公开(公告)号：US20100244147A1

公开(公告)日：2010-09-30

申请号：US12382967

申请日：2009-03-27

Applicant: Jeng-Jiun Yang ,  Constantin Bulucea ,  Sandeep R. Bahl

Inventor： Jeng-Jiun Yang ,  Constantin Bulucea ,  Sandeep R. Bahl

IPC: H01L29/78 ,  H01L21/336

CPC classification number: H01L29/7835 ,  H01L21/26513 ,  H01L21/2652 ,  H01L21/26586 ,  H01L21/823807 ,  H01L21/823814 ,  H01L21/823892 ,  H01L27/0922 ,  H01L29/0653 ,  H01L29/0847 ,  H01L29/1045 ,  H01L29/105 ,  H01L29/1083 ,  H01L29/665 ,  H01L29/66659

Abstract: An asymmetric insulated-gate field effect transistor (100U or 102U) provided along an upper surface of a semiconductor body contains first and second source/drain zones (240 and 242 or 280 and 282) laterally separated by a channel zone (244 or 284) of the transistor's body material. A gate electrode (262 or 302) overlies a gate dielectric layer (260 or 300) above the channel zone. A pocket portion (250 or 290) of the body material more heavily doped than laterally adjacent material of the body material extends along largely only the first of the S/D zones and into the channel zone. The vertical dopant profile of the pocket portion is tailored to reach a plurality of local maxima (316-1-316-3) at respective locations (PH-1-PH-3) spaced apart from one another. The tailoring is typically implemented so that the vertical dopant profile of the pocket portion is relatively flat near the upper semiconductor surface. As a result, the transistor has reduced leakage current.

Abstract translation: 沿着半导体主体的上表面设置的非对称绝缘栅场效应晶体管（100U或102U）包含由沟道区（244或284）横向隔开的第一和第二源/漏区（240和242或280和282） 的晶体管的主体材料。 栅电极（262或302）覆盖在沟道区上方的栅介电层（260或300）。 比主体材料的横向相邻材料更重掺杂的主体材料的口袋部分（250或290）在很大程度上仅延伸到第一个S / D区域并进入通道区域。 口袋部分的垂直掺杂剂轮廓被调整为在彼此间隔开的相应位置（PH-1-PH-3）处达到多个局部最大值（316-1-316-3）。 通常实施定制，使得袋部分的垂直掺杂剂分布在上半导体表面附近相对平坦。 结果，晶体管具有减小的漏电流。

公开(公告)号：US20100244131A1

公开(公告)日：2010-09-30

申请号：US12382969

申请日：2009-03-27

Applicant: Constantin Bulucea ,  William D. French ,  Sandeep R. Bahl ,  Jeng-Jiun Yang ,  D. Courtney Parker ,  Peter B. Johnson ,  Donald M. Archer

Inventor： Constantin Bulucea ,  William D. French ,  Sandeep R. Bahl ,  Jeng-Jiun Yang ,  D. Courtney Parker ,  Peter B. Johnson ,  Donald M. Archer

IPC: H01L29/78 ,  H01L21/336 ,  H01L21/265

CPC classification number: H01L29/0847 ,  H01L21/26586 ,  H01L21/82285 ,  H01L21/823807 ,  H01L21/823814 ,  H01L21/8249 ,  H01L27/0623 ,  H01L27/0826 ,  H01L27/0922 ,  H01L29/0653 ,  H01L29/1045 ,  H01L29/1083 ,  H01L29/167 ,  H01L29/66659 ,  H01L29/7835

Abstract: An asymmetric insulated-gate field-effect transistor (100 or 102) has a source (240 or 280) and a drain (242 or 282) laterally separated by a channel zone (244 or 284) of body material (180 or 182) of a semiconductor body. A gate electrode (262 or 302) overlies a gate dielectric layer (260 or 300) above the channel zone. A more heavily doped pocket portion (250 or 290) of the body material extends largely along only the source. The source has a main source portion (240M or 280M) and a more lightly doped lateral source extension (240E or 280E). The drain has a main portion (242M or 282M) and a more lightly doped lateral drain extension (242E or 282E). The drain extension is more lightly doped than the source extension. The maximum concentration of the semiconductor dopant defining the two extensions occurs deeper in the drain extension than in the source extension. Additionally or alternatively, the drain extension extends further laterally below the gate electrode than the source extension. These features enable the threshold voltage to be highly stable with operational time.

