摘要:
A resettable pressure bar module includes a pressure bar, a rotation element, and a resetting element. The pressure bar includes an outer tube, an upper sealing element, and a lower sealing element. The upper sealing element and the lower sealing element are disposed in the outer tube and respectively disposed on the opposite two sides of the outer tube. The rotation element is fixed to the outer tube and the lower sealing element through a fixing element. One side of the resetting element includes a first guiding slope and a second guiding slope. The pressure bar passes through the resetting element. The rotation element is configured to rotate to a normal position along the first guiding slope or the second guiding slope.
摘要:
A resettable pressure bar module includes a pressure bar, a rotation element, and a resetting element. The pressure bar includes an outer tube, an upper sealing element, and a lower sealing element. The upper sealing element and the lower sealing element are disposed in the outer tube and respectively disposed on the opposite two sides of the outer tube. The rotation element is fixed to the outer tube and the lower sealing element through a fixing element. One side of the resetting element includes a first guiding slope and a second guiding slope. The pressure bar passes through the resetting element. The rotation element is configured to rotate to a normal position along the first guiding slope or the second guiding slope.
摘要:
A light-guiding cover structure includes a top cover unit and a light-guiding unit. The top cover unit has a plurality of receiving spaces formed therein. The light-guiding unit includes a plurality of light-guiding groups, wherein each light-guiding group includes a plurality of optical fiber cables received in the corresponding receiving space, and each optical fiber cable has two opposite ends exposed from the bottom surface of the top cover unit and respectively facing at least one light-emitting device and at least one light-sensing device that have been disposed under the top cover unit. Therefore, the optical fiber cables received in the corresponding receiving space, thus when the light-guiding cover structure is applied to the LED package chip classification system, the aspect of the LED package chip classification system can be enhanced.
摘要:
A multi-track detection system for detecting the appearance of electronic elements includes a rotary module, a feeding module, an unvibrated module, a detection module, and a classification module. The rotary module includes a hollow transparent rotary structure having at least two annular guiding areas on the top surface thereof, and the electronic elements are sequentially arranged on the two annular guiding area. The feeding module has two V-shaped feeding grooves for guiding the electronic elements. The unvibrated module includes an unvibrated guiding block having two V-shaped unvibrated guiding grooves respectively communicated with the two V-shaped feeding grooves and respectively corresponding to the two annular guiding areas. The electronic elements on the V-shaped feeding grooves are sequentially transmitted onto the two annular guiding areas through two V-shaped unvibrated guiding grooves, thus each electronic element can be detected by the detection module and classified by the classification module, respectively.
摘要:
A testing system for inspecting electronic devices includes a first transparent disk, a first image capturing unit disposed under the first transparent disk, a second disk disposed next to the first transparent disk, a guiding unit disposed on adjacent area between the transparent disk and the second disk, and a plurality of second image capturing units disposed around the second disk. A plurality of electronic devices is continuingly supplied onto the first transparent disk and the first image capturing unit is used for capturing the images of the bottom surfaces of the electronic devices. Then, the electronic devices are guided to the second disk via the guiding unit and the second image capturing units are used for capturing the images of other surfaces of the electronic devices. A testing method for electronic devices is further disclosed.
摘要:
A die defect inspecting system with a die defect inspecting function includes a wafer-positioning module, an image-capturing module, a die-sucking module, a die defect analyzing module, a die-classifying module and a control module. The image-capturing module is disposed beside one side of the wafer-positioning module in order to capture an image of each die. The die-sucking module is disposed above the wafer-positioning module and the image-capturing module in order to suck each die from the wafer-positioning module to a position above the image-capturing module for capturing a back image of a back surface of each die. The die defect analyzing module is electrically connected to the image-capturing module in order to judge whether the back image of the back surface of each die passes inspection standard.
摘要:
The invention provides a method for data recording of an optical disk drive. First, raw data is encoded to obtain a plurality of recording units of encoded data to be stored in a memory. The encoded data stored in the memory is then recorded to an optical disk. A predetermined number of recording units of the encoded data is then reserved in the memory as reserved data without being recorded onto the optical disk. The recorded data read from the optical disk is then compared to the corresponding encoded data stored in the memory to verify correctness of the recorded data. The reserved data is then recorded to the optical disk after correctness verification of the recorded data is completed. Finally, the aforementioned steps are repeated until there is no more raw data left as a source for encoding.
摘要:
A testing system for inspecting electronic devices includes a first transparent disk, a first image capturing unit disposed under the first transparent disk, a second disk disposed next to the first transparent disk, a guiding unit disposed on adjacent area between the transparent disk and the second disk, and a plurality of second image capturing units disposed around the second disk. A plurality of electronic devices is continuingly supplied onto the first transparent disk and the first image capturing unit is used for capturing the images of the bottom surfaces of the electronic devices. Then, the electronic devices are guided to the second disk via the guiding unit and the second image capturing units are used for capturing the images of other surfaces of the electronic devices. A testing method for electronic devices is further disclosed.
摘要:
A modulation method for symbols in a frame of a compact disc includes the steps of receiving a plurality of data words, modulating each data word into a code word of a corresponding data symbol, and providing a plurality of combinations of potential merge bits to be inserted between successive symbols of the frame. At least one combination of candidate merge bits is generated according to the plurality of combinations of potential merge bits, a data symbol immediately preceding the location of the candidate merge bits, and a data symbol immediately succeeding the location of the candidate merge bits. The combination of candidate merge bits which minimizes (optimizes) the absolute cumulative DSV is selected when a subsequent group of possible combinations of candidate merge bits is detected or after a predetermined delay, and the selected combination of candidate merge bits is inserted between the two successive data symbols.
摘要:
A modulation system includes an encoder for transferring data words to tentative code words. A DSV control bit generator determines the value of a DSV control bit according to the data words or the tentative code words to optimize the cumulative DSVs corresponding tentative code words, wherein the DSV control bit generator determines the value of a current DSV control bit when at least a subsequent DSV control bit is detected. A final code word generator generates final code words according to the determined DSV control bit and the tentative code words.