Burn-in apparatus
    21.
    发明授权
    Burn-in apparatus 有权
    老化装置

    公开(公告)号:US07498830B2

    公开(公告)日:2009-03-03

    申请号:US11195004

    申请日:2005-08-01

    CPC classification number: G05D23/1919 H01L2924/0002 H01L2924/00

    Abstract: The burn-in apparatus includes a water supply system and a sprayer and has a structure such that water is converted into mist and sprayed onto the upper surface of a device attached to a socket of a burn-in board. The amount of heat generated by the device that generates high heat is removed by the amount of heat that includes a large latent heat from when the mist falls on the upper surface and is evaporated. Burn-in of the device is conducted while it is being cooled to the target temperature.

    Abstract translation: 该老化装置包括供水系统和喷雾器,并且具有将水转化成雾并喷洒在附着于老化板插座的装置的上表面上的结构。 产生高热量的装置产生的热量通过从雾落在上表面上而蒸发的包括大的潜热的热量除去。 在冷却到目标温度的同时进行设备的老化。

    ENVIRONMENTAL TEST APPARATUS
    23.
    发明申请
    ENVIRONMENTAL TEST APPARATUS 有权
    环境试验装置

    公开(公告)号:US20080141794A1

    公开(公告)日:2008-06-19

    申请号:US11955158

    申请日:2007-12-12

    CPC classification number: G01N17/002 G01N25/68

    Abstract: A second tank for accommodating a sample is disposed within a first tank. A heater for heating gas is provided inside the second tank. A heater controller controls the heater such that temperature of gas becomes a set temperature. A guide portion which guides condensed dew such that the condensed dew can flow downward and reach the outer surface of the second tank is provided on the inner surface of the first tank.

    Abstract translation: 用于容纳样品的第二罐设置在第一罐内。 在第二罐内部设置用于加热气体的加热器。 加热器控制器控制加热器,使得气体的温度成为设定温度。 引导部分,其引导凝结的露水,使得冷凝的露水可以向下流动并到达第二罐的外表面,设置在第一罐的内表面上。

    IC socket
    24.
    发明授权
    IC socket 有权
    IC插座

    公开(公告)号:US07311528B2

    公开(公告)日:2007-12-25

    申请号:US11406385

    申请日:2006-04-19

    Applicant: Hirotaka Jiten

    Inventor: Hirotaka Jiten

    CPC classification number: H01R13/2421 H01R2201/20

    Abstract: An IC socket comprises a plurality of conductive connecting sections each having a holding section for holding one of a plurality of lead terminals of an IC; and a plurality of conductive coil springs, which are protruded from the IC socket and respectively fixed to the conductive connecting sections, the conductive springs being closer to a circuit board than the conductive connecting sections.

    Abstract translation: IC插座包括多个导电连接部分,每个导电连接部分具有用于保持IC的多个引线端子之一的保持部分; 以及多个导电螺旋弹簧,其从IC插座突出并分别固定到导电连接部分,导电弹簧比导电连接部分更靠近电路板。

    Burn-in substrate for semiconductor devices
    25.
    发明授权
    Burn-in substrate for semiconductor devices 有权
    半导体器件的老化基板

    公开(公告)号:US07199598B2

    公开(公告)日:2007-04-03

    申请号:US10975015

    申请日:2004-10-28

    Applicant: Kenichi Ol

    Inventor: Kenichi Ol

    CPC classification number: G01R31/2863 G01R31/2879 G01R31/2886

    Abstract: Input and output of small-current signals between a mother board and semiconductor devices subjected to a burn-in test are made via a device driving unit. Large-current main power is supplied via the device driving unit through bus bars without passing through the mother board. In this way, the risk of burn-out in a burn-in substrate and burn-in sockets, and damages caused by a burn-out can be reduced even when it occurs.

    Abstract translation: 经过老化测试的母板和半导体器件之间的小电流信号的输入和输出通过器件驱动单元进行。 大电流主电源通过设备驱动单元通过母线供应,而不通过母板。 以这种方式,即使发生烧伤基板和老化插座中的烧毁风险以及由于烧坏造成的损坏,也可以减少。

    Unit for varying a temperature of a test piece and testing instrument incorporating same
    26.
    发明授权
    Unit for varying a temperature of a test piece and testing instrument incorporating same 有权
    用于改变测试件的温度的单元和包含其的测试仪器

    公开(公告)号:US07115838B2

    公开(公告)日:2006-10-03

    申请号:US10885837

    申请日:2004-07-07

    CPC classification number: H01L21/67109 H05B3/68

    Abstract: A disc-type unit 10 adjusts temperature of a control face 14 by means of a heater 12 and coolant, with a hollow plate 11 to which the heater 12 is secured, a cavity 13 formed in the hollow plate 11 and a piping 20 for supplying the coolant to the cavity 13, the piping 20 opening in the cavity 13, and the coolant being jetted to a portion to which the heater 12 is secured or a portion in proximity thereto and which shows high temperature rise when energizing the heater 12.

