公开(公告)号：US20160298396A1

公开(公告)日：2016-10-13

申请号：US14803023

申请日：2015-07-17

Applicant: Probe Technology Services, Inc.

Inventor： Nathan Church

IPC: E21B17/10

CPC classification number: E21B17/1078 ,  E21B17/1021

Abstract: A constant force device has at least a first non-constant axial force driving the first set of arms and a second non-constant axial force driving the second set of arms, where the two sets of arms are offset from one another by 90°. Each of the non-constant axial forces is converted to a radially extending force by the interaction of a force guide and actuator. The force guide is attached to the inner mandrel of the constant force device and is shaped to produce an essentially constant radially extending force through the entire range of motion of the arms. Typically each arm of the pair of arms has a pivoting arm and a telescoping arm where the joint between the pivoting arm and telescoping arm has one or more wheels to reduce friction as the constant force device moves through the tubular. Generally the first pair of arms is opposed to and overlaps by some distance the second pair of arms where the second pair of arms is 90° offset from the first pair of arms. Additional features may include friction reducing members at the joint between the telescoping arm and the pivoting arm, an extension lock, extension limiters, and rotating force guides.

Abstract translation: 恒力装置具有驱动第一组臂的至少第一非恒定轴向力和驱动第二组臂的第二非恒定轴向力，其中两组臂相互偏移90°。 通过力导向器和致动器的相互作用将每个非恒定的轴向力转换成径向延伸的力。 力引导件附接到恒力装置的内心轴上，并且成形为在臂的整个运动范围内产生基本恒定的径向延伸的力。 通常，一对臂的每个臂具有枢转臂和伸缩臂，其中枢转臂和伸缩臂之间的关节具有一个或多个轮，以在恒力装置移动通过管时减少摩擦。 通常，第一对臂与第二对臂相对并重叠一定距离，其中第二对臂与第一对臂相偏90°。 附加特征可以包括在伸缩臂和枢转臂之间的接合处的减摩构件，延伸锁，延伸限制器和旋转力导向件。

公开(公告)号：US08270248B2

公开(公告)日：2012-09-18

申请号：US13025641

申请日：2011-02-11

Applicant: Brian Hurst ,  John L. Marshall

Inventor： Brian Hurst ,  John L. Marshall

IPC: G01V1/40

CPC classification number: G01V1/46

Abstract: A method for initializing the input of each of m receiver channels of a receiving transducer in a well logging tool comprising the steps of selecting a logging tool having a multi-element receiving transducer wherein each element of the multi-element receiving transducer operates in an anti-resonant mode below its resonant frequency, and executing a routine in an initialization mode wherein a predetermined number of run cycles are operated and receiver input responses are measured and averaged for each of the m channels while transmitter firing signals are disabled.

Abstract translation: 一种用于在测井工具中初始化接收换能器的m个接收器通道中的每一个的输入的方法，包括以下步骤：选择具有多元件接收换能器的测井工具，其中多元件接收换能器的每个元件以反 - 谐振模式，并且在初始化模式中执行例程，其中，在禁止发射机触发信号的同时，对预定数量的运行周期进行操作，并且测量每个m个通道的接收机输入响应并对其进行平均。

公开(公告)号：US07372777B2

公开(公告)日：2008-05-13

申请号：US11233611

申请日：2005-09-23

Applicant: Brian Hurst ,  Marvin W. Beckman

Inventor： Brian Hurst ,  Marvin W. Beckman

IPC: H04R17/00

CPC classification number: H04R1/00 ,  B06B1/0633 ,  E21B47/0005

Abstract: A longitudinally segmented acoustic transducer for a cement bond logging (CBL) tool having a plurality of adjoining PZT ring-like segments driven synchronously in parallel by one or more pulses and caused to vibrate in an anti-resonant mode, substantially below the resonant frequency of an individual segment when used in a transmitting application. When used in a receiving application, each of the plurality of transducer rings are caused to vibrate by acoustic signals detected by the transducer array, also in an anti-resonant mode. High speed digital signal processing enables on-depth, high quality data for all azimuths at each depth to be obtained, processed, normalized and either sent to the surface in real time for each 20 Hz firing cycle, as the CBL tool is pulled toward the surface, or stored in a memory module in digital form for later retrieval. Built-in calibration factors used for normalizing the output signals to the operating conditions of use may be accessed at any time.

