MEASUREMENT APPARATUS AND METHOD
    22.
    发明申请

    公开(公告)号:US20210381860A1

    公开(公告)日:2021-12-09

    申请号:US17431947

    申请日:2020-03-11

    Applicant: RENISHAW PLC

    Abstract: A measurement apparatus for mounting within an enclosure of a machine is described. The apparatus includes a measurement device and a protection means for protecting the measurement device from contaminants present within the machine enclosure. The protection means is switchable between at least a first mode that protects the measurement device from contaminants and a second mode that provides less protection of the measurement device from contaminants than the first mode. A contaminant sensor is used for sensing contamination within the machine enclosure and thereby determining when the protection means can adopt the second mode. A corresponding method is also described.

    SPECTROSCOPIC APPARATUS AND METHODS

    公开(公告)号:US20210349030A1

    公开(公告)日:2021-11-11

    申请号:US17277895

    申请日:2019-10-17

    Applicant: RENISHAW PLC

    Abstract: A method of smoothing spectral data recorded by a spectrometer including successively fitting a plurality of spline curves to the spectral data, each spline curve having a different number of knots. A knot position of each knot, other than end point knots, in each spline curve is determined based upon a measure of fit of points of a previously fitted one of the spline curves having fewer knots to the spectral data. The method further includes selecting one of the spline curves as a smoothed data curve of the spectral data based upon a model selection criterion.

    MEASUREMENT METHOD AND APPARATUS
    25.
    发明申请

    公开(公告)号:US20210207938A1

    公开(公告)日:2021-07-08

    申请号:US17059780

    申请日:2019-06-10

    Applicant: RENISHAW PLC

    Abstract: Method for measuring an object using a scanning probe carried by a machine tool having a probe holder for the scanning probe and a carrier for the object. The method includes (i) using the machine tool to move the probe holder relative to the carrier along a pre-programmed scan path, (ii) measuring acceleration whilst the pre-programmed scan path is traversed, (iii) collecting probe data whilst the pre-programmed scan path is traversed, and (iv) using the acceleration measured to identify at least one acceleration zone of the pre-programmed scan path and thereby determine one or more positions along the scan path at which the probe data of step (iii) were collected.

    ADDITIVE MANUFACTURING METHOD AND APPARATUS

    公开(公告)号:US20210146447A1

    公开(公告)日:2021-05-20

    申请号:US17159552

    申请日:2021-01-27

    Applicant: RENISHAW PLC

    Abstract: This invention concerns a method of monitoring an additive manufacturing apparatus. The method comprises receiving one or more sensor signals from the additive manufacturing apparatus during a build of a workpiece, comparing the one or more sensor signals to a corresponding acceptable process variation of a plurality of acceptable process variations and generating a log based upon the comparisons. Each acceptable process variation of the plurality of acceptable process variations is associated with at least one state of progression of the build of the workpiece and the corresponding acceptable process variation is the acceptable process variation associated with the state of progression of the build when the one or more sensor signals are generated.

    Encoder
    28.
    发明授权
    Encoder 有权

    公开(公告)号:US11009374B2

    公开(公告)日:2021-05-18

    申请号:US15775970

    申请日:2016-12-01

    Applicant: RENISHAW PLC

    Abstract: A sealed encoder module for mounting onto a machine so as to measure relative displacement of first and second parts of the machine. The sealed encoder module can comprise, a scale, a readhead comprising a scale signal receiver, and an integral protective housing which encapsulates at least the scale and said scale signal receiver. The sealed encoder module can be configured to determine and output diagnostic information regarding a scale signal detected by the readhead.

    ADDITIVE MANUFACTURING APPARATUS AND METHOD

    公开(公告)号:US20210039167A1

    公开(公告)日:2021-02-11

    申请号:US17079652

    申请日:2020-10-26

    Applicant: RENISHAW PLC

    Abstract: This invention concerns a laser solidification apparatus for building objects by layerwise solidification of powder material. The apparatus including a build chamber containing a build platform, a device for depositing layers of powder material on to the build platform, an optical unit for directing a laser beam to selectively solidify areas of each powder layer and a spectrometer for detecting characteristic radiation emitted by plasma formed during solidification of the powder by the laser beam. The invention also relates to a spectrometer for detecting characteristic radiation generated by interaction of the metal with the or a further laser beam. The spectra recorded using the spectrometer may be used for feedback control during the solidification process.

    COORDINATE POSITIONING MACHINE
    30.
    发明申请

    公开(公告)号:US20210033376A1

    公开(公告)日:2021-02-04

    申请号:US17066054

    申请日:2020-10-08

    Applicant: RENISHAW PLC

    Abstract: A non-Cartesian coordinate positioning machine that includes an extendable leg assembly for positioning a component such as a measurement probe within a working volume of the machine. The extendable leg assembly includes a first member and a second member which move relative to one another when the extendable leg assembly changes length. The first member including an axial arrangement of magnets forming part of a linear motor for extending and retracting the extendable leg assembly, and at least one resilient member for absorbing at least some of any axial thermal expansion or contraction of the magnets in use.

Patent Agency Ranking