Abstract:
An apparatus and method of compensating for differences in circuit routing path lengths is described. In one embodiment, a latch is inserted between reset signal generating logic and a pair of flip-flops. When a reset signal is generated, the reset signal is held inside the latch until both flip-flops are reset. A latch reset signal may be generated by the flip-flops to clear the latch. The circuit may be configured to ensure that both flip-flops are reset before the reset signal is disabled.
Abstract:
A method and apparatus for rate-based cell traffic arbitration in a switch are provided, wherein arbitration is provided between eight traffic sources in the form of eight cell bus service modules on the same cell bus. A cell bus controller (CBC) is programmed with an 8-bit Relative Service Delay (RSD) value for each of the eight service modules. The value for each RSD is calculated based on the bandwidths allotted for each service module. This RSD value determines the portion of the total bandwidth of the switch platform reserved for the respective service module. Furthermore, each service module uses an 8-bit Service Delay Accumulator (SDA) register. The SDA register of each service module is configured using an SDA value, wherein the SDA register keeps track of when each of the service modules should receive service. The SDA value is calculated at each cell bus frame time for each of the service modules based on the RSD value for each of the service modules, a request for service, and the minimum SDA value among the service modules during a cell bus frame time. If the bandwidth is under-subscribed, the remaining bandwidth is shared among all eight service modules according to the RSD value of each service module. If the bandwidth is over-subscribed, each service module will have the assigned bandwidth portion decreased according to the RSD values.
Abstract:
A selectable timing delay system which provides for delaying an input signal a specified length of time within a specified tolerance wherein the range and resolution of the selectable timing delay system are so specified that the selected delay within the selected tolerance is obtainable regardless of the relative speed of the integrated circuit chips used in forming the selectable timing delay system.
Abstract:
A method for improving color calls or base calls utilizes current and prior cycle multi-channel intensity data from a sequencing run to model residual cycle buildup. The model is applied to correct the multi-cycle channel intensity for the current cycle. The corrected multi-cycle channel intensity is used for color calls or base calls for the current cycle.
Abstract:
A method for using a calibration standard. The method includes providing a calibration standard. In a specific embodiment, the calibration standard has a substrate, a thickness of material having an edge region; and a conformal material of uniform thickness disposed on the edge region. The standard also has an upper surface pattern having the uniform thickness provided on the edge region. The method also includes using the upper surface pattern for a calibration process on a scanning electron microscope process.
Abstract:
An album includes a front cover panel, a back cover panel, and a spine panel extending between the front and the back cover panels edge-to-edge. A folding arrangement, which couples between a last album page and the back cover panel, includes a flexible sheet having two longitudinal edges coupling at an outer side of last album page and an inner side of the back cover panel to retain the last album page being overlapped on the back cover panel in a slidably movable manner. When the album is folded at an opened position, the front cover panel, the spine panel, and the back cover panel are aligned to form a planer backing for providing a completely plane on the surface of the album.
Abstract:
A method and system for yield similarity of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of yields associated with a first yield, and obtaining a second plurality of yields associated with a second yield. Additionally, the method includes performing a first statistical analysis for the first plurality of yields, determining a first statistical distribution, performing a second statistical analysis for the second plurality of yields, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator. Also, the method includes processing information associated with the indicator, determining a confidence level, processing information associated with the confidence level, and determining whether the first yield and the second yield are similar.
Abstract:
A method and system for interfacing to an electronic device is disclosed. A service provider may receive a request from the electronic device to determine whether any of the specified mobile terminals may be within a specified range of the electronic device. The range may be a default value and/or specified by a user of the electronic device. The service provider may communicate to the electronic device whether any of the specified mobile terminals may be within the specified range. If so, the service provider may communicate information regarding the location of the mobile terminals within range. The service provider may also communicate to the electronic device a map on which the mobile terminals may be placed.
Abstract:
A method and system for processing commonality of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of measured values corresponding to a characteristic associated with the first plurality of semiconductor devices, obtaining a second plurality of measured values corresponding to the characteristic associated with the second plurality of semiconductor devices, performing a first statistical analysis for the first plurality of measured values, determining a first statistical distribution, performing a second statistical analysis for the second plurality of measured values, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator. Also, the method includes processing information associated with the indicator, determining a confidence level, processing information associated with the confidence level, and determining whether the characteristic is stable.
Abstract:
A method for using a calibration standard. The method includes providing a calibration standard. In a specific embodiment, the calibration standard has a substrate, a thickness of material having an edge region; and a conformal material of uniform thickness disposed on the edge region. The standard also has an upper surface pattern having the uniform thickness provided on the edge region. The method also includes using the upper surface pattern for a calibration process on a scanning electron microscope process.