Abstract translation: 一种用于水泥粘结测井（CBL）工具的纵向分段的声换能器，具有多个邻接的PZT环形段，其通过一个或多个脉冲并行驱动并且以反谐振模式振动，基本上低于谐振频率 在传送应用程序中使用的单个段。 当在接收应用中使用时，通过由换能器阵列检测的声信号也使多个换能器环中的每一个也以反谐振模式振动。 高速数字信号处理使得能够获得，处理，归一化每个深度的所有方位角的深度，高质量数据，并且在每个20Hz的点火周期内实时地发送到表面，因为CBL工具被拉向 表面或以数字形式存储在存储器模块中以供稍后检索。 可以随时访问用于将输出信号归一化到使用条件的内置校准因子。

公开(公告)号：US6064215A

公开(公告)日：2000-05-16

申请号：US057080

申请日：1998-04-08

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/28 ,  G01R31/02

CPC classification number: G01R31/2886

Abstract: A probe card for testing integrated circuits which maintains rigidity and probe alignment at elevated temperatures. The probe card has a number of probes radially oriented on an insulating plate with a nonuniform radial distribution. The probes extend through an insulating ring. The nonuniform radial distribution of probes has gaps which allows for bolt or attachment to attach a rigid plate to the insulating ring. The insulating plate can be made of printed circuit board material, the insulating ring can be made of epoxy. The rigid plate can be made of stainless steel or any other material that maintains rigidity at elevated temperatures. Preferably, the insulating plate also has a stiffener ring located opposite the insulating ring on the top side. The bolts extend through the stiffener ring. The insulating plate has vias which allow the probes to be electrically connected to test electronics located above a top side of the insulating plate. The rigid plate maintains the rigidity of the apparatus and provides heat shielding for the insulating ring and insulating plate. Alternatively, the rigid plate is located above the insulating plate and bolted to the stiffener ring.

Abstract translation: 用于测试集成电路的探针卡，可在高温下保持刚性和探针对准。 探针卡具有径向定向在绝缘板上的多个探头，其具有不均匀的径向分布。 探头延伸穿过绝缘环。 探针的不均匀径向分布具有允许螺栓或连接将刚性板附接到绝缘环的间隙。 绝缘板可以由印刷电路板材料制成，绝缘环可以由环氧树脂制成。 刚性板可以由不锈钢或在升高的温度下保持刚性的任何其他材料制成。 优选地，绝缘板还具有位于顶侧上的绝缘环相对的加强环。 螺栓延伸穿过加强环。 绝缘板具有允许探针电连接到位于绝缘板上侧上方的测试电子装置的通孔。 刚性板保持设备的刚性，并为绝缘环和绝缘板提供热屏蔽。 或者，刚性板位于绝缘板上方并且螺栓连接到加强环上。

公开(公告)号：US5644249A

公开(公告)日：1997-07-01

申请号：US659861

申请日：1996-06-07

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/073 ,  G01R1/06 ,  G01R31/02

CPC classification number: G01R1/07314

Abstract: This invention presents a method and a mechanism for contacting a set of vertical probes of a circuit testing mechanism with a set of pads or bumps of a circuit under test. The vertical probes have a circular cross section, a tip portion of length L1 and a beam portion of length L2, such that the beam portion extends at a right angle to the tip portion. The tip portion is guided through a guide hole to the pads of the circuit under test and the beam portion secured by its end. In this geometry the contact force between the probe and the pad is described by the relation: ##EQU1## where D.sub.v is a vertical deflection of the probe, I is an area moment of inertia of the probe about its axis, and E is a Young's modulus of the probe. The tip length L1 and beam length L2 are selected for each of the vertical probes in such a way the contact force F in this relation is kept constant thus ensuring that the contact force F between the vertical probes and pads remains substantially equal.

Abstract translation: 本发明提出了一种用于使电路测试机构的一组垂直探针与被测电路的一组焊盘或凸块接触的方法和机构。 垂直探针具有圆形横截面，长度为L1的尖端部分和长度为L2的梁部分，使得梁部分与尖端部分成直角地延伸。 尖端部分通过引导孔被引导到待测电路的焊盘，并且梁部分由其端部固定。 在这种几何形状中，探针和垫之间的接触力通过以下关系来描述：其中Dv是探头的垂直偏转，I是探头围绕其轴的面积惯性矩，E是Young 探针的模数。 针对每个垂直探针选择尖端长度L1和光束长度L2，使得该关系中的接触力F保持恒定，从而确保垂直探针和焊盘之间的接触力F保持基本相等。

公开(公告)号：US10962569B2

公开(公告)日：2021-03-30

申请号：US16413609

申请日：2019-05-16

Applicant: Nidec-Read Corporation ,  SV Probe Technology Taiwan Co., Ltd.

