公开(公告)号：US20210297882A1

公开(公告)日：2021-09-23

申请号：US17207091

申请日：2021-03-19

Applicant: Tektronix, Inc.

Inventor： Sam J. Strickling ,  Andrew McCann ,  Daniel S. Froelich ,  Michelle L. Baldwin ,  Jonathan San ,  Lin-Yung Chen

IPC: H04W24/08 ,  G01R35/00

Abstract: Systems and methods for automated recognition of a device under test and retrieving data associated with the device under test based on the recognition. The systems and methods include receiving a recognition key based on an identifying characteristic of the device under test, matching the received recognition key to a stored key in a database, retrieving data related to the stored key when the received recognition key matches the stored key, transmitting instructions to perform an action on a test and measurement device based on the retrieved data, receiving new data related to the device under test, and updating the data in the database related to the stored key with the new data.