公开(公告)号：US20100039131A1

公开(公告)日：2010-02-18

申请号：US12534069

申请日：2009-07-31

Applicant: Steven Kasapi

Inventor： Steven Kasapi

IPC: G01R1/06

CPC classification number: G01R31/311 ,  G01R31/2851 ,  G01R31/308

Abstract: An apparatus for providing modulation mapping is disclosed. The apparatus includes a laser source, a motion mechanism providing relative motion between the laser beam and the DUT, signal collection mechanism, which include a photodetector and appropriate electronics for collecting modulated laser light reflected from the DUT, and a display mechanism for displaying a spatial modulation map which consists of the collected modulated laser light over a selected time period and a selected area of the IC.

Abstract translation: 公开了一种用于提供调制映射的设备。 该装置包括激光源，提供激光束和DUT之间的相对运动的运动机构，信号收集机构，其包括光电检测器和用于采集从DUT反射的调制激光的适当电子器件，以及显示机构，用于显示空间 调制图由选定时间段内收集的调制激光和IC的选定区域组成。

公开(公告)号：US07478345B2

公开(公告)日：2009-01-13

申请号：US11241609

申请日：2005-09-30

Applicant: Steven Kasapi

Inventor： Steven Kasapi

IPC: G06F17/50

CPC classification number: G01R31/31903 ,  G01R31/31937

Abstract: Systems and methods consistent with principles of the present invention allow contactless measurements of voltage characteristics of dynamic electrical signals in integrated circuits. The invention utilizes a signal analysis circuit, such as a voltage comparator, disposed with the circuit under test, which is optically coupled with the external timing measurement equipment. The signal analysis circuit changes its state depending on the characteristics of the measured electrical signal applied thereto. The changes in the condition of the signal analysis circuit are sensed by the external timing measurement equipment provided outside the circuit under test. To this end, the signal analysis circuit is optically coupled with the external measurement equipment registering specific changes in the condition of the signal analysis circuit. The information on the condition of the signal analysis circuit registered by the external measurement equipment is used to study the characteristics of the dynamic electrical signals within the circuit.

Abstract translation: 与本发明的原理一致的系统和方法允许对集成电路中的动态电信号的电压特性进行非接触式测量。 本发明利用与被测电路配置的信号分析电路，例如电压比较器，其与外部定时测量设备光耦合。 信号分析电路根据所施加的测量电信号的特性改变其状态。 信号分析电路状态的变化由设在被测电路外部的外部定时测量设备检测。 为此，信号分析电路与外部测量设备光学耦合，记录信号分析电路的状况的特定变化。 由外部测量设备登记的信号分析电路的状况信息用于研究电路内动态电信号的特性。

公开(公告)号：US07439730B2

公开(公告)日：2008-10-21

申请号：US11296888

申请日：2005-12-08

Applicant: Romain Desplats ,  Patricia Le Coupanec ,  William K. Lo ,  Philippe Perdu ,  Steven Kasapi

Inventor： Romain Desplats ,  Patricia Le Coupanec ,  William K. Lo ,  Philippe Perdu ,  Steven Kasapi

IPC: G01R31/28

CPC classification number: G01R31/2656 ,  G01R31/311

Abstract: A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.

Abstract translation: 用于分析光子发射数据以鉴别由晶体管发射的光子和由背景源发射的光子的系统，装置和方法。 该分析涉及光子发射的空间和/或时间相关性。 在相关之后，分析可进一步涉及获得相关光子由晶体管发射的可能性。 在相关之后，分析还可以进一步包括将权重分配给单个光子发射作为相关性的函数。 在一些情况下，重量反映了光子被晶体管发射的可能性。 该分析还可以包括自动识别光子发射图像中的晶体管。

公开(公告)号：US20060031036A1

公开(公告)日：2006-02-09

申请号：US11241609

申请日：2005-09-30

Applicant: Steven Kasapi

Inventor： Steven Kasapi

IPC: G01R31/00

CPC classification number: G01R31/31903 ,  G01R31/31937

Abstract: Systems and methods consistent with principles of the present invention allow contactless measurements of voltage characteristics of dynamic electrical signals in integrated circuits. The invention utilizes a signal analysis circuit, such as a voltage comparator, disposed with the circuit under test, which is optically coupled with the external timing measurement equipment. The signal analysis circuit changes its state depending on the characteristics of the measured electrical signal applied thereto. The changes in the condition of the signal analysis circuit are sensed by the external timing measurement equipment provided outside the circuit under test. To this end, the signal analysis circuit is optically coupled with the external measurement equipment registering specific changes in the condition of the signal analysis circuit. The information on the condition of the signal analysis circuit registered by the external measurement equipment is used to study the characteristics of the dynamic electrical signals within the circuit.

公开(公告)号：US06976234B2

公开(公告)日：2005-12-13

申请号：US10341721

申请日：2003-01-13

Applicant: Steven Kasapi

Inventor： Steven Kasapi

IPC: G01R31/319 ,  G01R31/3193 ,  G06F17/50

CPC classification number: G01R31/31903 ,  G01R31/31937

Abstract: Systems and methods consistent with principles of the present invention allow contactless measurements of voltage characteristics of dynamic electrical signals in integrated circuits. The invention utilizes a signal analysis circuit, such as a voltage comparator, disposed with the circuit under test, which is optically coupled with the external timing measurement equipment. The signal analysis circuit changes its state depending on the characteristics of the measured electrical signal applied thereto. The changes in the condition of the signal analysis circuit are sensed by the external timing measurement equipment provided outside the circuit under test. To this end, the signal analysis circuit is optically coupled with the external measurement equipment registering specific changes in the condition of the signal analysis circuit. The information on the condition of the signal analysis circuit registered by the external measurement equipment is used to study the characteristics of the dynamic electrical signals within the circuit.

