METHOD AND APPARATUS FOR MEASURING THE THREE DIMENSIONAL STRUCTURE OF A SURFACE
    24.
    发明申请
    METHOD AND APPARATUS FOR MEASURING THE THREE DIMENSIONAL STRUCTURE OF A SURFACE 审中-公开
    用于测量表面三维结构的方法和装置

    公开(公告)号:US20150009301A1

    公开(公告)日:2015-01-08

    申请号:US14375002

    申请日:2013-01-30

    Abstract: A method includes imaging a surface with at least one imaging sensor, wherein the surface and the imaging sensor are in relative translational motion. The imaging sensor includes a lens having a focal plane aligned at a non-zero angle with respect to an x-y plane of a surface coordinate system. A sequence of images of the surface is registered and stacked along a z direction of a camera coordinate system to form a volume. A sharpness of focus value is determined for each (x,y) location in the volume, wherein the (x,y) locations lie in a plane normal to the z direction of the camera coordinate system. Using the sharpness of focus values, a depth of maximum focus zm along the z direction in the camera coordinate system is determined for each (x,y) location in the volume, and based on the depths of maximum focus zm, a three dimensional location of each point on the surface may be determined.

    Abstract translation: 一种方法包括用至少一个成像传感器对表面进行成像,其中表面和成像传感器处于相对平移运动。 成像传感器包括具有相对于表面坐标系的x-y平面非零角度对准的焦平面的透镜。 沿相机坐标系的z方向记录并堆叠表面的一系列图像以形成体积。 对于体积中的每个(x,y)位置确定焦点值的清晰度,其中(x,y)位置位于与摄像机坐标系的z方向垂直的平面中。 使用焦点值的清晰度,针对体积中的每个(x,y)位置确定摄像机坐标系中沿Z方向的最大焦点zm的深度,并且基于最大焦点zm的深度,三维位置 可以确定表面上的每个点。

Patent Agency Ranking