Fluorescent X-ray analysis apparatus
    11.
    发明授权
    Fluorescent X-ray analysis apparatus 有权
    荧光X射线分析仪

    公开(公告)号:US07436926B2

    公开(公告)日:2008-10-14

    申请号:US11799992

    申请日:2007-05-03

    CPC classification number: G01N23/223 G01N2223/076

    Abstract: A sample sealing vessel 8 includes a plurality of wall faces comprising a material for transmitting X-ray, an X-ray source 1 is arranged at a wall face 11 to irradiate primary X-ray, a face 12 different from the face irradiated with the primary X-ray is arranged to be opposed to an X-ray detector 10, and the primary X-ray from the X-ray source 1 is arranged to be able to irradiate the wall face 12 of the sample sealing vessel to which the X-ray detector 10 is opposed.

    Abstract translation: 样品密封容器8包括多个壁面,其包括用于透射X射线的材料,X射线源1设置在壁面11处以照射主X射线,不同于被照射的面的面12 初级X射线被配置为与X射线检测器10相对,并且来自X射线源1的主X射线被布置成能够照射样品密封容器的壁面12,X射线 射线检测器10相对。

    X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD
    12.
    发明申请
    X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD 失效
    X射线分析装置和X射线分析方法

    公开(公告)号:US20080212739A1

    公开(公告)日:2008-09-04

    申请号:US11972337

    申请日:2008-01-10

    CPC classification number: G01N23/223 G01N2223/076

    Abstract: In an X-ray analysis apparatus and an X-ray analysis method, a quantitative analysis is stably performed by stably behaving an X-ray source. There are possessed an X-ray tubular bulb irradiating a primary X-ray to a sample, a primary X-ray adjustment mechanism capable of adjusting an intensity of the primary X-ray, an X-ray detector detecting a characteristic X-ray radiated from the sample, thereby outputting a signal including energy informations of the characteristic X-ray and a scattered X-ray, an analyzer analyzing the above signal, and an incident X-ray adjustment mechanism disposed between the sample and the X-ray detector, and capable of adjusting a total intensity of the characteristic X-ray and the scattered x-ray, which are entered to the X-ray detector.

    Abstract translation: 在X射线分析装置和X射线分析方法中,通过稳定地进行X射线源的稳定地进行定量分析。 具有照射原始X射线的X射线管状灯管,能够调整主X射线强度的主X射线调整机构,检测特征X射线的X射线检测器 从样品输出包括特征X射线和散射X射线的能量信息的信号,分析上述信号的分析仪和设置在样品和X射线检测器之间的入射X射线调节机构, 并且能够调整输入到X射线检测器的特征X射线和散射X射线的总强度。

    Fluorescent X-ray analysis apparatus

    公开(公告)号:US20080013681A1

    公开(公告)日:2008-01-17

    申请号:US11729247

    申请日:2007-03-28

    CPC classification number: G01N23/223 G01N33/02 G01N2223/076

    Abstract: There is provided a fluorescent X-ray analysis apparatus in which a detection lower limit has been improved by reducing an X-ray generating subsidiarily and detected. The fluorescent X-ray analysis apparatus is one which possesses an X-ray source irradiating a primary X-ray, and a detector in which a collimator having a through-hole in its center part has been placed in a front face, and in which, by the detector, there is detected a primary fluorescent X-ray which generates from a sample by irradiating the primary X-ray to a sample, and passes through the through-hole of the collimator. The X-ray source and the detector are disposed while adjoining the sample, and an irradiated face of the X-ray source or the detector, to which a primary scattered ray having generated by the fact that the primary X-ray scatters in the sample and the primary fluorescent X-ray having generated from the sample are irradiated, is covered by a secondary X-ray reduction layer reducing a secondary scattered ray and a secondary fluorescent X-ray, which generate by irradiations of the primary scattered ray and the primary fluorescent X-ray.

