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公开(公告)号:US07482823B2
公开(公告)日:2009-01-27
申请号:US11977282
申请日:2007-10-24
申请人: K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
发明人: K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
IPC分类号: G01R31/02
CPC分类号: G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
摘要: A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and the probe tip.
摘要翻译: 用于测量高频下的集成电路或其他微电子器件的电特性的探针可以包括支持互连测试仪器的信号路径的电介质衬底以及屏蔽信号路径和探针尖端的探针尖端和接地路径。
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公开(公告)号:US07453276B2
公开(公告)日:2008-11-18
申请号:US11901626
申请日:2007-09-18
申请人: Leonard Hayden , Scott Rumbaugh , Mike Andrews
发明人: Leonard Hayden , Scott Rumbaugh , Mike Andrews
IPC分类号: G01R31/02
CPC分类号: G01R1/06766 , G01R1/06738 , G01R1/06772
摘要: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.
摘要翻译: 直流电流和调制信号同时施加到被测器件(例如激光二极管)上的接触焊盘,探头通过传输调制信号通过阻抗匹配电阻器和直接传输来降低信号失真和功耗 电流超过阻抗匹配电阻的第二信号通路。
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公开(公告)号:US07417446B2
公开(公告)日:2008-08-26
申请号:US11975937
申请日:2007-10-22
申请人: Leonard Hayden , Scott Rumbaugh , Mike Andrews
发明人: Leonard Hayden , Scott Rumbaugh , Mike Andrews
IPC分类号: G01R31/02
CPC分类号: G01R1/06766 , G01R1/06738 , G01R1/06772
摘要: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.
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公开(公告)号:US07352258B2
公开(公告)日:2008-04-01
申请号:US10283632
申请日:2002-10-29
申请人: Mike Andrews , Leonard Hayden , John Martin
发明人: Mike Andrews , Leonard Hayden , John Martin
IPC分类号: H01P5/103
CPC分类号: H01P5/103
摘要: A probe assembly including a probe, a waveguide to transmission path transition, and a bias tee detachably connected to the probe.
摘要翻译: 包括探针,波导到传输路径转换的探针组件和可拆卸地连接到探针的偏置三通。
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公开(公告)号:US20080042671A1
公开(公告)日:2008-02-21
申请号:US11975471
申请日:2007-10-19
申请人: K. Gleason , Tim Lesher , Mike Andrews , John Martin
发明人: K. Gleason , Tim Lesher , Mike Andrews , John Martin
CPC分类号: G01R1/07342 , G01R1/06738 , G01R1/06772
摘要: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
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公开(公告)号:US07271603B2
公开(公告)日:2007-09-18
申请号:US11391895
申请日:2006-03-28
申请人: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
发明人: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
IPC分类号: G01R31/02
CPC分类号: G01R1/07342 , G01R1/06738 , G01R1/06772
摘要: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe measurement system preferably includes a probe having a conductive path extending between the first and second surfaces of a membrane and a probe contact electrically connected to the conductive path.
摘要翻译: 用于测量高频集成电路或其他微电子器件的电气特性的探针测量系统。 探针测量系统优选地包括具有在膜的第一和第二表面之间延伸的导电路径的探针和电连接到导电路径的探针接触。
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公开(公告)号:US07233160B2
公开(公告)日:2007-06-19
申请号:US09997501
申请日:2001-11-19
申请人: Leonard Hayden , John Martin , Mike Andrews
发明人: Leonard Hayden , John Martin , Mike Andrews
IPC分类号: G01R1/073
CPC分类号: G01R1/06772 , G01R1/07342 , Y10T29/49121 , Y10T29/49147 , Y10T29/49204 , Y10T29/49208
摘要: The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.
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公开(公告)号:US20050287914A1
公开(公告)日:2005-12-29
申请号:US11040065
申请日:2005-01-21
申请人: David Sheltman , Joe Pohlman , Michael Finizza , Mark Mayer , Mike Andrews , Nelson Tam
发明人: David Sheltman , Joe Pohlman , Michael Finizza , Mark Mayer , Mike Andrews , Nelson Tam
CPC分类号: A63H18/021
摘要: A toy vehicle trackset including a closed trackway, a toy vehicle and a booster for accelerating the toy vehicle traveling the trackway. Within the trackway, a portion of the toy vehicle travel path includes a flexible multi-apertured panel held by a support structure.
摘要翻译: 一种玩具车轨道装置,包括封闭的道路,玩具车辆和用于加速玩具车行进轨道的助推器。 在轨道内,玩具车行驶路径的一部分包括由支撑结构保持的柔性多孔面板。
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公开(公告)号:US20050191938A1
公开(公告)日:2005-09-01
申请号:US11041030
申请日:2005-01-21
申请人: David Sheltman , Joe Pohlman , Michael Finizza , Mark Mayer , Mike Andrews , Nelson Tam
发明人: David Sheltman , Joe Pohlman , Michael Finizza , Mark Mayer , Mike Andrews , Nelson Tam
CPC分类号: A63H17/24 , A63H18/026 , A63H18/028 , A63H18/04
摘要: A toy vehicle launcher and supporting clamp are used in providing a gravity driven toy vehicle trackset. The clamp utilizes a ratcheting attachment member which facilitates the rapid sizing or adjustment for size for attachment to a table edge or the like. The launcher and clamp further provides a toy vehicle launcher having a trigger release for gravity driven launch of a toy vehicle down a coupled track segment. The angle of the toy vehicle launcher is adjustable to facilitate changes in launch angle and thereby changes in the amount of energy imparted to the toy vehicle.
摘要翻译: 玩具车辆发射器和支撑夹具用于提供重力驱动的玩具车道。 夹具使用棘轮附接构件,其有助于尺寸的快速调整或调整以附接到桌子边缘等。 发射器和夹具进一步提供了具有触发释放装置的玩具车辆发射器,用于重力驱动发动玩具车辆沿着耦合的轨道段。 玩具车辆发射器的角度是可调节的,以促进发射角度的改变,从而改变施加到玩具车辆的能量的量。
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公开(公告)号:US06815963B2
公开(公告)日:2004-11-09
申请号:US10445099
申请日:2003-05-23
申请人: K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
发明人: K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
IPC分类号: G01R3100
CPC分类号: G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
摘要: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
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