-
公开(公告)号:US20190115062A1
公开(公告)日:2019-04-18
申请号:US16218787
申请日:2018-12-13
Applicant: Micron Technology, Inc.
Inventor: Sai Krishna Mylavarapu
IPC: G11C11/401
CPC classification number: G11C11/401 , G06F12/0246 , G11C16/34
Abstract: The present disclosure includes apparatuses and methods related to refresh in memory. An example apparatus can refresh a memory cell of an array of memory cells in response to the array of memory cells being accessed a threshold number of accesses.
-
公开(公告)号:US20250149108A1
公开(公告)日:2025-05-08
申请号:US18775981
申请日:2024-07-17
Applicant: Micron Technology, Inc.
Inventor: Sai Krishna Mylavarapu , Shivasankar Gunasekaran , Ameen D. Akel , Brent Keeth , Lance P. Johnson , Amy Rae Griffin
Abstract: Methods, systems, and devices for sparing techniques in stacked memory architectures are described. A memory system may implement a stacked memory architecture that includes a set of array dies stacked along a direction and a logic die coupled with the set of array dies. Each array die may include one or more memory arrays accessible using one or more first interface blocks of the array die. To support sparing, the memory system may remap access from one or more first memory arrays of the set of array dies to one or more second memory arrays of the set of array dies. Logic circuitry of the logic die may be operable to perform the remapping in accordance with one or more levels of granularity, such as at a die level, channel level, pseudo-channel level, bank level, or a combination thereof.
-
公开(公告)号:US20250077353A1
公开(公告)日:2025-03-06
申请号:US18762284
申请日:2024-07-02
Applicant: Micron Technology, Inc.
Inventor: Brent Keeth , Ameen D. Akel , Shivasankar Gunasekaran , Sai Krishna Mylavarapu
IPC: G06F11/10
Abstract: Methods, systems, and devices for data protection techniques in stacked memory architectures are described. A memory system having a stacked memory architecture may include error correction information associated with a data set that includes multiple data segments stored across multiple memory arrays and, in some examples, multiple dies of the memory system. As part of a write operation for a first data segment of a data set, the memory system may retrieve the remaining data segments of the data set and calculate error correction information using the first data segment and the remaining data segments. As part of a read operation for a second data segment of the data set, the memory system may retrieve each data segment of the data set and perform an error correction operation on the data set using the error correction information.
-
公开(公告)号:US12061518B2
公开(公告)日:2024-08-13
申请号:US18108876
申请日:2023-02-13
Applicant: Micron Technology, Inc.
Inventor: Sai Krishna Mylavarapu , Todd A. Marquart
IPC: G06F11/10 , G11C11/00 , G11C11/4074 , G11C11/4096
CPC classification number: G06F11/1004 , G06F11/1068 , G11C11/005 , G11C11/4074 , G11C11/4096
Abstract: Methods, devices, and systems related to storing parity data in dynamic random access memory (DRAM) are described. In an example, a method can include generating, at a controller, parity data based on user data queued for writing to a non-volatile memory device, receiving the parity data at a DRAM device from the controller and writing the parity data to the DRAM device, receiving the user data at a non-volatile memory device from the controller and writing the user data to the non-volatile memory device, reading the user data from the non-volatile memory device via the controller, and receiving the parity data at the controller from the DRAM device.
-
公开(公告)号:US20240248781A1
公开(公告)日:2024-07-25
申请号:US18391371
申请日:2023-12-20
Applicant: Micron Technology, Inc.
Inventor: Sai Krishna Mylavarapu
IPC: G06F11/07
CPC classification number: G06F11/0787 , G06F11/0727
Abstract: Methods, systems, and devices for error tracking by a memory system are described. A memory system transmit indications of corrupt data without storing (e.g., internally storing) the indication. In some examples, a memory system may read data (e.g., from an associated memory device) and detect an error in the data. The memory system may generate an indication of the error and may transmit the indication to a host device. In other examples, a host device may transmit corrupted data with an indication of such. The memory system may store the corrupt data (e.g., an inverted version of the corrupt data) and, upon receiving a subsequent read command, may transmit the corrupt data to the host system with an indication that the data is corrupt.
-
公开(公告)号:US20220261184A1
公开(公告)日:2022-08-18
申请号:US17177802
申请日:2021-02-17
Applicant: Micron Technology, Inc.
Inventor: Sai Krishna Mylavarapu
IPC: G06F3/06
Abstract: Various embodiments described herein provide for performing inversion refresh of a physical memory location of a memory device (e.g., memory cell on a negative-and (NAND)-type memory device) based on a state of the physical memory location. For some embodiments, the inversion refresh is performed as part of performing garbage collection or reclamation of physical memory locations of a memory device.
-
公开(公告)号:US20190354429A1
公开(公告)日:2019-11-21
申请号:US15983647
申请日:2018-05-18
Applicant: Micron Technology, Inc.
Inventor: Samuel E. Bradshaw , Justin Eno , Sean Stephen Eilert , Sai Krishna Mylavarapu
Abstract: Exemplary methods, apparatuses, and systems include a memory controller receiving a user payload to be written to a memory. The memory controller determines a plurality of locations within the memory within which the user payload will be written. After detecting the destination of the user payload, the memory controller detects, within a data structure, the presence of an identifier of a first location within a user data portion of the plurality of locations. The memory controller writes the user payload to the user data portion of the plurality of locations and, in response to detecting the presence of the identifier in the data structure, writes a copy of one or more bits in the user payload written to the first location to a spare data portion of the plurality of locations.
-
公开(公告)号:US10176860B1
公开(公告)日:2019-01-08
申请号:US15688945
申请日:2017-08-29
Applicant: Micron Technology, Inc.
Inventor: Sai Krishna Mylavarapu
IPC: G11C7/00 , G11C11/401 , G06F12/02
Abstract: The present disclosure includes apparatuses and methods related to refresh in memory. An example apparatus can refresh a memory cell of an array of memory cells in response to the array of memory cells being accessed a threshold number of accesses.
-
-
-
-
-
-
-