    Energy dispersion type radiation detecting system and method of measuring content of object element
    14.
    发明申请
    Energy dispersion type radiation detecting system and method of measuring content of object element 有权
    能量分散型辐射检测系统及物体元素含量测定方法

    公开(公告)号:US20080008293A1

    公开(公告)日:2008-01-10

    申请号:US11820893

    申请日:2007-06-21

    CPC classification number: G01N23/223 G01N2223/076

    Abstract: To provide an energy dispersion type radiation detecting system and a method of measuring a content of an object element capable of carrying out a measurement by determining an intensity of an incidence radiation to constitute an optimum minimum limit of detection by restraining an influence of a pile up, the energy dispersion type radiation detecting system includes an incidence system of irradiating the incidence radiation to a sample by a predetermined intensity, a detection system of detecting a radiation emitted from the sample by irradiating the incidence radiation for specifying a content of an object element of the sample based on a spectrum of the detected radiation, and the energy dispersion type radiation detecting system includes a control portion capable of irradiating the incidence radiation by an optimum intensity by determining the optimum intensity of the incidence radiation minimizing a minimum limit of detection of the object element based on the spectrum of the detected radiation.

    Abstract translation: 为了提供一种能量分散型放射线检测系统和一种能够通过确定入射辐射的强度来测量能够进行测量的物体的内容的方法,以通过抑制堆积的影响来构成最佳的最小检测极限 能量分散型放射线检测系统包括:将入射辐射照射到样品预定强度的入射系统;检测系统,用于通过照射入射辐射来检测从样品发射的辐射,用于指定对象元素的内容 基于检测到的辐射的光谱的样本和能量色散型辐射检测系统包括能够通过确定入射辐射的最佳强度来最大限度地将入射辐射最小化的最佳强度来照射入射辐射的控制部分, 基于dete的光谱的对象元素 电晕辐射。

    Transmission X-ray analyzer and transmission X-ray analysis method
    15.
    发明授权
    Transmission X-ray analyzer and transmission X-ray analysis method 有权
    透射X射线分析仪和透射X射线分析方法

    公开(公告)号:US08912503B2

    公开(公告)日:2014-12-16

    申请号:US13564802

    申请日:2012-08-02

    Applicant: Yoshiki Matoba

    Inventor: Yoshiki Matoba

    CPC classification number: G01N23/083 G01N2223/3307

    Abstract: A transmission X-ray analyzer for detecting a transmission X-ray image of a sample that moves relatively in a predetermined scanning direction includes; a time delay and integration (TDI) sensor including a plurality of stages of line sensors including the plurality of two-dimensionally arranged image pickup devices arranged in a direction perpendicular to the predetermined scanning direction, being configured to transfer charge accumulated in one line sensor to an adjacent subsequent line sensor; a shield unit for shielding a part of the image of light entering the TDI sensor by moving back and forth in the predetermined scanning direction, the shield unit being disposed between the TDI sensor and the sample; and a shield unit position control unit for controlling a position of the shield unit so as to shield a predetermined number of stages of line sensors among the plurality of stages of line sensors.

    Abstract translation: 用于检测在预定扫描方向上相对移动的样品的透射X射线图像的透射X射线分析仪包括: 包括多个行传感器的时间延迟和积分(TDI)传感器,其包括沿垂直于预定扫描方向布置的多个二维布置的图像拾取装置,其被配置为将一行传感器中累积的电荷转移到 相邻的后续线传感器; 屏蔽单元,用于通过在预定扫描方向上前后移动来屏蔽进入TDI传感器的光的一部分图像,该屏蔽单元设置在TDI传感器和样本之间; 以及屏蔽单元位置控制单元,用于控制屏蔽单元的位置,以便屏蔽多级行传感器中的预定数量的行传感器级。

    X-ray inspection device and X-ray inspection method
    16.
    发明授权
    X-ray inspection device and X-ray inspection method 有权
    X光检查装置和X射线检查方法

    公开(公告)号:US08422630B2

    公开(公告)日:2013-04-16

    申请号:US12802401

    申请日:2010-06-07

    Applicant: Yoshiki Matoba

    Inventor: Yoshiki Matoba

    CPC classification number: G01N23/083

    Abstract: In order to prevent misdetection and erroneous detection by clearly determining only a contrast caused by a foreign matter, there are provided an X-ray inspection method and an X-ray inspection device including: an X-ray tube (11) for irradiating a measurement sample with a characteristic X-ray having energy lower than an X-ray absorption edge of one element contained in the measurement sample and having energy higher than an X-ray absorption edge of a detection element; an X-ray detector (13) for receiving a transmission X-ray obtained when the X-ray passes through the sample; and an operation portion (15) for obtaining a contrast image from a transmission image of the transmission X-ray.

