公开(公告)号：US20220390513A1

公开(公告)日：2022-12-08

申请号：US17832535

申请日：2022-06-03

Applicant: Tektronix, Inc.

Inventor： Shane A. Hazzard ,  Ajaiey Kumar Sharma ,  Timothy E. Bieber ,  John Marrinan ,  Andrew McCann ,  Pieter Christiaan Seidel ,  Josiah A. Bartlett

IPC: G01R31/317

Abstract: An input selector for electrically connecting one of a plurality of test signals from a device under test to a test and measurement instrument includes a multiplexer having multiple inputs, each of the multiple inputs coupled to a different one of the plurality of test signals from the device under test, and having an output of a selected one of the multiple inputs, and an amplifier coupled to the output of the multiplexer for amplifying the selected test signal of the device under test before being sent as an output of the input selector to the test and measurement instrument. In alternative architectures, two or more amplifiers are coupled to the plurality of test signals, and the multiplexer selects an output of one of the two amplifiers to pass to a measurement instrument for testing.

公开(公告)号：US20210297882A1

公开(公告)日：2021-09-23

申请号：US17207091

申请日：2021-03-19

Applicant: Tektronix, Inc.

Inventor： Sam J. Strickling ,  Andrew McCann ,  Daniel S. Froelich ,  Michelle L. Baldwin ,  Jonathan San ,  Lin-Yung Chen

IPC: H04W24/08 ,  G01R35/00

Abstract: Systems and methods for automated recognition of a device under test and retrieving data associated with the device under test based on the recognition. The systems and methods include receiving a recognition key based on an identifying characteristic of the device under test, matching the received recognition key to a stored key in a database, retrieving data related to the stored key when the received recognition key matches the stored key, transmitting instructions to perform an action on a test and measurement device based on the retrieved data, receiving new data related to the device under test, and updating the data in the database related to the stored key with the new data.