    Abstract translation: 盘式单元10通过加热器12和冷却剂来调节控制面14的温度,其中固定有加热器12的中空板11,形成在中空板11中的空腔13和用于供应的管道20 到空腔13的冷却剂,在空腔13中开口的管道20,并且冷却剂被喷射到加热器12被固定的部分或靠近其的部分,并且当加热器12通电时显示高的温度上升。

    Combined board construction for burn-in and burn-in equipment for use
with combined board
    27.
    发明授权
    Combined board construction for burn-in and burn-in equipment for use with combined board 失效
    用于组合板的老化和老化设备的组合板结构

    公开(公告)号:US5574384A

    公开(公告)日:1996-11-12

    申请号:US440589

    申请日:1995-05-15

    Applicant: Kenichi Oi

    Inventor: Kenichi Oi

    CPC classification number: G01R31/2817

    Abstract: An apparatus for burn-in of semiconductor devices has board assemblies including a burn-in board and a driver board. The burn-in board has sockets on a first surface for accepting the semiconductor devices and first terminals extending from the sockets to protrude from a first back side of the burn-in board. The driver board has a second surface carrying an electronic circuit to drive the semiconductor devices and a second back side with second terminals for connecting the electronic circuit to the first terminals. The driver board has an edge connector with terminals for applying power to the electronic circuit. The burn-in board and the driver board are disposed with the first and second back sides facing such that corresponding ones of the first and second terminal can be brought into and out of contact with each other. The board assemblies are supported in a housing wherein the board assemblies form partitions isolating first and second environmental spaces for burn-in and cooling operation. A flexible seal is provided between the burn-in board and the driver board to permit said first and second terminals to be brought into contact with each other by pneumatic operation.

    Abstract translation: 一种用于老化半导体器件的设备具有包括老化板和驱动器板的板组件。 老化板在第一表面上具有用于接受半导体器件的插座和从插座延伸到从老化板的第一背面突出的第一端子。 驱动器板具有承载电子电路以驱动半导体器件的第二表面和具有用于将电子电路连接到第一端子的第二端子的第二背面。 驱动器板具有带有用于向电子电路施加电力的端子的边缘连接器。 老化板和驱动器板被布置成使得第一和第二背面面对,使得第一端子和第二端子中的相应端子可以彼此接触和脱离接触。 板组件支撑在壳体中,其中板组件形成隔离第一和第二环境空间的隔板,用于老化和冷却操作。 在老化板和驱动板之间提供柔性密封,以允许所述第一和第二端子通过气动操作相互接触。

    SNOW ACCRETION TEST METHOD AND SNOW ACCRETION TEST DEVICE

    公开(公告)号:US20240111073A1

    公开(公告)日:2024-04-04

    申请号:US18473869

    申请日:2023-09-25

    Applicant: ESPEC CORP.

    CPC classification number: G01W1/00

    Abstract: In a snow accretion test method, a snow accumulation step of accumulating snow on a specimen, and a snow accretion step of freezing snow accumulated on the specimen in a state where snow is not supplied to the specimen are performed. The snow accumulation step and the snow accretion step are repeatedly performed. In the snow accretion step, the ambient temperature of the specimen is adjusted to a temperature lower than the ambient temperature in the snow accumulation step.

    Environment forming apparatus, program, and method for controlling blower fan

    公开(公告)号:US11762003B2

    公开(公告)日:2023-09-19

    申请号:US17706098

    申请日:2022-03-28

    Applicant: ESPEC CORP.

    Inventor: Keiyu Hagi

    CPC classification number: G01R31/003

    Abstract: An environmental testing apparatus includes: a plurality of blower fans that circulate air-conditioned air between an air conditioning chamber and a test chamber; a plurality of temperature sensors that measure temperature at a plurality of locations in the test chamber and output temperature data; and a control unit that can individually set rotation speed of each blower fan. The control unit executes setting processing for setting the rotation speed of each blower fan in a testing period in a setting period before the testing period. In the setting processing, the control unit changes the rotation speed of the plurality of blower fans a plurality of times, and acquires a plurality of temperature data after each change from the plurality of temperature sensors.

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