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公开(公告)号：US20230100093A1
公开(公告)日：2023-03-30
申请号：US18074325
申请日：2022-12-02
Applicant: ADVANTEST CORPORATION
Inventor： Matthias SAUER , Olaf PÖPPE , Klaus-Dieter HILLIGES
IPC: G01R31/28 , G01R31/319
Abstract: An automated test equipment comprises a tester control configured to broadcast and/or specific upload to matching module input data and/or device-specific data including keys and/or credentials and/or IDs and/or configuration information. The automated test equipment further comprises a channel processing unit configured to transform input data using device specific data in order to obtain device-under-test adapted data for testing the device under test. The channel processing unit further configured to process the DUT data using device specific data in order to evaluate the DUT data. A method and a computer program for testing one or more devices under test in an automated test equipment are also disclosed.
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公开(公告)号：US20230098533A1
公开(公告)日：2023-03-30
申请号：US17838295
申请日：2022-06-13
Applicant: ADVANTEST CORPORATION , Tokyo Institute of Technology
Inventor： Shinji SUGATANI , Takayuki OHBA
IPC: H01L25/065 , H01L21/768 , H01L23/48 , H01L23/60
Abstract: Provided is a stacked device comprising: a plurality of circuit layers each having a circuit portion; an insulating layer configured to cover a plurality of circuit portions included in a part of circuit layers of the plurality of circuit layers, and a plurality of conductive vias provided in the insulating layer and electrically connected to the plurality of circuit portions, wherein the conductive via electrically connected to a partial circuit portion of the plurality of circuit portions is electrically insulated on an end surface on an opposite side to the plurality of circuit portions and the partial circuit portion is broken at least partially along a stacking direction.
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公开(公告)号：US20230048446A1
公开(公告)日：2023-02-16
申请号：US17785680
申请日：2020-10-09
Applicant: ADVANTEST CORPORATION
Inventor： Toshihiro SUGAWARA , Takao SAKURAI
IPC: G01S7/497 , G01S17/89 , G01S17/08 , G01S7/481 , G01S7/4865 , G01S7/4915
Abstract: An optical testing apparatus is used in testing an optical measuring instrument that provides incident light from a light source to an incident object and receives reflected light of the incident light at the incident object. The apparatus includes an incident light receiving section, a light signal providing section, an imaging section, and an optical axis misalignment deriving section. The incident light receiving section receives incident light. The light signal providing section provides a light signal to an incident object after a predetermined delay time since the incident light receiving section has received the incident light. The imaging section images the incident light. The optical axis misalignment deriving section derives misalignment of the optical axis of the incident light with respect to the incident light receiving section based on misalignment between the incident light receiving section and the imaging section as well as an imaging result with the imaging section.
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公开(公告)号：US20220354082A1
公开(公告)日：2022-11-10
申请号：US17633371
申请日：2020-07-10
Applicant: ADVANTEST Corporation
Inventor： Makoto YAMAZAKI
Abstract: According to the present invention, a somatic cell meter includes a somatic cell concentration measuring section, a time constant recording section, and a somatic cell concentration deriving section. The somatic cell concentration measuring section measures the somatic cell concentration of centrifuged raw milk in association with the duration of the centrifugation. The time constant recording section records a time constant in the association relationship between the somatic cell concentration and the duration. The somatic cell concentration deriving section derives the somatic cell concentration based on a measurement result from the somatic cell concentration measuring section and a recorded content from the time constant recording section.
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公开(公告)号：US20220333150A1
公开(公告)日：2022-10-20
申请号：US17764665
申请日：2020-09-01
Applicant: ADVANTEST Corporation
Inventor： Kiyoto Nakamura , Hirokazu Sanpei
Abstract: A biosensor includes: a flow channel through which a liquid sample flows, the liquid sample containing a specific component; a holding sheet that is disposed in the flow channel and holds a substance corresponding to the specific component; and a first temperature sensor that is disposed to correspond to the holding sheet and detects a reaction heat generated by a contact reaction between the specific component and the corresponding substance. The biosensor acquires information on the specific component based on the reaction heat.
