Abstract:
The present invention is directed to methods for verifying adequate synchronisation of signals that cross clock environments. According to one exemplary method, a circuit under design includes a plurality of functional elements and a plurality of clock environments, and has one or more signals passing from one clock environment to another therein. The method includes the steps of (i) modelling at least one of the functional elements to have an unknown state as an output for a predetermined time after a timing event of a clock signal, (ii) simulating the circuit, and (iii) determining which functional element is a synchroniser to thereby identify if there is a synchronisation problem for a signal passing from one clock environment to another.
Abstract:
Disclosed is a method and apparatus for stacking dice including multi-chip packaging with additional non stacked dice. The stacked dice have at least one electrical connection located on a single surface and oriented in the same direction when stacked. These dice are stacked, offset and coupled electrically. In an embodiment, the stacked dice have a buffer function, such as an SDRAM device, and are included in a multi-chip package (MCP) with an additional die including a channel function and a controller function thereon. The dice are packaged in a single package for placement on a printed circuit board for use in a storage device such as a disc drive.
Abstract:
An integrated circuit comprising: at least one test input for receiving test data; test control circuitry between the at least one test input and circuitry to be tested; wherein the test data is clocked in on a rising clock edge and a falling clock edge.
Abstract:
A single chip integrated circuit device includes a breakpoint range unit having first and second breakpoint registers for holding respectively lower and upper breakpoint addresses between which normal operation of the CPU is to be interrupted for diagnostic purposes. The breakpoint range unit further has comparison logic operative to compare the contents of the address register with each of a lower and upper breakpoint address, and to issue a breakpoint signal when the address held in an address register is equal to the lower breakpoint address or between the lower and upper breakup addresses. On chip control logic is connected to receive the breakpoint signal and arranged to interrupt normal operation of the CPU when the breakpoint signal is received. The comparison logic includes inverse state logic configured to set an inverse state indicator to cause generation of the breakpoint signal outside the address range defined by the upper and lower breakpoint address.
Abstract:
An on-chip breakpoint unit of an integrated circuit device is connected to receive the contents of an instruction pointer register via an address communication path. The breakpoint unit has a breakpoint register configured to hold a breakpoint address at which the normal operation of the CPU is to be interrupted for diagnostic purposes, and a comparator circuit operative to compare the breakpoint address with the contents of the instruction pointer register and to issue a breakpoint signal on a breakpoint signal path when there is a match. The on-chip breakpoint unit also has circuitry configured to inhibit generation of the breakpoint signal for a next instruction to be executed upon resumption of normal operation of the CPU after it has been interrupted.
Abstract:
A method of effecting communication in a computer system between off-chip circuitry and on-chip circuitry is disclosed, according to a message protocol in which four messages can be formulated: a data write request; a data read request; a response message; and a diagnostic message.
Abstract:
A tool for removing an interchangeable cooking insert from a grill has a handle end and an engagement end. A handle extends from the handle end toward the engagement end. A support arm extends from the handle toward the engagement end. The support arm has a first lateral edge defining a first lifting hook and a second lateral edge defining a second lifting hook. The first lifting hook and second lifting hook are configured to engage a portion of the cooking insert. A support pin extends across the support arm between the first lateral edge and the second lateral edge. A latch member is pivotally coupled to one of the support arm and the handle. The latch member includes a first end selectively engageable with a portion of the cooking insert and a second end extending through the handle for actuation of the latching member by a user.
Abstract:
A micro electro-mechanical sensor is provided. The micro electro-mechanical sensor includes a substrate, and a conducting plane disposed on the substrate. A conducting via is disposed on the substrate, such as adjacent to the conducting plane. A plurality of ribbon conductors are disposed over the conducting plane and electrically connected to the conducting via, such that the plurality of ribbon conductors form a transducer array in combination with the conducting plane, such as through capacitive coupling that changes in response to changes in the physical shape of the plurality of ribbons.
Abstract:
Plugging a side pocket mandrel using a swelling plug. A system for plugging a port in a side pocket of a mandrel in a subterranean well includes a plugging device installed in the side pocket of the mandrel, the plugging device including a swellable seal material, whereby the seal material swells at least after installation of the plugging device in the side pocket to thereby prevent fluid transfer through the port. A method of plugging a port in a side pocket of a mandrel in a subterranean well includes the steps of: providing the plugging device with a swellable seal material; installing the plugging device in the side pocket; and the seal material swelling in the side pocket, thereby preventing fluid transfer through the port.
Abstract:
An integrated circuit comprising (i) a plurality of portions, each portion including test control circuitry; and (ii) at least one test input arranged to receive test signals, the circuit having a test mode in which one or more of the plurality of portions are testable, wherein the circuit has a reset mode which has priority over the test mode.