公开(公告)号：US09025815B2

公开(公告)日：2015-05-05

申请号：US14332020

申请日：2014-07-15

Applicant: General Electric Company

Inventor： Xiaoye Wu ,  Jiang Hsieh ,  Paavana Sainath ,  Dan Xu ,  Yannan Jin ,  Girijesh Kumar Yadava ,  Adam Israel Cohen ,  Hewei Gao

IPC: G06K9/00 ,  A61B6/03 ,  G06T7/00 ,  G06T11/00 ,  A61B6/00

CPC classification number: A61B6/03 ,  G06T7/0012 ,  G06T11/008 ,  G06T2211/408

Abstract: A method is provided. The method includes acquiring projection data of an object from a plurality of pixels, reconstructing the acquired projection data from the plurality of pixels into a reconstructed image, performing material characterization and decomposition of an image volume of the reconstructed image to reduce a number of materials analyzed in the image volume to two basis materials. The method also includes generating a re-mapped image volume for at least one basis material of the two basis materials, and performing forward projection on at least the re-mapped image volume for the at least one basis material to produce a material-based projection. The method further includes generating multi-material corrected projections based on the material-based projection and a total projection attenuated by the object, which represents both of the two basis materials, wherein the multi-material corrected projections include linearized projections.

Abstract translation: 提供了一种方法。 该方法包括从多个像素获取对象的投影数据，将所获取的投影数据从多个像素重建成重建图像，对重建图像执行材料表征和分解，以减少分析的材料数量 在图像体积为两个基础材料。 所述方法还包括为所述两种基础材料的至少一种基础材料生成重新映射的图像体积，以及针对所述至少一种基础材料至少对所述重新映射的图像体积执行向前投影以产生基于材料的投影 。 该方法还包括基于基于材料的投影和由对象衰减的总投影来生成多材料校正投影，其表示两种基础材料，其中多材料校正投影包括线性化投影。

公开(公告)号：US20140133719A1

公开(公告)日：2014-05-15

申请号：US13677010

申请日：2012-11-14

Applicant: GENERAL ELECTRIC COMPANY

Inventor： Xiaoye Wu ,  Jiang Hsieh ,  Paavana Sainath ,  Dan Xu ,  Yannan Jin ,  Girijesh Kumar Yadava ,  Adam Israel Cohen ,  Hewei Gao

IPC: G06T7/00

CPC classification number: A61B6/03 ,  G06T7/0012 ,  G06T11/008 ,  G06T2211/408

Abstract: A method is provided. The method includes acquiring projection data of an object from a plurality of pixels, reconstructing the acquired projection data from the plurality of pixels into a reconstructed image, performing material characterization and decomposition of an image volume of the reconstructed image to reduce a number of materials analyzed in the image volume to two basis materials. The method also includes generating a re-mapped image volume for at least one basis material of the two basis materials, and performing forward projection on at least the re-mapped image volume for the at least one basis material to produce a material-based projection. The method further includes generating multi-material corrected projections based on the material-based projection and a total projection attenuated by the object, which represents both of the two basis materials, wherein the multi-material corrected projections include linearized projections.

公开(公告)号：US10595803B2

公开(公告)日：2020-03-24

申请号：US15263565

申请日：2016-09-13

Applicant: General Electric Company

Inventor： Xue Rui ,  Mingye Wu ,  Yannan Jin ,  Peter Michael Edic ,  Bruno Kristiaan Bernard De Man

IPC: A61B6/00 ,  A61B6/03

Abstract: A signal processing method is disclosed, which includes detecting a total intensity of X-rays passing through an object comprising multiple materials; obtaining at least one set of basis information of basis material information of the multiple materials and basis component information of photon-electric absorption basis component and Compton scattering basis component of the object; estimating a scatter intensity component of the detected X-rays based on the at least one set of basis information and the detected total intensity; and obtaining an intensity estimate of primary X-rays incident on a detector based on the detected total intensity and the estimated scatter intensity component. An imaging system adopting the above signal processing method is also disclosed.