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Patent Agency Ranking
公开(公告)号：US20220286114A1
公开(公告)日：2022-09-08
申请号：US17751325
申请日：2022-05-23
Applicant: Advantest Corporation
Inventor： Christian VOLMER
Abstract: Embodiments of the present invention provide a digital signal processing apparatus, including an interpolator, an interpolating convolver, or the like, for providing a plurality of output samples or output values in parallel, such as P output samples provided by P Farrow cores, based on a set of input samples or input values, such as 2P+M−2 samples. The digital signal processing apparatus includes a sample distribution logic or structure configured to provide a plurality of subsets of the set of input samples to a plurality of processing cores, such as interpolation cores (e.g., Farrow cores) that perform processing operations associated with different time shifts, for example with respect to a reference time (e.g., a time associated with the input samples). The sample distribution logic includes a hierarchical tree structure having a plurality of hierarchical levels of splitting nodes.
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公开(公告)号：US20220276090A1
公开(公告)日：2022-09-01
申请号：US17577385
申请日：2022-01-18
Applicant: ADVANTEST CORPORATION
Inventor： Kotaro HASEGAWA , Kouji MIYAUCHI , Go UTAMARU
IPC: G01J1/44
Abstract: A test apparatus includes: an electrical connection unit electrically connected to a terminal of each of a plurality of light emitting devices to be tested; a light source unit for collectively irradiating the plurality of light emitting devices with light; an electrical measurement unit for measuring a photoelectric signal obtained by photoelectrically converting the light irradiated from the light source unit by each light emitting device; a light emission control unit for causing at least one light emitting device to be subjected to light emission processing to emit light; a light measuring unit for measuring light emitted by the at least one light emitting device to be subjected to the light emission processing; and a determination unit determining a quality of each light emitting device on the basis of a measurement result of the electrical measurement unit and a measurement result of the light measuring unit.
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38.发明申请公开(公告)号：US20220260633A1
公开(公告)日：2022-08-18
申请号：US17733805
申请日：2022-04-29
Applicant: Advantest Corporation
Inventor： Shoji KOJIMA
IPC: G01R31/319
Abstract: Embodiments of the present invention provide systems and methods for storing calibration data for a test system operable to test a device under test (DUT). The test system includes one or more channel modules and a device interface. A first part of the calibration data is stored on a non-volatile memory. The non-volatile memory can be disposed in different parts of the test system. The non-volatile memory is located on the device interface and can also be located on one or more of the channel modules, as well as an attachment of the test system. The non-volatile memory is associated with the one or more channel modules. The second part of the calibration data is stored on a non-volatile memory associated with the device-under-test interface.
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39.发明申请公开(公告)号：US20220253375A1
公开(公告)日：2022-08-11
申请号：US17732345
申请日：2022-04-28
Applicant: Advantest Corporation
Inventor： Jochen RIVOIR
Abstract: Embodiments of the present invention provide systems and methods for performing device testing using automatic test equipment that can advantageously utilize relatively large numbers of test scenarios and activities including multiple test steps and resources and that prevents test parameters from conflicting or colliding to improve test performance and accuracy. The test activities of a given test scenario can be configured to be executed concurrently. The test activities can be associated with one or more test parameters characterized by respective test parameter values and/or are associated with one or more constraints
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公开(公告)号：US20220238979A1
公开(公告)日：2022-07-28
申请号：US17721925
申请日：2022-04-15
Applicant: Advantest Corporation
Inventor： Giovanni Bianchi
Abstract: A directional coupler arrangement, comprising: a directional coupler comprising a direct path and a first coupled port and a second coupled port; a compensation arrangement configured to provide a coupling between signals of the first coupled port and of the second coupled port; wherein the compensation arrangement is configured to improve a directivity when compared to a directivity of the directional coupler by the coupling.
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