公开(公告)号：US10386388B2

公开(公告)日：2019-08-20

申请号：US15718430

申请日：2017-09-28

Applicant: TECHNOPROBE S.p.A.

Inventor： Daniele Acconcia ,  Raffaele Vallauri

IPC: G01R1/073 ,  G01R1/067

Abstract: It is described a contact probe for a testing head for a testing apparatus of electronic devices, the probe comprising a probe body extended in a longitudinal direction between respective end portions adapted to contact respective contact pads, the second end being a contact tip adapted to abut onto a contact pad of the device under test, the body of each contact probe having a length of less than 5000 μm, and including at least one pass-through opening extending along its longitudinal dimension. Conveniently, the at least one pass-through opening is filled by a filling material, in order to define at least one first and one second lateral portions in the body, being parallel and joined to each other by a connecting central portion realized by the filling material at the pass-through opening, the connecting central portion made of the filling material acting as a strengthening element.

公开(公告)号：US09829508B2

公开(公告)日：2017-11-28

申请号：US14791012

申请日：2015-07-02

Applicant: TECHNOPROBE S.p.A.

Inventor： Stefano Felici ,  Raffaele Vallauri ,  Roberto Crippa

IPC: G01R31/20 ,  G01R1/073

CPC classification number: G01R1/07321 ,  G01R1/07357

Abstract: It is described a testing head for a testing equipment of an electronic device comprising at least one upper guide and a lower guide provided with guide holes, a plurality of contact probes inserted into the guide holes of the upper and lower guides and at least one containment element of the probes being is disposed between the upper and lower guides, each of the contact probes having at least one terminal portion which ends with a contact tip adapted to abut on a respective contact pad of the electronic device to be tested; at least one spacer element sandwiched between the containment element and at least one of the upper and lower guides, the spacer element being removable to adjust a length of the terminal portions of the contact probes projecting from the lower guide.

公开(公告)号：US20150309076A1

公开(公告)日：2015-10-29

申请号：US14791012

申请日：2015-07-02

Applicant: TECHNOPROBE S.p.A.

Inventor： Stefano Felici ,  Raffaele Vallauri ,  Roberto Crippa

IPC: G01R1/073

CPC classification number: G01R1/07321 ,  G01R1/07357

Abstract: It is described a testing head for a testing equipment of an electronic device comprising at least one upper guide and a lower guide provided with guide holes, a plurality of contact probes inserted into the guide holes of the upper and lower guides and at least one containment element of the probes being is disposed between the upper and lower guides, each of the contact probes having at least one terminal portion which ends with a contact tip adapted to abut on a respective contact pad of the electronic device to be tested; at least one spacer element sandwiched between the containment element and at least one of the upper and lower guides, the spacer element being removable to adjust a length of the terminal portions of the contact probes projecting from the lower guide.

Abstract translation: 描述了一种用于电子设备的测试设备的测试头，其包括至少一个上引导件和设置有引导孔的下引导件，插入到上引导件和下引导件的引导孔中的多个接触探针和至少一个容纳件 探针的元件设置在上引导件和下引导件之间，每个接触探针具有至少一个末端部分，端接部分以接触末端为末端，接触头部适于邻接待测试的电子设备的相应接触焊盘; 夹在所述容纳元件与所述上导向件和所述下导向件中的至少一个之间的至少一个间隔元件，所述间隔元件可移除以调节从所述下引导件突出的所述接触探针的端子部分的长度。