Abstract:
A search engine system (100) compares search key values to stored entry values, and includes first blocks of entries (102) and second blocks of entries (104). First blocks of entries (102) can be “search” blocks that can provide a relatively fast search speed of stored data value, and each store a unique first portion of one or more entry values. Second blocks of entries (104) can be randomly accessible entries logically arranged into search nodes that each correspond to a first portion of an entry value stored in the first block of entries. Each search node can include one or more second portions of an entry value.
Abstract:
A content addressable memory (CAM) device having CAM cells arranged in rows and columns. A plurality of pairs of data lines extend along respective columns of the CAM cells, each pair of data lines including at least one data line that is formed by conductive segments disposed in two different conductivity layers of the CAM device.
Abstract:
A digital signal processor. The digital signal processor includes a first data classification block. The first data classification block outputs a first block priority number associated with a first data stored in the first data classification block that matches a search key. The digital signal processor includes a second data classification block. The second data classification block outputs a second priority number associated with a second data stored in the second data classification block that matches the search key. The digital signal processor includes a device index processor. The device index processor selects a most significant block priority number from the first block priority number and the second block priority number.
Abstract:
A method of testing a semiconductor device having a pipelined architecture. Operation of a first pipeline stage of the semiconductor is disabled during a first pipelined operation to establish test data at an input of a second pipeline stage of the semiconductor device. A second pipelined operation is executed to enable the second pipeline stage to generate an intermediate result using the test data. A final result of the second pipelined operation is evaluated to determine whether the second pipeline stage produced a correct intermediate result.
Abstract:
A content addressable memory (CAM) device can include a plurality of CAM cells arranged in rows and columns to form multi-byte words. Each CAM cell can include a comparator circuit and one or more data storing circuits. Each comparator circuit can have one or more charge transfer paths arranged between a match line and a first voltage source node. Each data storing circuit can include a write circuit that provides a controllable impedance path between one or more charge transfer paths and a data storage node of the data storing circuit.
Abstract:
A frequency synthesis circuit includes a phase locked loop and an interpolator circuit. The phase locked loop circuit receives a reference clock and a feedback clock and generates an output clock with a frequency based on the reference clock and the feedback clock. An interpolator circuit is coupled in the feedback path of the phase locked loop circuit. An interpolator control circuit generates an interpolator control word that specifies a variable time delay for the interpolator circuit. The interpolator circuit receives the output clock, and generates the feedback clock by introducing a variable time delay in the output clock in accordance with the interpolator control word. The time variable delay varies the frequency of the output circuit. Embodiments for frequency synthesis circuits that include a spread spectrum frequency clock generator, frequency modulators, and a fixed frequency clock generator circuit are disclosed.
Abstract:
A frequency synthesis circuit includes a phase locked loop and an interpolator circuit. The phase locked loop circuit receives a reference clock and a feedback clock and generates an output clock with a frequency based on the reference clock and the feedback clock. An interpolator circuit is coupled in the feedback path of the phase locked loop circuit. An interpolator control circuit generates an interpolator control word that specifies a variable time delay for the interpolator circuit. The interpolator circuit receives the output clock, and generates the feedback clock by introducing a variable time delay in the output clock in accordance with the interpolator control word. The time variable delay varies the frequency of the output circuit. Embodiments for frequency synthesis circuits that include a spread spectrum frequency clock generator, frequency modulators, and a fixed frequency clock generator circuit are disclosed.
Abstract:
An apparatus and method of transposing one or more bits in input data relative to other bits of the input data to form a compound for searching in a content addressable memory. The comparand may have one or more bits rearranged from their order appearing in the input data such that one or more bits from a first segment of the input data are replaced with, or substituted by, one or more bits from a second segment of the input data.
Abstract:
According to one embodiment, a content addressable memory (CAM) device (100) may include a number of segments (102 or 104). Search target compare circuits (110 and 112) can compare a target value TARGET to programmable information values (PIV0 and PIV1) associated with a particular segment (102 and 104). If a search target value TARGET matches a programmable information value (PIV0 and PIV1), search operations may be performed in a segment (102 or 104). If a search target value TARGET does not match a programmable information value, (PIV0 and PIV1), search operations may be prevented within a segment (102 or 104).
Abstract:
An integrated circuit device for delivering power to a load includes a P-MOS power transistor, an N-MOS bypass transistor and a gate driver circuit. The P-MOS power transistor is coupled between a supply voltage node and a power output node of the integrated circuit device, and the N-MOS bypass transistor is coupled between the power output node and a reference node of the integrated circuit device. The gate driver circuit responds to a pulse-width-modulated (PWM) control signal by outputting an active-low drive-enable signal to a gate terminal of the P-MOS power transistor and an active-high bypass-enable signal to a gate terminal of the N-MOS bypass transistor during respective, non-overlapping intervals.