Abstract:
An output buffer circuit includes a high voltage detecting circuit, a dynamic gate bias generating circuit, an output stage circuit and a pad voltage detector. The high voltage detecting circuit detects a power supply voltage and generates a first and a second determining signals and a first and a second bias voltages according to the power supply voltage. The dynamic gate bias generating circuit is biased by the first and the second bias voltages and receives the first and the second determining signals, for converting logic control signals into corresponding gate bias voltages according to the first and the second determining signals. The pad voltage detector detects a voltage of an I/O pad and provides a pad voltage detecting signal for the output stage circuit to modify an output signal outputted to an I/O pad. A mixed-voltage input/output (I/O) buffer is disclosed herein.
Abstract:
A mixed-voltage input/output (I/O) buffer includes an output buffer circuit. The output buffer circuit includes an output stage circuit, a gate-tracking circuit and a floating N-well circuit. The output stage circuit includes stacked pull-up P-type transistors and stacked pull-down N-type transistors, in which a first P-type transistor of the stacked pull-up P-type transistors and a first N-type transistor of the stacked pull-down N-type transistors are coupled to an I/O pad. The gate-tracking circuit controls gate voltage of the first P-type transistor in accordance with a voltage of the I/O pad to prevent leakage current. The floating N-well circuit provides N-well voltages for an N-well of the first P-type transistor and an N-well of a second P-type transistor, controlling gate voltage of the first P-type transistor, of the gate-tracking circuit to prevent leakage current.
Abstract:
An input output device coupled between a core circuit and a pad and including an output cell, an input cell, and a pre-driver. The output cell includes an output stage and a voltage level converter. The output stage includes a first transistor and a second transistor connected to the first transistor in serial between a first supply voltage and a second voltage. The voltage level converter generates a first gate voltage to the first transistor according to the first voltage and a data signal. When the first supply voltage is increased, the first gate voltage is increased. When the data signal is at a high level, the first transistor is turned on. The input cell includes a pull unit and a first N-type transistor. The pre-driver turns off the first and the second transistors.
Abstract:
A portable detection system for allergic diseases includes a filtration-based inspection module and a reader module. The filtration-based inspection module includes an FPW sensor and a liquid sample filtration apparatus, wherein the liquid sample filtration apparatus includes an injection opening, a passage module, a filtering membrane and a gathering aperture. The injection opening is in communication with the gathering aperture. The FPW sensor comprises a frame body, a carrier and a sensing chip having an accommodating slot in communication with the gathering aperture. The carrier comprises a plurality of conductive terminals, and the conductive terminals are electrically connected with the sensing chip. The reader module comprises a connection slot capable of being inserted by the conductive terminals of the carrier.
Abstract:
An ESD protection circuit with leakage current reduction function includes a silicon controlled rectifier, a first CMOS inverter, a first transistor, a current mirror, a PMOS capacitor and a resistor. The first CMOS inverter electrically connects with the silicon controlled rectifier. The first transistor comprises a first end, a second end and a third end, wherein the first end electrically connects with the silicon controlled rectifier and the first CMOS inverter, and the current mirror electrically connects with the third end of the first transistor. The PMOS capacitor electrically connects with the current mirror, and the resistor electrically connects with the first CMOS inverter, the second end of the first transistor and the PMOS capacitor.
Abstract:
A mixed-voltage I/O buffer includes an input buffer circuit. The input buffer circuit includes a first inverter, a first voltage level limiting circuit, a first voltage level pull-up circuit, an input stage circuit, and a logic calibration circuit. The first inverter inverts an input signal to generate a first control signal. The first voltage level limiting circuit limits voltage level of an external signal to generate the input signal transmitted to the first inverter to prevent electrical overstress of the first inverter. The first voltage level pull-up circuit is controlled by the first control signal to pull up voltage level of the input signal inputted into the first inverter. The input stage circuit receives the first control signal to generate corresponding digital signals inputted into a core circuit. The logic calibration circuit calibrates voltage level of the first control signal when the first inverter mis-operates due to the input signal having a low voltage level.
Abstract:
A corner detector comprises a PMOS threshold voltage detector and an NMOS threshold voltage detector, the PMOS threshold voltage detector is composed of a first clock terminal, a first CMOS inverter, a first capacitor, a PMOS threshold voltage function generator and a first voltage output terminal, wherein the PMOS threshold voltage function generator is electrically connected to the first capacitor and applied to generate a first formula of voltage signal as a function of threshold voltage, the NMOS threshold voltage detector is composed of a second clock terminal, a second CMOS inverter, a second capacitor, an NMOS threshold voltage function generator and a second voltage output terminal, wherein the NMOS threshold voltage function generator is electrically connected to the second capacitor and applied to generate a second formula of voltage signal as a function of threshold voltage.
Abstract:
The invention relates to an I/O buffer with twice the supply voltage tolerance using normal supply voltage devices. The I/O buffer of the invention includes a driver, a first level converter, a gate-controlled circuit and a dynamic source output stage. Signals of the I/O buffer are classified into a first voltage range and a second voltage range. The first voltage range is zero to the normal supply voltage, and the second voltage range is the normal supply voltage to twice the supply voltage. Therefore, the voltage between any two terminals of any of the transistors in the I/O buffer does not exceed the normal supply voltage so that the I/O buffer of the invention can transmit and receive signals with a voltage swing twice as high as the normal power supply voltage using normal supply voltage devices and without gate-oxide reliability problems.
Abstract:
An output buffer circuit is provided. The output buffer circuit receives a control signal (OE) and a data signal (Dout) from a first core circuit (10) and operates in a transmitting mode according to the control signal. The output buffer circuit converts the data signal into an output signal at a first voltage level or a ground voltage level according to the data signal logic level and a supply voltage (VDDIO). The supply voltage is adjusted to pull up or pull down the first voltage level of the output signal.
Abstract:
The invention relates to an I/O buffer with twice the supply voltage tolerance using normal supply voltage devices. The I/O buffer of the invention includes a driver, a first level converter, a gate-controlled circuit and a dynamic source output stage. Signals of the I/O buffer are classified into a first voltage range and a second voltage range. The first voltage range is zero to the normal supply voltage, and the second voltage range is the normal supply voltage to twice the supply voltage. Therefore, the voltage between any two terminals of any of the transistors in the I/O buffer does not exceed the normal supply voltage so that the I/O buffer of the invention can transmit and receive signals with a voltage swing twice as high as the normal power supply voltage using normal supply voltage devices and without gate-oxide reliability problems.