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公开(公告)号：US20240004768A1
公开(公告)日：2024-01-04
申请号：US18467597
申请日：2023-09-14
Applicant: Tektronix, Inc.
Inventor： Sam J. Strickling , Daniel S. Froelich , Michelle L. Baldwin , Jonathan San , Lin-Yung Chen
Abstract: A test and measurement system has a test and measurement instrument having an adaptor with an interface configured to communicate through one or more communications links with a new device under test to receive new test results, a memory configured to store a database of test results and a database of analyzed test results related to tests performed with one or more prior devices under test, a data analyzer connected to the test and measurement instrument through the one or more communications link, the data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.
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公开(公告)号：US11940483B2
公开(公告)日：2024-03-26
申请号：US17470424
申请日：2021-09-09
Applicant: Tektronix, Inc.
Inventor： Sam J. Strickling , Daniel S. Froelich , Michelle L Baldwin , Jonathan San , Lin-Yung Chen
IPC: G01R31/28 , G01R31/317 , G06F11/273 , G06F13/20 , G06F13/40 , G06F13/42 , G06F30/398 , H04L43/50
CPC classification number: G01R31/2815 , G01R31/2808 , G01R31/2818
Abstract: Systems, devices and methods for high-speed I/O margin testing can screen high volumes of pre-production and production parts and identify cases where the electrical characteristics have changed enough to impact operation. The margin tester disclosed is lower cost, easier to use and faster than traditional BERT and scopes and can operate on the full multi-lane I/O links in their standard operating states with full loading and cross-talk. The margin tester assesses the electrical receiver margin of an operation multi-lane high speed I/O link with a device under test simultaneously in either or both directions. In a technology-specific form, an embodiment of the margin tester can be implemented as an add-in card margin tester to test motherboard slots of a mother board under test, or as a as a motherboard with slots to test add-in cards.
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公开(公告)号：US11782809B2
公开(公告)日：2023-10-10
申请号：US17359261
申请日：2021-06-25
Applicant: Tektronix, Inc.
Inventor： Sam J. Strickling , Daniel S. Froelich , Michelle L. Baldwin , Jonathan San , Lin-Yung Chen
Abstract: A test and measurement system for analyzing a device under test, including a database configured to store test results related to tests performed with one or more prior devices under test, a receiver to receive new test results about a new device under test, a data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.
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公开(公告)号：US12061232B2
公开(公告)日：2024-08-13
申请号：US17402382
申请日：2021-08-13
Applicant: Tektronix, Inc.
Inventor： Sam J. Strickling , Daniel S. Froelich , Michelle L. Baldwin , Jonathan San , Lin-Yung Chen
IPC: G01R31/317 , G01R31/01 , G06F11/273
CPC classification number: G01R31/31715 , G01R31/01 , G01R31/31713 , G06F11/2733
Abstract: A margin tester including an identification reader configured to receive an adaptor identifier of an adaptor, an interface configured to connect to a device under test through the adaptor, and one or more processors configured to assess a margin, such as an electrical margin or an optical margin, of a device under test and tag the assessment with the adaptor identifier. Assessing the margin can include assessing the margin based on an expected margin that is predicted or provided based on the adaptor identifier.
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公开(公告)号：US20210406144A1
公开(公告)日：2021-12-30
申请号：US17359261
申请日：2021-06-25
Applicant: Tektronix, Inc.
Inventor： Sam J. Strickling , Daniel S. Froelich , Michelle L. Baldwin , Jonathan San , Lin-Yung Chen
Abstract: A test and measurement system for analyzing a device under test, including a database configured to store test results related to tests performed with one or more prior devices under test, a receiver to receive new test results about a new device under test, a data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.
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Patent Agency Ranking
公开(公告)号：US20210405108A1
公开(公告)日：2021-12-30
申请号：US17470424
申请日：2021-09-09
Applicant: Tektronix, Inc.
Inventor： Sam J. Strickling , Daniel S. Froelich , Michelle L. Baldwin , Jonathan San , Lin-Yung Chen
IPC: G01R31/28
Abstract: Systems, devices and methods for high-speed I/O margin testing can screen high volumes of pre-production and production parts and identify cases where the electrical characteristics have changed enough to impact operation. The margin tester disclosed is lower cost, easier to use and faster than traditional BERT and scopes and can operate on the full multi-lane I/O links in their standard operating states with full loading and cross-talk. The margin tester assesses the electrical receiver margin of an operation multi-lane high speed I/O link with a device under test simultaneously in either or both directions. In a technology-specific form, an embodiment of the margin tester can be implemented as an add-in card margin tester to test motherboard slots of a mother board under test, or as a as a motherboard with slots to test add-in cards.
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公开(公告)号：US12216558B2
公开(公告)日：2025-02-04
申请号：US18467597
申请日：2023-09-14
Applicant: Tektronix, Inc.
Inventor： Sam J. Strickling , Daniel S. Froelich , Michelle L. Baldwin , Jonathan San , Lin-Yung Chen
Abstract: A test and measurement system has a test and measurement instrument having an adaptor with an interface configured to communicate through one or more communications links with a new device under test to receive new test results, a memory configured to store a database of test results and a database of analyzed test results related to tests performed with one or more prior devices under test, a data analyzer connected to the test and measurement instrument through the one or more communications link, the data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.
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公开(公告)号：US12055603B2
公开(公告)日：2024-08-06
申请号：US17386384
申请日：2021-07-27
Applicant: Tektronix, Inc.
Inventor： Sam J. Strickling , Daniel S. Froelich , Michelle L. Baldwin , Jonathan San , Lin-Yung Chen
CPC classification number: G01R31/58 , G01R31/1218 , H01R13/64 , H01R13/6675
Abstract: A cable structured to be repeatedly connected to a device, each repeated connection causing degradation of the cable, the cable including a condition indicator disposed on the cable and configured to be updated with each successive connection of the cable into the device.
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公开(公告)号：US20220091185A1
公开(公告)日：2022-03-24
申请号：US17402382
申请日：2021-08-13
Applicant: Tektronix, Inc.
Inventor： Sam J. Strickling , Daniel S. Froelich , Michelle L. Baldwin , Jonathan San , Lin-Yung Chen
IPC: G01R31/317 , G06F11/273 , G01R31/01
Abstract: A margin tester including an identification reader configured to receive an adaptor identifier of an adaptor, an interface configured to connect to a device under test through the adaptor, and one or more processors configured to assess a margin, such as an electrical margin or an optical margin, of a device under test and tag the assessment with the adaptor identifier. Assessing the margin can include assessing the margin based on an expected margin that is predicted or provided based on the adaptor identifier.
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公开(公告)号：US20220034975A1
公开(公告)日：2022-02-03
申请号：US17386384
申请日：2021-07-27
Applicant: Tektronix, Inc.
Inventor： Sam J. Strickling , Daniel S. Froelich , Michelle L. Baldwin , Jonathan San , Lin-Yung Chen
Abstract: A cable structured to be repeatedly connected to a device, each repeated connection causing degradation of the cable, the cable including a condition indicator disposed on the cable and configured to be updated with each successive connection of the cable into the device.
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