公开(公告)号：US10222489B2

公开(公告)日：2019-03-05

申请号：US15457558

申请日：2017-03-13

Applicant: General Electric Company

Inventor： Geng Fu ,  Xue Rui ,  Yannan Jin ,  Jianjun Guo ,  Peter Michael Edic ,  Brian David Yanoff

IPC: G01T1/24 ,  G01T1/36 ,  G01T7/00

Abstract: The present approach relates to the use of reference pixels provided between the primary pixels of a detector panel. Coincidence circuitry or logic may be employed so that the measured signal arising from the same X-ray event may be properly, that is the signal measured at both a reference and primary pixel may be combined so as to provide an accurate estimate of the measured signal, at an appropriate location on the detector panel.

公开(公告)号：US20180328863A1

公开(公告)日：2018-11-15

申请号：US15591926

申请日：2017-05-10

Applicant: General Electric Company

Inventor： Xue Rui ,  Yannan Jin ,  Biju Jacob ,  Brian David Yanoff ,  Uwe Wiedmann

IPC: G01N23/04 ,  G21K1/02 ,  A61B6/03 ,  A61B6/00

CPC classification number: G01N23/046 ,  A61B6/032 ,  A61B6/4291 ,  G01T1/242 ,  G21K1/025

Abstract: The present approach relates to scatter correction of signals acquired using radiation detectors on a pixel-by-pixel basis. In certain implementations, the systems and methods disclosed herein facilitate scatter correction for signals generated using a detector having segmented detector elements, such as may be present in an energy-resolving, photon-counting CT imaging system.

公开(公告)号：US10117626B2

公开(公告)日：2018-11-06

申请号：US14868826

申请日：2015-09-29

Applicant: General Electric Company

Inventor： Geng Fu ,  Peter Michael Edic ,  Brian David Yanoff ,  Jianjun Guo ,  Vladimir A. Lobastov ,  Yannan Jin

IPC: A61B6/03 ,  A61B6/00

Abstract: Some embodiments are associated with an input signal comprising a first and a second photon event incident on a photon-counting semiconductor detector. A relatively slow charge collection shaping amplifier may receive the input signal and output an indication of a total amount of energy associated with the superposition of the first and second events. A relatively fast charge collection shaping amplifier may receive the input signal and output an indication that is used to allocate a first portion of the total amount of energy to the first event and a second portion of the total amount of energy to the second event.

公开(公告)号：US20160242712A1

公开(公告)日：2016-08-25

申请号：US15044787

申请日：2016-02-16

Applicant: GENERAL ELECTRIC COMPANY

Inventor： Yannan Jin ,  Bruno Kristiaan Bernard De Man ,  Peter Michael Edic ,  Paul Francis Fitzgerald ,  Xue Rui ,  Yangyang Yao ,  Zhye Yin ,  Uwe Wiedmann

IPC: A61B6/00 ,  A61B6/03

CPC classification number: A61B6/405 ,  A61B6/032 ,  A61B6/4233 ,  A61B6/488 ,  A61B6/5205 ,  A61B6/542

Abstract: An imaging method includes executing a low-dose preparatory scan to an object by applying tube voltages and tube currents in an x-ray source, and generating a first image of the object corresponding to the low-dose preparatory scan. The method further includes generating image quality estimates and dose estimates view by view at least based on the first image. The method includes optimizing the tube voltages and the tube currents to generate optimal profiles for the tube voltage and the tube current. At least one of the optimal profiles for the tube voltage and the tube current is generated based on the image quality estimates and the dose estimates. The method includes executing an acquisition scan by applying the tube voltages and the tube currents based on the optimal profiles and generating a second image of the object corresponding to the acquisition scan. An imaging system is also provided.

Abstract translation: 成像方法包括通过在x射线源中施加管电压和管电流来对对象执行低剂量预备扫描，以及生成对应于低剂量预备扫描的对象的第一图像。 该方法还包括至少基于第一图像通过视图生成图像质量估计和剂量估计视图。 该方法包括优化管电压和管电流以产生管电压和管电流的最佳轮廓。 基于图像质量估计和剂量估计，产生管电压和管电流的最佳曲线中的至少一个。 该方法包括通过基于最佳轮廓施加管电压和管电流来执行采集扫描，并且生成对应于采集扫描的对象的第二图像。 还提供了一种成像系统。

