Method and system for calibrating measurement tools for semiconductor device manufacturing
    1.
    发明授权
    Method and system for calibrating measurement tools for semiconductor device manufacturing 有权
    用于校准半导体器件制造测量工具的方法和系统

    公开(公告)号:US08044668B2

    公开(公告)日:2011-10-25

    申请号:US11193016

    申请日:2005-07-29

    Inventor: Eugene Wang Yu Chen

    Abstract: A method and system for calibrating a plurality of measurement systems. The method includes obtaining a first plurality of calibration standards. The first plurality of calibration standards is associated with a plurality of predetermined values. Additionally, the method includes measuring the first plurality of calibration standards by a plurality of measurement systems to obtain a first plurality of measured values, processing information associated with the first plurality of measured values, and selecting a first measurement system from the plurality of measurement systems based on at least information associated with the first plurality of measured values. Moreover, the method includes calibrating the first measurement system with the first plurality of calibration standards, obtaining a second plurality of calibration standards, and measuring the second plurality of calibration standards by the first measurement system to obtain a second plurality of measured values.

    Abstract translation: 一种用于校准多个测量系统的方法和系统。 该方法包括获得第一多个校准标准。 第一多个校准标准与多个预定值相关联。 此外,该方法包括通过多个测量系统来测量第一多个校准标准以获得第一多个测量值,处理与第一多个测量值相关联的信息,以及从多个测量系统中选择第一测量系统 至少基于与第一多个测量值相关联的信息。 此外,该方法包括用第一多个校准标准校准第一测量系统,获得第二多个校准标准,以及通过第一测量系统测量第二多个校准标准以获得第二多个测量值。

    Method and system for yield similarity of semiconductor devices
    2.
    发明授权
    Method and system for yield similarity of semiconductor devices 有权
    半导体器件产量相似性的方法和系统

    公开(公告)号:US07831409B2

    公开(公告)日:2010-11-09

    申请号:US11853794

    申请日:2007-09-11

    Applicant: Eugene Wang

    Inventor: Eugene Wang

    CPC classification number: G01R31/2894

    Abstract: Method and system for yield similarity of semiconductor devices. Embodiments of the present invention provides a method for yield similarity of semiconductor devices. The method includes providing a first plurality of semiconductor devices and a second plurality of semiconductor devices. The method also includes obtaining a first plurality of yields associated with a first yield related to the first plurality of semiconductor devices. The method further includes obtaining a second plurality of yields associated with a second yield related to the second plurality of semiconductor devices. The method also includes providing a processor and performing a first statistical analysis for the first plurality of yields using at least the processor. The method includes determining a first statistical distribution based on at least information associated with the first statistical analysis. The method includes performing a second statistical analysis for the second plurality of yields.

    Abstract translation: 半导体器件产量相似性的方法和系统。 本发明的实施例提供了半导体器件的屈服相似性的方法。 该方法包括提供第一多个半导体器件和第二多个半导体器件。 该方法还包括获得与第一多个半导体器件相关的第一产量相关联的第一多个产量。 该方法还包括获得与第二多个半导体器件相关的第二产量相关联的第二多个产量。 该方法还包括提供处理器并且使用至少该处理器对第一多个产量执行第一统计分析。 该方法包括至少基于与第一统计分析相关联的信息来确定第一统计分布。 该方法包括对第二多个产量执行第二统计分析。

    Monitoring system for collection and distribution of a power consumption information
    3.
    发明申请
    Monitoring system for collection and distribution of a power consumption information 审中-公开
    用于收集和分配功耗信息的监控系统

    公开(公告)号:US20100250161A1

    公开(公告)日:2010-09-30

    申请号:US12383943

    申请日:2009-03-30

    CPC classification number: G01D1/00 G01D4/008 G01D15/00 G07C3/02 H02J13/0013

    Abstract: A monitoring system for collection and distribution of power consumption information. It comprises a first monitoring device that is employed between, and electrically coupled to, a power socket and a first electrical appliance. The monitoring system also comprises a collector device that collects an energy consumption data from the first monitoring device and communicates it to a remote server. The collector device receives monitoring data from a number of electrical appliances with which it is communicatively coupled. Communication between the collector device that receives monitoring data from a number of electrical appliances and the monitoring devices occurs over a power line.

