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Patent Agency Ranking
公开(公告)号：US20170122983A1
公开(公告)日：2017-05-04
申请号：US15405062
申请日：2017-01-12
Applicant: Technoprobe S.p.A.
Inventor： Daniele Acconcia , Raffaele Ubaldo Vallauri
CPC classification number: G01R1/07357 , G01R1/06716
Abstract: A testing head comprising vertical probes includes at least one guide provided with guide holes for housing a plurality of contact probes, each of the contact probes having at least one contact tip able to ensure the mechanical and electrical contact with a corresponding contact pad of a device under test, the guide being housed in a containment element of the testing head. Suitably, each of the contact probes comprises a deformed portion, placed in a bending zone between the guide and the device under test, that deformed portion being adapted to further deform during the normal working of the testing head and being prolonged, at least towards the device under test, by an end portion having a diameter suitable to realize the contact tip, the end portion having a longitudinal extension or height exceeding 500 μm.
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公开(公告)号：US10386388B2
公开(公告)日：2019-08-20
申请号：US15718430
申请日：2017-09-28
Applicant: TECHNOPROBE S.p.A.
Inventor： Daniele Acconcia , Raffaele Vallauri
Abstract: It is described a contact probe for a testing head for a testing apparatus of electronic devices, the probe comprising a probe body extended in a longitudinal direction between respective end portions adapted to contact respective contact pads, the second end being a contact tip adapted to abut onto a contact pad of the device under test, the body of each contact probe having a length of less than 5000 μm, and including at least one pass-through opening extending along its longitudinal dimension. Conveniently, the at least one pass-through opening is filled by a filling material, in order to define at least one first and one second lateral portions in the body, being parallel and joined to each other by a connecting central portion realized by the filling material at the pass-through opening, the connecting central portion made of the filling material acting as a strengthening element.
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公开(公告)号：US20180011126A1
公开(公告)日：2018-01-11
申请号：US15703627
申请日：2017-09-13
Applicant: TECHNOPROBE S.p.A.
Inventor： Daniele Acconcia
CPC classification number: G01R1/06711 , G01R1/06716 , G01R1/06733 , G01R1/0675 , G01R1/07314 , G01R1/07357
Abstract: A testing head for functionality testing a device under test comprises a plurality of contact probes, each contact probe having a rod-like body having a preset length less than 5000 μm extending between a first and a second end, the second end being a contact tip and an opening extending all over its length and defining a plurality of arms, parallel to each other, separated by the opening and connected to the end portions of the contact probe, and an auxiliary guide, arranged transverse to the body and provided with suitable guide holes, the contact probes sliding through each of them, the auxiliary guide defining a gap including one end of the opening being a critical portion of the body and a zone more prone to breakings in the body undergoing low or even no bending stresses in the gap with respect to the rest of the body.
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公开(公告)号：US10578646B2
公开(公告)日：2020-03-03
申请号：US15703627
申请日：2017-09-13
Applicant: TECHNOPROBE S.p.A.
Inventor： Daniele Acconcia
Abstract: A testing head for functionality testing a device under test comprises a plurality of contact probes, each contact probe having a rod-like body having a preset length less than 5000 μm extending between a first and a second end, the second end being a contact tip and an opening extending all over its length and defining a plurality of arms, parallel to each other, separated by the opening and connected to the end portions of the contact probe, and an auxiliary guide, arranged transverse to the body and provided with suitable guide holes, the contact probes sliding through each of them, the auxiliary guide defining a gap including one end of the opening being a critical portion of the body and a zone more prone to breakings in the body undergoing low or even no bending stresses in the gap with respect to the rest of the body.
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公开(公告)号：US20180024166A1
公开(公告)日：2018-01-25
申请号：US15718430
申请日：2017-09-28
Applicant: TECHNOPROBE S.p.A.
Inventor： Daniele Acconcia , Raffaele Vallauri
CPC classification number: G01R1/07378 , G01R1/06716 , G01R1/06733 , G01R1/06744 , G01R1/06755 , G01R1/06772 , G01R1/07314 , G01R1/07357
Abstract: It is described a contact probe for a testing head for a testing apparatus of electronic devices, the probe comprising a probe body extended in a longitudinal direction between respective end portions adapted to contact respective contact pads, the second end being a contact tip adapted to abut onto a contact pad of the device under test, the body of each contact probe having a length of less than 5000 μm, and including at least one pass-through opening extending along its longitudinal dimension. Conveniently, the at least one pass-through opening is filled by a filling material, in order to define at least one first and one second lateral portions in the body, being parallel and joined to each other by a connecting central portion realized by the filling material at the pass-through opening, the connecting central portion made of the filling material acting as a strengthening element.
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