公开(公告)号：US20100166036A1

公开(公告)日：2010-07-01

申请号：US12592739

申请日：2009-12-02

Applicant: Sooping Saw ,  Alphonse Chesneau

Inventor： Sooping Saw ,  Alphonse Chesneau

IPC: G01K7/01

CPC classification number: G01K7/01 ,  G01K3/10

Abstract: An apparatus and method are disclosed for temperature measurement that includes performing a first ΔVbe measurement of a first temperature of a diode circuit comprising a transistor and, subsequently, performing a first Vbe measurement of a second temperature of the diode circuit. A temperature difference is calculated between the second temperature and the first temperature. If the temperature difference is not greater than a predetermined amount, a second Vbe measurement of a third temperature of the diode circuit is subsequently performed. If the temperature difference is greater than the predetermined amount, a second ΔVbe measurement of the second temperature of the diode circuit is performed.

Abstract translation: 公开了一种用于温度测量的装置和方法，包括执行包括晶体管的二极管电路的第一温度的第一和第（V）测量，以及随后执行二极管电路的第二温度的第一Vbe测量。 在第二温度和第一温度之间计算温度差。 如果温度差不大于预定量，则随后执行二极管电路的第三温度的第二Vbe测量。 如果温度差大于预定量，则执行二极管电路的第二温度的第二＆Dgr。Vbe测量。

公开(公告)号：US08827165B2

公开(公告)日：2014-09-09

申请号：US13039832

申请日：2011-03-03

Applicant: David C. McClure ,  Sooping Saw ,  Robert Wadsworth

Inventor： David C. McClure ,  Sooping Saw ,  Robert Wadsworth

IPC: G06K19/06 ,  G11C16/22 ,  G11C16/20 ,  G11C17/16

CPC classification number: G11C16/20 ,  G11C16/22 ,  G11C17/16

Abstract: An integrated circuit includes an output pad, an alarm output pad, and a test mode output pad. A first multi-bit register is programmable to store programmable data such as data that identifies a customer for whom the integrated circuit has been manufactured. A second multi-bit register is programmable to store customer specified threshold data. A first circuit selectively couples the first and second multi-bit registers to the output pad. The first circuit is operable responsive to the integrated circuit being placed into a test mode to perform parallel-to-serial conversion of either the customer identification data stored in the first multi-bit register or the customer specified threshold data stored in the second multi-bit register and drive the converted data for output through the output pad. The integrated circuit further includes a tamper detection circuit operable responsive to the customer specified threshold data to generate a tamper alarm signal. A second circuit selectively couples the tamper alarm signal to the alarm output pad and test mode output pad depending on whether the integrated circuit is in a test mode. More specifically, the second circuit operates to drive the alarm output pad with the tamper alarm signal when the integrated circuit is not in test mode and drive the test mode output pad with the tamper alarm signal when the integrated circuit is in test mode (with the alarm output pad driven to a known state).

Abstract translation: 集成电路包括输出焊盘，报警输出焊盘和测试模式输出焊盘。 第一个多位寄存器是可编程的，用于存储可编程数据，例如识别已经制造了集成电路的客户的数据。 可编程第二个多位寄存器来存储客户指定的阈值数据。 第一电路将第一和第二多位寄存器选择性地耦合到输出焊盘。 第一电路可操作地响应于集成电路被放置在测试模式中，以执行存储在第一多位寄存器中的客户识别数据或存储在第二多位寄存器中的客户指定的阈值数据的并行 - 串行转换， 位寄存器，并通过输出板驱动转换后的数据输出。 集成电路还包括可响应于客户指定的阈值数据操作的篡改检测电路，以产生篡改报警信号。 第二电路根据集成电路是否处于测试模式，选择性地将篡改报警信号耦合到报警输出焊盘和测试模式输出焊盘。 更具体地，当集成电路不处于测试模式时，第二电路用于驱动具有篡改报警信号的报警输出板，并且当集成电路处于测试模式时驱动具有篡改报警信号的测试模式输出板 报警输出板驱动到已知状态）。