Abstract translation: 与本发明的原理一致的系统和方法允许对集成电路中的动态电信号的电压特性进行非接触式测量。 本发明利用与被测电路配置的信号分析电路，例如电压比较器，其与外部定时测量设备光耦合。 信号分析电路根据所施加的测量电信号的特性改变其状态。 信号分析电路状态的变化由设在被测电路外部的外部定时测量设备检测。 为此，信号分析电路与外部测量设备光学耦合，记录信号分析电路的状况的特定变化。 由外部测量设备登记的信号分析电路的状况信息用于研究电路内动态电信号的特性。

公开(公告)号：US20050146321A1

公开(公告)日：2005-07-07

申请号：US11040333

申请日：2005-01-20

Applicant: Romain Desplats ,  Patricia Le Coupanec ,  William Lo ,  Philippe Perdu ,  Steven Kasapi

Inventor： Romain Desplats ,  Patricia Le Coupanec ,  William Lo ,  Philippe Perdu ,  Steven Kasapi

IPC: G01R31/311 ,  G01R1/00

CPC classification number: G01R31/2656 ,  G01R31/311

Abstract: A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.

公开(公告)号：US07733100B2

公开(公告)日：2010-06-08

申请号：US11438121

申请日：2006-05-18

Applicant: Steven Kasapi

Inventor： Steven Kasapi

IPC: G01R31/302

CPC classification number: G01R31/311 ,  G01R31/2851 ,  G01R31/308

Abstract: An apparatus for providing modulation mapping is disclosed. The apparatus includes a laser source, a motion mechanism providing relative motion between the laser beam and the DUT, signal collection mechanism, which include a photodetector and appropriate electronics for collecting modulated laser light reflected from the DUT, and a display mechanism for displaying a spatial modulation map which consists of the collected modulated laser light over a selected time period and a selected area of the IC.

Abstract translation: 公开了一种用于提供调制映射的设备。 该装置包括激光源，提供激光束和DUT之间的相对运动的运动机构，信号收集机构，其包括光电检测器和用于采集从DUT反射的调制激光的适当电子器件，以及显示机构，用于显示空间 调制图由选定时间段内收集的调制激光和IC的选定区域组成。

公开(公告)号：US07679358B2

公开(公告)日：2010-03-16

申请号：US11697205

申请日：2007-04-05

Applicant: Steven Kasapi ,  Gary Leonard Woods

Inventor： Steven Kasapi ,  Gary Leonard Woods

IPC: G01R31/16

CPC classification number: G01R29/26 ,  G01R31/2882 ,  G01R31/311 ,  G01R31/31709 ,  G01R31/31725

Abstract: Time-resolved emission can be used to measure loop-synchronous, small-signal voltage perturbation in integrated circuits. In this technique the measurements are completely non-invasive and so reflect the true device behavior. The time-dependant propagation delay caused by Vdd modulation also shows the expected qualitative signature. This technique should find applications in circuits with relatively fast clock-like circuits where loop-synchronous voltage pickup is limiting circuit behavior.

Abstract translation: 时间分辨发射可用于测量集成电路中的环路同步，小信号电压扰动。 在这种技术中，测量是完全非侵入性的，因此反映了真正的器件行为。 由Vdd调制引起的时间依赖传播延迟也显示了预期的定性特征。 这种技术应该在具有相对较快时钟的电路的电路中找到应用，其中环路同步电压拾取是限制电路行为的。

公开(公告)号：US20070236206A1

公开(公告)日：2007-10-11

申请号：US11697205

申请日：2007-04-05

Applicant: Steven Kasapi ,  Gary Leonard Woods

Inventor： Steven Kasapi ,  Gary Leonard Woods

IPC: G01R23/16

CPC classification number: G01R29/26 ,  G01R31/2882 ,  G01R31/311 ,  G01R31/31709 ,  G01R31/31725

Abstract: Time-resolved emission can be used to measure loop-synchronous, small-signal voltage perturbation in integrated circuits. In this technique the measurements are completely non-invasive and so reflect the true device behavior. The time-dependant propagation delay caused by Vdd modulation also shows the expected qualitative signature. This technique should find applications in circuits with relatively fast clock-like circuits where loop-synchronous voltage pickup is limiting circuit behavior.

Abstract translation: 时间分辨发射可用于测量集成电路中的环路同步，小信号电压扰动。 在这种技术中，测量是完全非侵入性的，因此反映了真正的器件行为。 由Vdd调制引起的时间依赖传播延迟也显示了预期的定性特征。 这种技术应该在具有相对较快时钟的电路的电路中找到应用，其中环路同步电压拾取是限制电路行为的。

公开(公告)号：US20070046301A1

公开(公告)日：2007-03-01

申请号：US11438121

申请日：2006-05-18

Applicant: Steven Kasapi

Inventor： Steven Kasapi

IPC: G01R31/305

CPC classification number: G01R31/311 ,  G01R31/2851 ,  G01R31/308

Abstract: An apparatus for providing modulation mapping is disclosed. The apparatus includes a laser source, a motion mechanism providing relative motion between the laser beam and the DUT, signal collection mechanism, which include a photodetector and appropriate electronics for collecting modulated laser light reflected from the DUT, and a display mechanism for displaying a spatial modulation map which consists of the collected modulated laser light over a selected time period and a selected area of the IC.

Abstract translation: 公开了一种用于提供调制映射的设备。 该装置包括激光源，提供激光束和DUT之间的相对运动的运动机构，信号收集机构，其包括光电检测器和用于采集从DUT反射的调制激光的适当电子器件，以及显示机构，用于显示空间 调制图由选定时间段内收集的调制激光和IC的选定区域组成。