摘要:
An example contact head includes coaxial contacts configured for transmission of radio frequency (RF) signals or digital signals between a test system and a device under test (DUT). Each of the coaxial contacts is configured to target a specific impedance. Each of the coaxial contacts includes a coaxial structure having an open-curve shape. The coaxial structure includes a spring material that bends in response to applied force and that returns to the open-curve shape absent the applied force. The coaxial structure includes a center conductor terminating in a contact pin and a return conductor separated by a dielectric from the center conductor. At least part of the center conductor and the return conductor include an electrically-conductive material. Flexible contacts on the coaxial contact include the electrically-conductive material.
摘要:
The invention relates to a system comprising a probe and a measuring device, wherein the probe is connected to an input of the measuring device, and wherein an analog-digital converter is connected downstream of the input of the measuring device. The probe provides an analog-digital converter for the generation of a value-discrete and/or time-discrete signal from an analog input signal, wherein the value-discrete and/or time-discrete signal is supplied to the analog-digital converter of the measuring device. The invention further relates to a method for the registration of an analog signal by means of a system comprising a probe and a measuring device.
摘要:
An interrogator plug for interfacing with the output socket of a pulsed power system to provide external leads engagable by a volt measurement device. The interrogator plug is sized to replicate a conventional plug such that the interrogator plug can be inserted into the output plug. The interrogator plug has lead assemblies positioned to engage the contacts of the output socket ordinarily engaged by conventional plugs. The interrogator plug can also include a divider circuit linked to a coaxial output for providing a reduced voltage current having an operational voltage safely measurable by conventional voltmeters.
摘要:
A high voltage phasing voltmeter comprises first and second probes. Each probe comprises an electrode for contacting a high voltage electrical conductor. The electrodes are connected in series with a resistor. A meter comprises a housing enclosing an electrical circuit for measuring true rms voltage. The electrical circuit comprises an input circuit for connection to the first and second probes and developing a scaled voltage representing measured voltage across the electrodes. A converter circuit converts the scaled voltage to a DC signal representing true rms value of the measured voltage. A peak hold circuit is connected to the converter circuit to hold a peak value of the true rms value. A display is connected to the peak hold circuit for displaying the peak value of the true rms value.
摘要:
An inspection apparatus for inspecting high voltage insulators is disclosed. The inspection apparatus includes a first platform having first and second linkages, at least one outer gripping mechanism having first and second arms extending outwardly from the first platform, a second slidable platform adapted to slide along the first and second linkages, and at least one inner gripping mechanism having third and fourth arms extending outwardly from the second slidable platform. The outer and inner gripping mechanisms are adapted to move between an open position where the insulator is received by the outer and inner gripping mechanisms and a closed position where the outer and inner gripping mechanisms engage the insulator.
摘要:
A test apparatus that test a device under test, comprising a test head that is arranged facing the device under test and that includes a test module for testing the device under test, and a probe assembly that transmits a signal and that is arranged between the test head and the device under test. The probe assembly includes a plurality of low voltage pins arranged at prescribed intervals from each other, and a plurality of high voltage pins that are arranged such that distance between each high voltage pin and each low voltage pin is greater than the prescribed interval, and that transmit a signal with a higher voltage than a signal transmitted by the low voltage pins. All of the high voltage pins are arranged in only one of two regions formed by dividing a surface of the probe assembly in half.
摘要:
A high voltage phasing voltmeter comprises first and second probes. Each probe comprises an insulated handheld shield supporting an electrode for contacting a high voltage electrical conductor. The electrode is connected in series with a resistor and a capacitor. A meter comprises a housing enclosing an electrical circuit for measuring phasing voltage. The electrical circuit comprises an input circuit for connection to the first and second probes and an amplifier connected between the input circuit and a display. The amplifier measures voltage across the electrodes to provide an indication on the display.
摘要:
The invention relates to a device, a probe, and a method for the galvanically decoupling transmission of a measuring signal. A microwave signal is supplied by a transceiver (1) to a sensor (3) by means of a galvanically decoupled waveguide (2). The signal is partially reflected in the sensor (3), the amplitude, phase and/or polarization of the reflected microwave signal containing the information relating to the measuring value. The reflected microwave signal runs through the same waveguide (2) back to the transceiver (1) and is evaluated therein. The invention provides a more simple and economical structure than conventional devices of prior art, as a voltage supply is not required especially on the sensor side as a result of the reflection. In this way, the sensor (3) can also be produced in a very compact manner, minimizing the influence of the measuring signal through the sensor (3).
摘要:
A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
摘要:
A probe measurement system having low, stable contact resistance for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.