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公开(公告)号:US11600474B2
公开(公告)日:2023-03-07
申请号:US16913526
申请日:2020-06-26
Applicant: Tokyo Electron Limited
Inventor: Barton Lane , Merritt Funk , Yohei Yamazawa , Justin Moses , Chelsea Dubose , Michael Hummel
Abstract: A radio frequency (RF) system includes a RF power source configured to power a load with an RF signal; an RF pipe including an inner conductor and an outer conductor connected to ground coupling the RF power source to the load; and a current sensor aligned to a central axis of the RF pipe carrying the RF signal. A sensor casing is disposed around the RF pipe, where the sensor casing includes a conductive material connected to the outer conductor of the RF pipe. A gallery is disposed within the sensor casing and outside the outer conductor of the RF pipe, where the current sensor is disposed in the gallery. A slit in the outer conductor of the RF pipe exposes the current sensor to a magnetic field due to the current of the RF signal in the inner conductor of the RF pipe.
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公开(公告)号:US20210407770A1
公开(公告)日:2021-12-30
申请号:US16913545
申请日:2020-06-26
Applicant: Tokyo Electron Limited
Inventor: Justin Moses , Barton Lane , Merritt Funk , Chelsea Dubose , Yohei Yamazawa , Michael Hummel
Abstract: A radio frequency sensor assembly includes a sensor casing disposed around a central hole, the sensor casing including a first conductive cover and a second conductive cover. The assembly includes a cavity disposed around the central hole and includes a dielectric material, the cavity being bounded by a first major outer surface and a second major outer surface along a radial direction from a center of the central hole, where the first conductive cover is electrically coupled to the second conductive cover through a coupling region beyond the second major outer surface of the cavity, and electrically insulated from the second conductive cover by the cavity and the central hole. The assembly includes a current sensor electrically insulated from the sensor casing and including a current pickup disposed symmetrically around the central hole, the current pickup being disposed within the cavity and being insulated from the sensor casing.
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公开(公告)号:US10510512B2
公开(公告)日:2019-12-17
申请号:US15880435
申请日:2018-01-25
Applicant: Tokyo Electron Limited
Inventor: Merritt Funk , Megan Doppel , Kazuki Moyama , Chelsea DuBose , Justin Moses
IPC: H01J37/32 , H01L21/3065
Abstract: Embodiments of method and system for controlling plasma performance are described. In an embodiment a method may include supplying power at a first set of power parameters to a plasma chamber. Additionally, the method may include forming plasma within the plasma chamber using the first set of power parameters. The method may also include measuring power coupling to the plasma at the first set of power parameters. Also, the method may include supplying power at a second set of power parameters to the plasma chamber. The method may additionally include measuring power coupling to the plasma at the second set of power parameters to the plasma. The method may also include adjusting the first set of power parameters based, at least in part, on the measuring of the power coupling at the second set of power parameters.
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