公开(公告)号：US08054141B2

公开(公告)日：2011-11-08

申请号：US12627826

申请日：2009-11-30

Applicant: Sooping Saw

Inventor： Sooping Saw

IPC: H03K3/26

CPC classification number: H03K3/0231

Abstract: A relaxation oscillator includes a capacitor connected to a comparator input, current sources switched to supply power to the capacitor based on an output of the comparator, and a duplicate integrator shifting a voltage on the capacitor to offset a propagation delay through the comparator. The duplicate integrator includes current sources and a capacitor matching and switched in tandem with those within the relaxation oscillator, plus an additional current source, and is selectively switched into connection with the comparator input. By canceling the comparator propagation delay, the oscillator output frequency can be stably controlled through selection of resistive and capacitive values, using cheaper technology and tolerating large temperature, voltage and process variations.

Abstract translation: 张弛振荡器包括连接到比较器输入的电容器，基于比较器的输出切换到电容器电源的电流源，以及重复积分器，使电容器上的电压移位以偏移通过比较器的传播延迟。 复合积分器包括电流源和与弛豫振荡器内的那些电容器匹配和切换的电容器，以及附加电流源，并且被选择性地切换成与比较器输入连接。 通过消除比较器传播延迟，可以通过选择电阻和电容值来稳定地控制振荡器输出频率，使用更便宜的技术并且容忍大的温度，电压和工艺变化。

公开(公告)号：US20080191917A1

公开(公告)日：2008-08-14

申请号：US12020861

申请日：2008-01-28

Applicant: David C. McClure ,  Sooping Saw

Inventor： David C. McClure ,  Sooping Saw

IPC: H03M1/66

CPC classification number: G01K3/005 ,  G01K7/015

Abstract: A digital-to-analog converter, in response to a digital signal, selectively taps a resistor string to generate an analog output and selectively shunts around resistors in the string to voltage shift the analog output. If two supply voltage sets are present, two strings are provided. A mutually exclusively selection of outputs is made to select a source of the analog output. An integrated circuit temperature sensor uses the converter and includes a sensing circuit that determines exposure to one of a relatively low or high temperature. A measured voltage across the base-emitter of a bipolar transistor is selected in low temperature exposure and compared against a first reference for a too cold temperature condition. Alternatively, a measured delta voltage across the base-emitter is selected in high temperature exposure and compared against a second reference voltage for a too hot temperature condition. Through the comparisons, a temperature exposure detection is made.

Abstract translation: 数模转换器响应于数字信号，选择性地抽头电阻串以产生模拟输出，并选择性地分流串中的电阻器以对模拟输出进行电压移位。 如果存在两个电源电压组，则提供两个串。 选择输出的相互选择来选择模拟输出的源。 集成电路温度传感器使用转换器并且包括确定暴露于相对低或高温度之一的感测电路。 在低温暴露下选择双极晶体管的基极 - 发射极两端的测量电压，并与太冷的温度条件下的第一参考值相比较。 或者，在高温暴露中选择基极 - 发射极两端的测量的增量电压，并与过热温度条件下的第二参考电压进行比较。 通过比较，进行温度曝光检测。

公开(公告)号：US20070146056A1

公开(公告)日：2007-06-28

申请号：US11474669

申请日：2006-06-26

Applicant: David McClure ,  Sooping Saw

Inventor： David McClure ,  Sooping Saw

IPC: G05F1/10 ,  G05F3/02 ,  H01L31/058

CPC classification number: G01K3/005 ,  G01K7/015

Abstract: An integrated circuit temperature sensor includes a sensing circuit operable to determine whether the integrated circuit is currently exposed to one of a relatively low temperature or a relatively high temperature. A selection circuit operates to select a measured voltage across the base-emitter of a bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively low temperature or, alternatively, select a measured delta voltage across the base-emitter of the bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively high temperature. A comparator then compares the selected measured voltage across the base-emitter of the bipolar transistor against a first reference voltage indicative of a too cold temperature condition or compares the selected measured delta voltage across the base-emitter of the bipolar transistor against a second reference voltage indicative of a too hot temperature condition. As a result of the comparison, detection may be made as to whether the integrated circuit is currently exposed to one of either a too cold or too hot temperature.

