Abstract:
A method includes passing an interrogating light beam through a Fourier transform lens and onto the surface of a material to form a Fraunhofer diffraction pattern of one or more surface features of the material. An image of the diffraction pattern is processed to determine the dimensions of the feature.
Abstract:
A method includes imaging a surface with at least one imaging sensor, wherein the surface and the imaging sensor are in relative translational motion. The imaging sensor includes a lens having a focal plane aligned at a non-zero angle with respect to an x-y plane of a surface coordinate system. A sequence of images of the surface is registered and stacked along a z direction of a camera coordinate system to form a volume. A sharpness of focus value is determined for each (x,y) location in the volume, wherein the (x,y) locations lie in a plane normal to the z direction of the camera coordinate system. Using the sharpness of focus values, a depth of maximum focus zm along the z direction in the camera coordinate system is determined for each (x,y) location in the volume, and based on the depths of maximum focus zm, a three dimensional location of each point on the surface may be determined.
Abstract:
A method includes forming a two-dimensional interrogating beam on a selected sample region of a surface; collecting light transmitted through or reflected from the sample region with an array of lenses to form a sample array of focus spots; imaging the sample array of focus spots through an imaging lens on a sensor; and comparing an image of the sample array of focus spots to a reference array of focus spots to determine a level of non-uniformity in the sample region.