    Abstract translation: 为了通过清楚地仅确定由异物引起的对比度来防止错误检测和错误检测,提供了一种X射线检查方法和X射线检查装置,其包括:用于照射测量的X射线管(11) 样品具有能量低于测量样品中包含的一种元素的X射线吸收边缘的能量的特征X射线,并且具有高于检测元件的X射线吸收边缘的能量; X射线检测器(13),用于接收当X射线通过样品时获得的透射X射线; 以及用于从透射X射线的透射图像获得对比度图像的操作部分(15)。

    X-ray analysis apparatus and X-ray analysis method
    17.
    发明授权
    X-ray analysis apparatus and X-ray analysis method 有权
    X射线分析仪和X射线分析法

    公开(公告)号:US08068583B2

    公开(公告)日:2011-11-29

    申请号:US12494851

    申请日:2009-06-30

    CPC classification number: G01N23/223 G01N2223/076

    Abstract: Provided is an X-ray analysis apparatus including: an X-ray tubular bulb for irradiating a sample with a radiation beam; an X-ray detector for detecting a characteristic X-ray and a scattered X-ray and outputting a signal containing energy information on the characteristic X-ray and the scattered X-ray; an analyzer for analyzing the signal; a sample stage capable of moving an irradiation point relatively with respect to the sample within a mapping area set in advance; and an X-ray mapping processing section for discriminating an X-ray intensity corresponding to a specific element, determining an intensity contrast in which a color or lightness is changed in accordance with the X-ray intensity, and for performing image display at a position corresponding to the irradiation point, in which the X-ray mapping processing section determines the intensity contrast of the X-ray intensity at the irradiation point by setting in advance the X-ray intensity discriminated as to a reference material in which a component element and a concentration thereof are known as a reference.

    Abstract translation: 本发明提供一种X射线分析装置,其特征在于,包括:X射线管状灯泡,用于对辐射束照射样品; 用于检测特征X射线和散射X射线并输出包含关于特征X射线和散射X射线的能量信息的信号的X射线检测器; 用于分析信号的分析器; 能够在预先设定的映射区域内相对于样本移动照射点的样本台; 以及X射线映射处理部分,用于鉴别与特定元素相对应的X射线强度,确定根据X射线强度改变颜色或亮度的强度对比度,并且在位置处执行图像显示 对应于照射点,其中X射线测绘处理部分通过预先确定对于其中组分元素和/或组分的参考材料的X射线强度来确定在照射点处的X射线强度的强度对比度 其浓度被称为参考。

    X-RAY ANALYZER AND X-RAY ANALYSIS METHOD
    18.
    发明申请
    X-RAY ANALYZER AND X-RAY ANALYSIS METHOD 有权
    X射线分析仪和X射线分析方法

    公开(公告)号:US20100046700A1

    公开(公告)日:2010-02-25

    申请号:US12544562

    申请日:2009-08-20

    CPC classification number: G01N23/223 G01N2223/076

    Abstract: An X-ray tube which irradiates a primary X-ray to an irradiation point on a sample, an X-ray detector which detects a characteristic X-ray and a scattered X-ray emitted from the sample and outputs a signal including energy information on the characteristic X-ray and scattered X-ray, an analyzer which analyzes the signal, a sample stage on which the sample is placed, a moving mechanism which moves the sample on the sample stage, the X-ray tube, and the X-ray detector relative to each other, a height measuring mechanism which measures a maximum height of the sample, and a control unit which adjusts the distance between the sample and the X-ray tube and the distance between the sample and the X-ray detector by controlling the moving mechanism on the basis of the measured maximum height of the sample, are included.