    Abstract translation: 用于收集和分配功耗信息的监控系统。 它包括在电源插座和第一电器之间使用并电耦合到第一监控设备。 监测系统还包括收集器装置,其收集来自第一监测装置的能量消耗数据并将其传送到远程服务器。 收集器装置接收来自与其通信耦合的多个电器的监测数据。 通过电力线路进行从多个电器接收监视数据的收集器装置与监视装置之间的通信。

    Network and method for the localization and customization of new mobile devices employing SIM/smart card
    4.
    发明申请
    Network and method for the localization and customization of new mobile devices employing SIM/smart card 审中-公开
    使用SIM /智能卡的新移动设备的本地化和定制的网络和方法

    公开(公告)号:US20070015538A1

    公开(公告)日:2007-01-18

    申请号:US11183199

    申请日:2005-07-15

    Applicant: Eugene Wang

    Inventor: Eugene Wang

    CPC classification number: H04M1/72525 G06F9/454 H04M1/72572 H04W8/245

    Abstract: A network with mobile devices supports localization and customization. A mobile device performs localization and customization using update packages retrieved from a SIM/Smart card in the mobile device or downloaded from a content server or a DM server. This facilitates localization of mobile devices using SIM/Smart cards that are manufactured for a location/locale/country with a different language/culture from the place where it is used the first time.

    Abstract translation: 具有移动设备的网络支持本地化和定制。 移动设备使用从移动设备中的SIM /智能卡检索的或从内容服务器或DM服务器下载的更新包来执行本地化和定制。 这有助于使用SIM /智能卡进行移动设备的本地化,这是针对具有不同语言/文化的位置/区域/国家/地区使用的地点/国家/地区首次使用的地方/国家/地区制造的。

    Method and system for yield similarity of semiconductor devices

    公开(公告)号:US20060217910A1

    公开(公告)日:2006-09-28

    申请号:US11326089

    申请日:2006-01-04

    Applicant: Eugene Wang

    Inventor: Eugene Wang

    CPC classification number: G01R31/2894

    Abstract: A method and system for yield similarity of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of yields associated with a first yield, and obtaining a second plurality of yields associated with a second yield. Additionally, the method includes performing a first statistical analysis for the first plurality of yields, determining a first statistical distribution, performing a second statistical analysis for the second plurality of yields, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator. Also, the method includes processing information associated with the indicator, determining a confidence level, processing information associated with the confidence level, and determining whether the first yield and the second yield are similar.

    Method and system for processing stability of semiconductor devices
    6.
    发明授权
    Method and system for processing stability of semiconductor devices 有权
    用于处理半导体器件稳定性的方法和系统

    公开(公告)号:US06965844B1

    公开(公告)日:2005-11-15

    申请号:US10880761

    申请日:2004-06-29

    CPC classification number: H01L22/20 H01L2924/0002 H01L2924/00

    Abstract: A method and system for processing stability of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of measured values corresponding to a characteristic, and obtaining a second plurality of measured values corresponding to the characteristic. Additionally, the method includes performing a first statistical analysis for the first plurality of measured values, determining a first statistical distribution, performing a second statistical analysis for the second plurality of measured values, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator. Also, the method includes processing information associated with the indicator, determining a confidence level, processing information associated with the confidence level, and determining whether the characteristic is stable.

    Abstract translation: 一种用于处理半导体器件的稳定性的方法和系统。 该方法包括提供第一多个半导体器件,提供第二多个半导体器件,获得对应于特性的第一多个测量值,以及获得与该特性对应的第二多个测量值。 另外,该方法包括对第一多个测量值执行第一统计分析,确定第一统计分布,对第二多个测量值执行第二统计分析,以及确定第二统计分布。 此外,该方法包括处理与第一统计分布和第二统计分布相关联的信息,以及确定指标。 此外,该方法包括处理与指示符相关联的信息,确定置信水平,处理与置信水平相关联的信息,以及确定特征是否稳定。

    Method and apparatus for providing asynchronous memory functions for bi-directional traffic in a switch platform
    7.
    发明授权
    Method and apparatus for providing asynchronous memory functions for bi-directional traffic in a switch platform 失效
    用于在交换平台中为双向业务提供异步存储器功能的方法和装置

    公开(公告)号:US06438102B1

    公开(公告)日:2002-08-20

    申请号:US09090299

    申请日:1998-06-03

    CPC classification number: H04L49/107 G06F5/16 H04L49/102 H04L49/552

    Abstract: A method and apparatus for providing asynchronous memory functions for bi-directional cell traffic in a switch platform are provided, wherein a parameterized bi-directional FIFO unit controls cell traffic in a switch platform using a first and a second unidirectional FIFO buffer. The first and second unidirectional FIFO buffers each comprises asynchronous read and write ports. A cell size and a word size of the first and second unidirectional FIFO buffers are programmable. The bi-directional FIFO unit is coupled to write at least one cell from and read at least one cell to at lest one asynchronous transfer mode (ATM) interface, at least one frame relay interface, at least one voice interface, and at least one data interface. As such, the first unidirectional FIFO buffer is coupled to write at least one cell from, and the second unidirectional FIFO buffer is coupled to read at least one cell to an ATM interface, a frame relay interface, a voice interface, and a data interface. The first unidirectional FIFO buffer is coupled to read at least one cell to at least one switch, and the second unidirectional FIFO buffer is coupled to write at least one cell from at least one switch, wherein the switch handles cells from sources having a number of bandwidths. The switch is coupled to route the at least one cell between an OC12 trunk line and at least one service module. The service module is coupled to provide the cell to at least one service subscriber using T1, E1, T3, E3, TC3, and OC 12 ports.

