摘要:
A sample analyzer that includes a sample preparing section operative to aspirate a sample from a sample container and a measuring section operative to prepare a plurality of measurement samples from the aspirated sample. A control unit is configured to sequentially measure the plurality of prepared measurement samples, obtain a plurality of measurement data for the respective measurement samples, and obtain an analysis result of a predetermined item of the sample based on the plurality of measurement data.
摘要:
Adjacent memory layers of a multi-layered integrated device as optically coupled, so that data written on one layer can be copied onto its adjacent layers through the optical coupling.
摘要:
A sample analyzing method comprising: aspirating a sample from a sample container; preparing a plurality of measurement samples from the aspirated sample; sequentially measuring the plurality of prepared measurement samples; obtaining a plurality of measurement data for the respective measurement samples; and obtaining an analysis result of a predetermined item of the sample based on the plurality of measurement data, is disclosed. A sample analyzer and a computer program product are also disclosed.