. The memory controller includes: a memory configured to store an address mapping table and a segment mapping table; and a mapping data management module configured to select at least two updated segments among a plurality of segments included in the address mapping table as page data to be stored in one page of a nonvolatile memory, wherein each of the plurality of segments includes a plurality of mapping entries representing mapping information between logical addresses and physical addresses, and wherein the segment mapping table includes physical addresses representing areas in which each of the plurality of segments is stored in the nonvolatile memory.

    Methods of detecting inhomogeneity of a layer and apparatus for performing the same
    14.
    发明授权
    Methods of detecting inhomogeneity of a layer and apparatus for performing the same 有权
    检测层的不均匀性的方法及其执行方法

    公开(公告)号：US09528949B2

    公开(公告)日：2016-12-27

    申请号：US14197737

    申请日：2014-03-05

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Jung-Hoon Kim ,  Jin-A Ryu ,  Chang-Ho Lee ,  Dong-Won Kim ,  Jae-Ho Kim ,  Jung-Dae Park ,  Nae-Ry Yu ,  Pil-Kwon Jun

    IPC: G01N23/20

    CPC classification number: G01N23/20025 ,  G01N2223/611

    Abstract: In a method of detecting inhomogeneity of a layer, an incident light may be irradiated to at least two regions of the layer at a first incident angle position. First reflected lights reflected from the two regions of the layer may be sensed. The incident light may be irradiated to the at least two regions of the layer at a second incident angle position. Second reflected lights reflected from the two regions of the layer may be sensed. The first reflected lights and the second reflected lights may be compared with each other to obtain the inhomogeneity of the layer. Thus, the layer having a spot may be found.

    Abstract translation: 在检测层的不均匀性的方法中，入射光可以在第一入射角位置被照射到层的至少两个区域。 可以感测从层的两个区域反射的第一反射光。 可以在第二入射角位置将入射光照射到层的至少两个区域。 可以感测到从层的两个区域反射的第二反射光。 可以将第一反射光和第二反射光相互比较以获得层的不均匀性。 因此，可以发现具有斑点的层。

    Methods of Detecting Inhomogeneity of a Layer and Apparatus for Performing the Same
    19.
    发明申请
    Methods of Detecting Inhomogeneity of a Layer and Apparatus for Performing the Same 有权
    检测层的不均匀性的方法及其执行装置

    公开(公告)号：US20140270078A1

    公开(公告)日：2014-09-18

    申请号：US14197737

    申请日：2014-03-05

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Jung-Hoon Kim ,  Jin-A Ryu ,  Chang-Ho Lee ,  Dong-Won Kim ,  Jae-Ho Kim ,  Jung-Dae Park ,  Nae-Ry Yu ,  Pil-Kwon Jun

    IPC: G01N23/20

    CPC classification number: G01N23/20025 ,  G01N2223/611

    Abstract: In a method of detecting inhomogeneity of a layer, an incident light may be irradiated to at least two regions of the layer at a first incident angle position. First reflected lights reflected from the two regions of the layer may be sensed. The incident light may be irradiated to the at least two regions of the layer at a second incident angle position. Second reflected lights reflected from the two regions of the layer may be sensed. The first reflected lights and the second reflected lights may be compared with each other to obtain the inhomogeneity of the layer. Thus, the layer having a spot may be found.

    Abstract translation: 在检测层的不均匀性的方法中，入射光可以在第一入射角位置被照射到该层的至少两个区域。 可以感测从层的两个区域反射的第一反射光。 可以在第二入射角位置将入射光照射到层的至少两个区域。 可以感测到从层的两个区域反射的第二反射光。 可以将第一反射光和第二反射光相互比较以获得层的不均匀性。 因此，可以发现具有斑点的层。

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