公开(公告)号：US09374565B2

公开(公告)日：2016-06-21

申请号：US14535017

申请日：2014-11-06

Applicant: GENERAL ELECTRIC COMPANY

Inventor： Hewei Gao ,  Girijesh Kumar Yadava ,  Adam Israel Cohen ,  Yannan Jin

IPC: G06K9/00 ,  H04N9/31 ,  G06T7/00 ,  G06T3/00 ,  G06T5/00

CPC classification number: H04N9/3185 ,  G06T5/001 ,  G06T11/005 ,  G06T11/008 ,  G06T2211/408

Abstract: A method includes acquiring projection data of an object from a plurality of detector elements, reconstructing the acquired projection data into a first reconstructed image, and performing material characterization of an image volume of the first reconstructed image to reduce a number of materials analyzed in the image volume to two basis materials. Performing material characterization includes utilizing a generalized modeling function to estimate a fraction of at least one basis material within each voxel of the image volume. The method also includes generating a re-mapped image volume for the at least one basis material of the two basis materials, performing forward projection on at least the re-mapped image volume for the at least one basis material to produce a material-based projection, and generating multi-material corrected projections based on the material-based projection and a total projection attenuated by the object, which represents both of the two basis materials.

Abstract translation: 一种方法包括从多个检测器元件获取物体的投影数据，将所获取的投影数据重建为第一重建图像，以及执行第一重建图像的图像体积的材料表征以减少图像中分析的材料数量 体积到两种基础材料。 执行材料表征包括利用广义建模功能来估计图像体积的每个体素内的至少一种基础材料的分数。 该方法还包括为两个基础材料的至少一个基础材料生成重新映射的图像体积，在至少一个基础材料的至少一个重新映射的图像体积上执行向前投影以产生基于材料的投影 并且基于基于材料的投影和由对象衰减的总投影来生成表示两种基础材料的多材料校正投影。

公开(公告)号：US09320481B2

公开(公告)日：2016-04-26

申请号：US14230774

申请日：2014-03-31

Applicant: GENERAL ELECTRIC COMPANY

Inventor： Vance Scott Robinson ,  Ertugrul Berkcan ,  Peter Michael Edic ,  Sergiy Zalyubovsky ,  Marco Francesco Aimi ,  Yizhen Lin ,  Yannan Jin ,  Robert Franklin Senzig

IPC: A61B6/00 ,  A61B6/03

CPC classification number: A61B6/4035 ,  A61B6/032 ,  A61B6/035 ,  A61B6/482 ,  G21K1/10

Abstract: X-ray imaging systems are provided that include an X-ray source and an X-ray detector. A filtering device is positioned between the X-ray source and the X-ray detector and includes one or more micro-filters each adapted to transition between an X-ray filtering position and an X-ray non-filtering position. A controller is programmed to control operation of the micro-filters.

Abstract translation: 提供包括X射线源和X射线检测器的X射线成像系统。 过滤装置位于X射线源和X射线检测器之间，并且包括一个或多个微滤器，每个微滤器适于在X射线滤波位置和X射线非滤波位置之间转换。 控制器被编程以控制微滤器的操作。

公开(公告)号：US09220469B2

公开(公告)日：2015-12-29

申请号：US14145018

申请日：2013-12-31

Applicant: General Electric Company

Inventor： Yannan Jin ,  Peter Michael Edic ,  Vladimir A. Lobastov ,  Hewei Gao ,  Geng Fu

IPC: A61B6/00 ,  A61B6/03

CPC classification number: A61B6/4241 ,  A61B6/032 ,  A61B6/482 ,  G01T1/171

Abstract: A system includes an energy-discriminating, photon-counting X-ray detector, comprising a plurality of detector cells adapted to produce projection data in response to X-ray photons and to produce an electrical signal having a recorded count for the energy bins and a total energy intensity. The system also includes data processing circuitry adapted to receive the electrical signal, to generate a simulated count rate for each of the energy bins by using the total energy intensity, to determine a set of energy intensity dependent material decomposition vectors, and, for the measured projection data, to perform material decomposition.

Abstract translation: 一种系统包括能量鉴别光子计数X射线检测器，其包括多个检测器单元，其适于响应于X射线光子产生投影数据并产生具有针对能量仓的记录计数的电信号，以及 总能量强度。 该系统还包括适于接收电信号的数据处理电路，通过使用总能量强度来产生每个能量箱的模拟计数率，以确定一组依赖于能量强度的材料分解向量，并且对于所测量的 投影数据，进行物质分解。