    Abstract translation: 提供了一种用于在交换平台中为双向小区业务提供异步存储器功能的方法和装置,其中参数化双向FIFO单元使用第一和第二单向FIFO缓冲器来控制交换平台中的小区业务。 第一和第二单向FIFO缓冲器包括异步读取和写入端口。 第一和第二单向FIFO缓冲器的单元大小和单词大小是可编程的。 双向FIFO单元被耦合以从至少一个小区写入至少一个小区,至少读取一个小区至少一个异步传输模式(ATM)接口,至少一个帧中继接口,至少一个语音接口和至少一个 数据接口。 这样,第一单向FIFO缓冲器被耦合以写入至少一个单元,并且第二单向FIFO缓冲器被耦合以将至少一个单元读取到ATM接口,帧中继接口,语音接口和数据接口 。 耦合第一单向FIFO缓冲器以将至少一个单元读取到至少一个开关,并且第二单向FIFO缓冲器被耦合以从至少一个开关写入至少一个单元,其中该开关处理来自具有多个 带宽。 交换机被耦合以在OC12中继线与至少一个服务模块之间路由至少一个小区。 服务模块被耦合以将小区提供给使用T1,E1,T3,E3,TC3和OC12端口的至少一个服务订户。

    Web based monitoring, management and contest based on collected power consumption data
    9.
    发明申请
    Web based monitoring, management and contest based on collected power consumption data 审中-公开
    基于收集的功耗数据的基于Web的监控,管理和竞赛

    公开(公告)号:US20100250440A1

    公开(公告)日:2010-09-30

    申请号:US12383931

    申请日:2009-03-30

    CPC classification number: G06Q30/0224 G06Q10/06 G06Q30/04 G06Q50/06

    Abstract: A web based monitoring and management system for collection and distribution of power consumption information. The power consumption information is collected by an intelligent power meter in one embodiment, and by a collector device in another. The power consumption information is communicated to a remote server for analysis, reporting and managing a power savings/green energy contest. The collector device or the intelligent power meter receives monitoring data from a number of electrical appliances with which it is communicatively coupled. Communication between the collector device that receives monitoring data from a number of electrical appliances and the monitoring devices occurs over a power line.

    Abstract translation: 一种用于收集和分配功耗信息的基于网络的监控和管理系统。 在一个实施例中,功率消耗信息由智能功率计收集,并且在另一个实施例中由收集器装置收集。 功率消耗信息被传送到远程服务器,用于分析,报告和管理节电/绿色能源竞赛。 收集器装置或智能功率表接收来自与其通信耦合的多个电器的监测数据。 通过电力线路进行从多个电器接收监视数据的收集器装置与监视装置之间的通信。

    Method and system for reliability similarity of semiconductor devices
    10.
    发明授权
    Method and system for reliability similarity of semiconductor devices 有权
    半导体器件的可靠性相似性的方法和系统

    公开(公告)号:US07447610B2

    公开(公告)日:2008-11-04

    申请号:US11252968

    申请日:2005-10-17

    Applicant: Eugene Wang

    Inventor: Eugene Wang

    CPC classification number: G01R31/2894

    Abstract: A method and system for reliability similarity of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, and determining a first reliability associated with the first plurality of semiconductor devices. The first reliability is represented by at least a first probability density function. Additionally, the method includes determining a second reliability associated with the second plurality of semiconductor devices. The second reliability is represented by at least a second probability density function. Moreover, the method includes processing information associated with the first probability density function and the second probability density function, and determining a numerical number based on at least information associated with the first probability density function and the second probability density function. The numerical number is indicative of similarity between the first reliability and the second reliability.

    Abstract translation: 一种半导体器件可靠性相似度的方法和系统。 该方法包括提供第一多个半导体器件,提供第二多个半导体器件,以及确定与第一多个半导体器件相关联的第一可靠性。 第一可靠性由至少第一概率密度函数表示。 另外,该方法包括确定与第二多个半导体器件相关联的第二可靠度。 第二可靠性由至少第二概率密度函数表示。 此外,该方法包括处理与第一概率密度函数和第二概率密度函数相关联的信息,以及至少基于与第一概率密度函数和第二概率密度函数相关联的信息来确定数字。 数字表示第一可靠性和第二可靠性之间的相似度。

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