Inventor： Michio Kaida ,  Huei Che Yu

IPC: G01R1/073 ,  G01R31/28 ,  G01R1/067

Abstract: Provided are a probe that enables control of a bending direction and can be simply manufactured, an inspection jig using the probe, an inspection device, and a method of manufacturing the probe. A probe has a substantially bar-like shape extending linearly and includes: a tip end portion, a body portion continuous with the tip end portion Pa; and a base end portion continuous with the body portion. The body portion includes a first connection region having a thickness in a thickness direction perpendicular to an axial direction of the bar-like shape that gradually decreases away from the tip end portion, and a second connection region having a thickness that gradually decreases away from the base end portion. A dimension of the body portion in a width direction perpendicular to the thickness direction is larger than dimensions of the tip end portion and the base end portion.

公开(公告)号：US10260854B2

公开(公告)日：2019-04-16

申请号：US15372183

申请日：2016-12-07

Applicant: Jun Zhang

Inventor： Jun Zhang

IPC: G01V3/10 ,  G01V3/18 ,  G01B7/06 ,  G01V3/26 ,  G01V3/08 ,  G01B7/12 ,  G01B7/13 ,  G01V3/28 ,  E21B47/09

Abstract: Various downhole logging tools and methods of using and making the same are disclosed. In one aspect, a downhole logging tool for inspecting one or more well tubulars includes a housing adapted to be supported in the one or more well tubulars by a support cable. A first transmitter, a second transmitter and a third transmitter are positioned in longitudinally spaced-apart relation in the housing and are operable to generate magnetic fields. Driving circuitry is operatively coupled to the first transmitter, the second transmitter and the third transmitter to selectively fire the first transmitter, the second transmitter and the third transmitter in multiple transmission modes to generate magnetic fields to stimulate pulsed eddy currents in the one or more well tubulars. A first receiver is positioned in the housing to sense decaying magnetic fields created by the pulsed eddy currents. Electronic circuitry is operatively coupled to the first receiver to determine a parameter of interest of the one or more well tubular from the sensed decaying magnetic fields.

公开(公告)号：US5884395A

公开(公告)日：1999-03-23

申请号：US835078

申请日：1997-04-04

Applicant: Krzysztof Dabrowiecki ,  January Kister ,  Jerzy Lobacz

Inventor： Krzysztof Dabrowiecki ,  January Kister ,  Jerzy Lobacz

IPC: G01R1/073 ,  H01R43/00 ,  B23P19/00

CPC classification number: G01R1/07342 ,  Y10T29/49002 ,  Y10T29/49117 ,  Y10T29/5313

Abstract: This disclosure proposes an assembly structure for building probe cards to test square integrated circuit chips. The test probe card assembly structure has one or more wings located at 90.degree. angles to each other upon which probes are laid in a parallel manner for attachment to a probe card. This allows construction of the probe card so that probes touch contacts directly. The probe tips do not touch the contacts at an angle .theta., called the fan out angle. The probes also do not differ in their inclination angles .beta.. As a result, the force at which the many probe tips touch the contacts is relatively constant throughout. In addition, the probe tips are less likely to scrub past the surface of the contact onto the insulation surface of the chip and in doing so damage it. The test probe card assembly structure also contains an epoxy groove, which controls epoxy flow so that the position of the probes stays aligned in the correct plane. The epoxy groove also prevents variance in beam length.

