摘要:
By feeding inspection signals independent from each other to upper first and second gate lead inspection lines (52b, 52c), respectively, while maintaining the upper gate-side switching elements (40c) in an ON state, any short circuit between adjacent gate lines (40) of upper gate lines (40) and the like can be detected. By feeding inspection signals independent from each other to lower first and second gate lead inspection lines (53b, 53c), respectively, while maintaining lower gate-side switching elements (40c′) in an ON state, any short circuit between adjacent gate lines (40) of lower gate lines (40) and the like can be detected. By feeding inspection signals independent from each other to source lead inspection lines (55) while maintaining source-side switching elements (41) in an ON state, any short circuit between adjacent ones of source lines (41) and the like can be detected.
摘要:
Provided is an active matrix substrate having improved display quality without forming an inspection line in a terminal arrangement region for inspecting short circuit between connection lines. Scanning lines (40) include first scanning lines having input ends for a scanning signal on one end side, and second scanning lines having input ends for a scanning signal the other end side. In a display region (4), the first scanning lines and the second scanning lines are formed alternately one by one. An active matrix substrate (2) includes a first inspection line (70) and a second inspection line (72) that cross each of a plurality of first connection lines (61), and a third inspection line (75) and a fourth inspection line (77) that cross each of a plurality of second connection lines (64). The first to the fourth inspection lines (70, 72, 75, 77) are formed in a frame-shaped wiring region (6), excluding the terminal arrangement region (5) and the display region (4).
摘要:
An active matrix substrate is provided with first inspection wirings (70, 75) capable of inputting inspection signals to first switching wirings that are not adjacent to each other among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other among the second switching wirings (69, 74), and second inspection wirings (72, 77) capable of inputting inspection signals to first switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the second switching wirings (69, 74).
摘要:
By feeding inspection signals independent from each other to upper first and second gate lead inspection lines (52b, 52c), respectively, while maintaining the upper gate-side switching elements (40c) in an ON state, any short circuit between adjacent gate lines (40) of upper gate lines (40) and the like can be detected. By feeding inspection signals independent from each other to lower first and second gate lead inspection lines (53b, 53c), respectively, while maintaining lower gate-side switching elements (40c′) in an ON state, any short circuit between adjacent gate lines (40) of lower gate lines (40) and the like can be detected. By feeding inspection signals independent from each other to source lead inspection lines (55) while maintaining source-side switching elements (41) in an ON state, any short circuit between adjacent ones of source lines (41) and the like can be detected.
摘要:
A plurality of source lines extending parallel to each other while alternately turning between a plurality of pixel electrodes provided in a delta arrangement, each have a plurality of first linear portions each extending along a side of the corresponding pixel electrode, a plurality of second linear portions each linked to the corresponding first linear portion and extending along a side of the corresponding pixel electrode to a middle portion of the side, and a plurality of protruding portions each extending from one end of the corresponding second linear portion along a side of the corresponding pixel electrode.
摘要:
A functional panel (FP) includes a COM substrate (4) and an SEG substrate (3) that face each other. The functional panel (FP) is combined with a display panel (LP) via an adhesive. The COM substrate (4), which is provided farther from the display panel (LP) than the SEG substrate (3) is, has edges (E1, E2) that face each other. The SEG substrate (3), which is provided closer to the display panel (LP) than the COM substrate (4) is, has (i) an edge (E3) provided along and inside the edge (E1) when viewed from above and (ii) an edge (E4) provided along and inside the edge (E2) when viewed from above. This effectively prevents the occurrence of a defective external shape.
摘要:
An active matrix substrate is provided with first inspection wirings (70, 75) capable of inputting inspection signals to first switching wirings that are not adjacent to each other among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other among the second switching wirings (69, 74), and second inspection wirings (72, 77) capable of inputting inspection signals to first switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the second switching wirings (69, 74).
摘要:
A parallax barrier is manufactured by forming a light-blocking layer by patterning a metal layer or a resin layer on a barrier glass in a photolithography step. On a mask used in the photolithography step, some pitches between slits are different, the slits corresponding to portions whereupon the light-blocking layers are to be formed. In addition, on the mask, first pitches (for instance, 100) and second pitches (for instance 99.5), which can be actually formed with accuracy, are formed in a cycle, and the average of such pitches can be accord with a theoretical pitch distance (for instance, 99.99). Thus, in the parallax barrier to be used for a multiple display device, visibility of the entire screen can be improved, and the parallax barrier which can be manufactured by using the mask lithography technology having a limited accuracy, and a method for manufacturing such parallax barrier are provided.
摘要:
A dummy line, which is disposed in a dummy pixel region (2) on the side of a test wiring region (1) and which has a parasitic capacitance effect like that of an adjacent scanning line (Gj) in an effective display region (3), is commonly used as a test switch line (1a). This test switch line (1a) is provided away from a dummy scanning line (DG) by intervals at which the scanning lines (Gj) are provided in the effective display region (3). As a result, it is possible to realize a display panel capable of reducing a frame area while keeping a test circuit region and the dummy pixel region in the frame area, and a display device having the display panel.