摘要:
A method is provided to optimize delay insertions for reducing timing violations. The method includes inserting a buffer between a driver and a receiver in a timing path and placing the buffer either inside or outside a bounding box that encloses the driver and the receiver. The placement of the buffer inside or outside the bounding box creates the appropriate effective loading on the buffer to generates the required minimum delay to avoid timing violations.
摘要:
A first user re-programmable interconnect architecture is provided wherein N switching elements are connected between selected interconnect conductors. The switching elements are controlled by M active storage elements, where M
摘要:
Apparatus for forcing a memory cell to a known state upon power-up includes circuitry for providing two signals PWRUP and PWRUPB which are used during chip power-up. At power-up, as V.sub.CC rises from 0 volt to 3.5 volts, the PWRUP signal follows V.sub.CC and the PWRUPB signal maintains 0 volts. The PWRUP and PWRUPB signals are used to drive the gates of P-Channel and N-Channel MOS transistors, respectively, including pass gates connected between word line driver circuits and bit line driver circuits driving the word lines and bit lines associated with the memory cells. In addition, the PWRUPB signal is used to drive P-Channel MOS pullup transistors connected between the word lines and V.sub.CC and the bit lines and V.sub.CC. During power-up, the pass gates are disabled, disconnecting the word lines and bit lines from their drivers. The word lines and bit lines are forced to follow the rise of V.sub.CC by the P-Channel pullup transistors. When V.sub.CC reaches its desired value, the PWRUP signal goes to 0 volts and the PWRUPB signal goes to V.sub.CC, thus turning on the pass gates to connect the word line and bit line driver circuits to the word lines and bit lines. The V.sub.CC final PWRUPB signal turns off the P-Channel MOS pullup transistors connected between the word lines and V.sub.CC and the bit lines and V.sub.CC.
摘要:
A method and apparatus for using full-chip thermal analysis of semiconductor chip designs to compute thermal conductivity is disclosed. One embodiment of a novel method for analyzing the conductivity of a semiconductor chip design that comprises a plurality of physical layers includes defining at least one thermal layer within the plurality of physical layers, where the thermal layer(s) represents a variance in thermal conductivity relative to a remainder of the semiconductor chip design, and computing a thermal conductivity of the thermal layer(s). As the thermal layer(s) represents variances in thermal conductivity over the semiconductor chip design, the thermal layer(s) does not necessarily correspond one-to-one to the physical layers of the semiconductor chip design. Thus, the thermal conductivities within the semiconductor chip design can be computed from the thermal layers.
摘要:
A method for optimal driver selection uses a cost function that is based on the non-linear delay characteristics and the stage gain of the candidate drivers. The cost function operates to select an optimal driver for driving the predetermined capacitive load which. simultaneously minimizes the delay and the amount of input capacitance introduced. In one embodiment, a method for selecting a driver for driving a load capacitance from a group of drivers includes: computing for each driver a cost based on a cost function associated with the driver, and selecting the driver having the smallest cost. The cost function is directly proportional to a delay of the driver and inversely proportional to the logarithm of a stage gain of the driver. In another embodiment, the stage gain is an output capacitance driven by the driver (the load capacitance) divided by an input capacitance of the driver.
摘要:
A method for optimal driver selection uses a cost function that is based on the non-linear delay characteristics and the stage gain of the candidate drivers. The cost function operates to select an optimal driver for driving the predetermined capacitive load which simultaneously minimizes the delay and the amount of input capacitance introduced. In one embodiment, a method for selecting a driver for driving a load capacitance from a group of drivers includes: computing for each driver a cost based on a cost function associated with the driver, and selecting the driver having the smallest cost. The cost function is directly proportional to a delay of the driver and inversely proportional to the logarithm of a stage gain of the driver. In another embodiment, the stage gain is an output capacitance driven by the driver (the load capacitance) divided by an input capacitance of the driver.
摘要:
A method for “match-delay” buffer insertion is provided to add delays at a node without changing the input capacitance of the node as seen by the upstream node. In one embodiment, a method for inserting a delay in a node in an electrical design associated with a logic gate includes: adding the delay at the node by adding a new logic gate before the node where the new logic gate is the same cell type as the logic gate and is positioned near the logic gate. The method may further include: determining if the delay can be added by adding a new logic gate before the node, and if a new logic gate cannot be added before the node, adding the delay by adding a new logic gate after the logic gate where a combination of the logic gate and the new logic gate giving the delay to be added.
摘要:
Apparatus for forcing a memory cell to a user-selected logic level upon power-up includes circuitry for providing two signals PWRUP and PWRUPB which are used during chip power-up. At power-up, as V.sub.CC rises from 0 volt to 3.5 volts, the PWRUP signal follows V.sub.CC and the PWRUPB signal maintains 0 volts. The PWRUP and PWRUPB signals are used to drive the gates of P-Channel and N-Channel MOS transistors, respectively, including pass gates connected between word line driver circuits and bit line driver circuits driving the word lines and bit lines associated with the memory cells. In addition, the PWRUPB signal is used to drive P-Channel MOS pullup transistors connected between the word lines and V.sub.CC and bit lines and V.sub.CC. During power-up, the pass gates are disabled, disconnecting the word lines and bit lines from their drivers. The word lines and bit lines are forced to follow the rise of V.sub.CC by the P-Channel pullup transistors. When V.sub.CC reaches its desired value, the PWRUP signal goes to 0 volts and the PWRUPB signal goes to V.sub.CC, thus turning on the pass gates to connect the word line and bit line driver circuits to the word lines and bit lines. The V.sub.CC final PWRUPB signal turns off the P-Channel MOS pullup transistors connected between the word lines and V.sub.CC and the bit lines and V.sub.CC.
摘要:
According to a first aspect of the present invention, a static random access memory cell according to the present invention includes two stages. The first stage has a first P-Channel MOS transistor with its source connected to a high-voltage supply rail, and its drain connected to the drain of a first N-Channel MOS transistor. The source of the first N-Channel MOS transistor is connected to the drain of a second N-Channel MOS transistor. The source of the second N-Channel MOS transistor is connected to a V.sub.SS power supply rail. The second stage has a second P-Channel MOS transistor with its source connected to the high-voltage supply rail V.sub.HS, and its drain connected to the drain of a third N-Channel MOS transistor. The source of the third N-Channel MOS transistor is connected to the drain of a fourth N-Channel MOS transistor. The source of the fourth N-Channel MOS transistor is connected to V.sub.SS. The gates of the first and second P-Channel MOS transistors are cross-coupled and the gates of the second and fourth N-Channel MOS transistors are cross-coupled. The gates of the first and third N-Channel MOS transistors are connected together to power supply rail V.sub.DD, usually 5 volts. The first and second P-Channel MOS transistors are formed in an n-well biased at a constant power supply voltage. In a preferred embodiment the constant power supply voltage may be V.sub.HS. A bit line coupled to the drain of the second N-Channel MOS transistor through a fifth N-Channel MOS transistor, having its gate connected to a word line.