Abstract translation: 集成电路温度传感器包括感测电路，其可操作以确定集成电路当前是否暴露于较低温度或较高温度之一。 如果感测电路指示集成电路当前暴露于相对较低的温度，则选择电路用于选择集成电路的双极晶体管的基极 - 发射极两端的测量电压，或者替代地，选择跨越 如果感测电路指示集成电路当前暴露于相对较高的温度，则集成电路的双极晶体管的基极 - 发射极。 比较器然后将双极晶体管的基极 - 发射极两端的选定测量电压与指示过冷温度条件的第一参考电压进行比较，或将双极晶体管的基极 - 发射极两端的选定测量的增量电压与第二参考电压 表示太热的温度条件。 作为比较的结果，可以检测集成电路当前是否暴露于太冷或过热的温度之一。

公开(公告)号：US20070115032A1

公开(公告)日：2007-05-24

申请号：US11473877

申请日：2006-06-23

Applicant: David McClure ,  Sooping Saw

Inventor： David McClure ,  Sooping Saw

IPC: H03K5/153

CPC classification number: G01K3/005 ,  G01K7/015 ,  G01K15/00

Abstract: An integrated circuit temperature sensor includes a sensing circuit operable to determine whether the integrated circuit is currently exposed to one of a relatively low temperature or a relatively high temperature. A selection circuit operates to select a measured voltage across the base-emitter of a bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively low temperature or, alternatively, select a measured delta voltage across the base-emitter of the bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively high temperature. A comparator then compares the selected measured voltage across the base-emitter of the bipolar transistor against a first reference voltage indicative of a too cold temperature condition or compares the selected measured delta voltage across the base-emitter of the bipolar transistor against a second reference voltage indicative of a too hot temperature condition. As a result of the comparison, detection may be made as to whether the integrated circuit is currently exposed to one of either a too cold or too hot temperature. In a test mode, the circuit is exposed to a readily available temperature, such as room temperature, and the measured delta voltage across the base-emitter and/or the measured voltage across the base-emitter are scaled in accordance with that available temperature for application to the comparator. Alternatively, in test mode the reference voltages are scaled to intersect with the measured delta voltage across the base-emitter and/or the measured voltage across the base-emitter at the available temperature.

Abstract translation: 集成电路温度传感器包括感测电路，其可操作以确定集成电路当前是否暴露于较低温度或较高温度之一。 如果感测电路指示集成电路当前暴露于相对较低的温度，则选择电路用于选择集成电路的双极晶体管的基极 - 发射极两端的测量电压，或者替代地，选择跨越 如果感测电路指示集成电路当前暴露于相对较高的温度，则集成电路的双极晶体管的基极 - 发射极。 比较器然后将双极晶体管的基极 - 发射极两端的选定测量电压与指示过冷温度条件的第一参考电压进行比较，或将双极晶体管的基极 - 发射极两端的选定测量的增量电压与第二参考电压 表示太热的温度条件。 作为比较的结果，可以检测集成电路当前是否暴露于太冷或过热的温度之一。 在测试模式中，电路暴露于易于获得的温度，例如室温，并且基极 - 发射极两端的测量的增量电压和/或基极 - 发射极两端的测量电压都按照可用温度 应用于比较器。 或者，在测试模式中，参考电压被缩放以与基极 - 发射极两端测得的增量电压和/或可用温度下的基极 - 发射极两端的测量电压相交。