Abstract translation: 本公开提出了一种用于构建探针卡以测试方形集成电路芯片的组装结构。 测试探针卡组件结构具有一个或多个彼此成90°角的翼，探针以平行的方式放置在探针卡上以附接到探针卡。 这样可以构建探针卡，使探针直接接触触点。 探头尖端不会以一个角度θ接触触点，称为扇形角度。 探头的倾斜角度β也没有差别。 结果，许多探针尖端触摸触点的力在整个过程中相对恒定。 此外，探针尖端不太可能通过接触表面擦拭到芯片的绝缘表面上，并且损坏它。 测试探针卡组件结构还包含环氧树脂沟槽，其控制环氧树脂流动，使得探针的位置保持在正确的平面内对准。 环氧树脂槽也可以防止光束长度的变化。

公开(公告)号：US5764072A

公开(公告)日：1998-06-09

申请号：US771274

申请日：1996-12-20

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/28 ,  G01R31/02

CPC classification number: G01R31/2886

Abstract: An assembly for making electrical connections to unpackaged integrated circuits using dual contact probes. The probes are said to be dual contact because they contact both the integrated device under test and the testing circuit. The probes have two tips. One tip is located at the end of each leg of the "U"-shaped probe. In operation, the probes are oriented with the legs of the probes extending horizontally and the tips pointing up and down, contacting the IC under test and the testing circuit. The probes are each made of a single piece of metal, and so provide an electrical connection between the IC and testing circuit. Flexing in the legs provides springiness for assuring good contact. The probes are mounted on a rigid block that is rigidly connected to the testing circuit and IC under test. Alignment plates are used to accurately position the probes. The plates can be horizontal or vertical and they have holes or slots that engage parts of the probes. The holes and slots are placed to provide proper positioning of the probes.

Abstract translation: 用于使用双接触探针与未封装的集成电路进行电连接的组件。 这些探针被称为双重接触，因为它们与被测试的集成器件和测试电路接触。 探头有两个提示。 一个尖端位于“U”型探头的每条腿的末端。 在操作中，探头定向成使探头的腿水平延伸，并且尖端朝上和向下指向，接触待测IC和测试电路。 探针各自由单块金属制成，因此在IC和测试电路之间提供电连接。 双腿弯曲提供弹性以保证良好的接触。 探针安装在刚性块上，刚性块刚性连接到测试电路和被测IC。 对准板用于精确定位探针。 板可以是水平的或垂直的，并且它们具有接合探针部分的孔或槽。 放置孔和槽以提供探针的适当定位。

公开(公告)号：US5742174A

公开(公告)日：1998-04-21

申请号：US553069

申请日：1995-11-03

Applicant: January Kister ,  Jerzy Lobacz

Inventor： January Kister ,  Jerzy Lobacz

IPC: G01R1/067 ,  G01R1/073 ,  G01R31/02

CPC classification number: G01R1/07342 ,  G01R1/06733

Abstract: A method and device for accurately mounting a probe in a probe card and for maintaining correct location of the probe tip as the probe is used for electronic testing of an IC pad. A membrane having a slot is attached to a support structure of a probe card. The probe tip is inserted into the slot and the probe is affixed to the membrane at the edges of the slot using silicon rubber. The probe is then mounted in the support structure which has a groove for receiving the probe. A distal end of the probe is bonded to the walls of the groove so that the probe is free to move vertically in the groove, but constrained from moving laterally to prevent side-buckling. The membrane and silicon rubber hold the probe tip in proper location during thermal treating of the probe card assembly. Once mounted in the probe card by this method, the probe and probe tip will maintain proper location as they are used for electronic testing of an IC pad. During testing, the probe tip and attached membrane are deflected from their initial position by force of contact with the IC pad. Upon completion of the test, the contact force is removed from the probe tip. The elasticity of the membrane causes the membrane and the attached probe tip to return to their initial position, ensuring that the probe tip is in the proper location for the next test.

Abstract translation: 一种用于将探头精确地安装在探针卡中并用于在探针用于IC垫的电子测试时保持探针尖端的正确位置的方法和装置。 具有狭缝的膜附接到探针卡的支撑结构。 探头尖端插入槽中，探针用硅橡胶固定在槽边缘的膜上。 然后将探针安装在具有用于接收探针的凹槽的支撑结构中。 探针的远端结合到槽的壁上，使得探针可自由地在凹槽中垂直移动，但是限制横向运动以防止侧向弯曲。 在探针卡组件的热处理过程中，膜和硅橡胶将探针尖端保持在适当的位置。 一旦通过这种方法安装在探针卡中，探针和探针尖端将保持适当的位置，因为它们用于IC垫的电子测试。 在测试期间，探针尖端和连接的膜通过与IC焊盘接触的力而从初始位置偏转。 在测试完成时，接触力从探针尖端移除。 膜的弹性导致膜和附着的探针尖端返回到其初始位置，确保探针尖端处于适当位置进行下一次测试。