    Abstract translation: 将X射线照射到样品的照射点的X射线管,检测特征X射线的X射线检测器和从样本发射的散射X射线,并输出包含能量信息的信号 特征X射线和散射X射线,分析信号的分析器,放置样品的样品台,使样品台上的样品移动的移动机构,X射线管和X射线管, 相对于彼此的X射线检测器,测量样品的最大高度的高度测量机构,以及调整样品与X射线管之间的距离以及样品与X射线检测器之间的距离的控制单元, 包括根据测得的样品最大高度来控制移动机构。

    Fluorescent x-ray analysis apparatus
    19.
    发明授权
    Fluorescent x-ray analysis apparatus 有权
    荧光X射线分析仪

    公开(公告)号:US07424093B2

    公开(公告)日:2008-09-09

    申请号:US11805665

    申请日:2007-05-24

    Abstract: To provide a fluorescent X-ray analysis apparatus, whereby a peak-back ratio is improved by effectively exciting a focused element and a detection limit of the focused element is improved by decreasing a scattered X-ray to be a background. A sample housing has one or more wall surfaces made of a material through which an X-ray transmits and an X-ray source is arranged so that a primary X-ray is irradiated on the wall surface. In addition, the sample housing is arranged so that a wall surface different from a wall surface on which the primary X-ray is irradiated is opposed to an X-ray detector incident window. Further, the primary X-ray from the X-ray source is arranged so as to be able to irradiate the wall surface of the sample housing to which the X-ray detector incident window is opposed. The sample housing has a shape extending in response to extension of a viewing filed that a detection element in the X-ray detector is seen from the X-ray detector incident window. In addition, on the wall of the sample housing, a metal for secondarily exciting the focused element is arranged on an area other than an area through which the primary X-ray transmits and an area where the fluorescent X-ray from the focused element passes to the detector.

    Abstract translation: 为了提供一种荧光X射线分析装置,通过有效地激发聚焦元件来提高峰回比,并且通过将散射的X射线减少为背景来提高聚焦元件的检测极限。 样品壳体具有一个或多个由X射线透过的材料制成的壁表面,并且X射线源被布置成使得主壁X射线照射在壁表面上。 另外,样品壳体被布置成使得不同于其上照射有初级X射线的壁表面的壁表面与X射线检测器入射窗口相对。 此外,来自X射线源的主要X射线被布置成能够照射X射线检测器入射窗口相对的样品壳体的壁表面。 样品壳体具有响应于从X射线检测器入射窗看到X射线检测器中的检测元件的观察区域的延伸而延伸的形状。 此外,在样品壳体的壁上,用于次要激发聚焦元件的金属被布置在除了主X射线透射的区域之外的区域和来自聚焦元件的荧光X射线通过的区域 到检测器。

    Open chamber-type X-ray analysis apparatus
    20.
    发明授权
    Open chamber-type X-ray analysis apparatus 有权
    开放式X射线分析仪

    公开(公告)号:US06590955B2

    公开(公告)日:2003-07-08

    申请号:US09827124

    申请日:2001-04-05

    CPC classification number: G01N23/223 G01N2223/076

    Abstract: An open chamber-type X-ray fluorescence analysis apparatus is provided to analyze a large-sized sample located outside the open chamber. The apparatus has a helium inlet provided in the open chamber for injecting helium gas into the chamber to replace gas within the chamber with helium, a film attaching/removing mechanism for covering the opening in the chamber with a film having high transmittance with respect to X-rays, and a gas outlet provided in the chamber for allowing gas to exit the chamber.

    Abstract translation: 提供开放室型X射线荧光分析装置,以分析位于开放室外部的大尺寸样品。 该设备具有设置在开放室中的氦气入口,用于将氦气注入到腔室中以用氦代替腔室内的气体,膜附着/去除机构,用于用相对于X的高透射率的膜覆盖腔室中的开口 并且设置在室中的气体出口,用于允许气体离开室。

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