Abstract translation: 不对称绝缘栅场效应晶体管（100或102）具有由主体材料（180或182）的沟道区（244或284）横向隔开的源（240或280）和漏极（242或282） 半导体体。 栅电极（262或302）覆盖在沟道区上方的栅介电层（260或300）。 主体材料的更加重掺杂的袋部分（250或290）主要仅沿着源头延伸。 源极具有主源部分（240M或280M）和更轻掺杂的侧向源延伸部（240E或280E）。 漏极具有主要部分（242M或282M）和更轻掺杂的侧向漏极延伸部（242E或282E）。 漏极延伸比源极延伸更轻的掺杂。 限定两个延伸的半导体掺杂剂的最大浓度在漏极延伸中比在源极延伸中更深。 另外或替代地，漏极延伸部在栅极电极之下进一步横向延伸，而不是源极延伸部分。 这些特性使得阈值电压在运行时间内稳定。

公开(公告)号：US07579642B1

公开(公告)日：2009-08-25

申请号：US11407025

申请日：2006-04-18

Applicant: Constantin Bulucea

Inventor： Constantin Bulucea

IPC: H01L27/108 ,  H01L29/94

CPC classification number: H01L29/93 ,  H01L27/0808 ,  H01L29/7391 ,  H03B5/1215 ,  H03B5/1228 ,  H03B5/1243

Abstract: A semiconductor junction varactor utilizes gate enhancement for enabling the varactor to achieve a high ratio of maximum capacitance to minimum capacitance.

Abstract translation: 半导体结变容二极管利用栅极增强来使变容二极管实现最大电容与最小电容的高比率。

公开(公告)号：US07419863B1

公开(公告)日：2008-09-02

申请号：US11215537

申请日：2005-08-29

Applicant: Constantin Bulucea

Inventor： Constantin Bulucea

IPC: H01L21/8238

CPC classification number: H01L21/823892 ,  H01L21/823807 ,  H01L21/823878 ,  H01L27/1203 ,  H01L29/1045 ,  H01L29/665 ,  H01L29/66659 ,  H01L29/7835

Abstract: Complementary IGFETs (210W and 220W or 530 and 540) are fabricated so that the body dopant concentration in each IGFET decreases by at least 10 in moving from a subsurface location in the body material of that IGFET up to one of its source/drain zones. Semiconductor dopant, typically a fast-diffusing species such as aluminum, is introduced into starting semiconductor material to form a relatively uniformly doped region that serves as body material (108) for one of the IGFETs. A remaining part of the starting material serves as body material (268) for the other IGFET. Well dopant is introduced into the body material of each IGFET for establishing the requisite body dopant profile. Alternatively, a cavity is formed through an initial structure having body material (108) doped in the preceding way for one of the IGFETs. Semiconductor material is introduced into the cavity to form the body material (568) for the other IGFET.

Abstract translation: 制造互补IGFET（210W和220W或530和540），使得每个IGFET中的身体掺杂剂浓度从该IGFET的体材料的地下位置移动到其源极/漏极之一时减少至少10个 区域。 通常将诸如铝的快速扩散物质的半导体掺杂物引入起始半导体材料中以形成用作IGFET之一的主体材料（108）的相对均匀的掺杂区域。 起始材料的剩余部分用作另一个IGFET的主体材料（268）。 将良好的掺杂剂引入每个IGFET的主体材料中以建立必需的体掺杂物分布。 或者，通过具有以前述方式掺杂的IGFET的主体材料（108）的初始结构形成空腔。 将半导体材料引入空腔中以形成其它IGFET的主体材料（568）。

公开(公告)号：US08629027B1

公开(公告)日：2014-01-14

申请号：US13079646

申请日：2011-04-04

Applicant: Constantin Bulucea ,  William D. French ,  Sandeep R. Bahl ,  Jeng-Jiun Yang ,  D. Courtney Parker ,  Peter B. Johnson ,  Donald M. Archer

Inventor： Constantin Bulucea ,  William D. French ,  Sandeep R. Bahl ,  Jeng-Jiun Yang ,  D. Courtney Parker ,  Peter B. Johnson ,  Donald M. Archer

IPC: H01L27/088

CPC classification number: H01L29/0847 ,  H01L21/26586 ,  H01L21/82285 ,  H01L21/823807 ,  H01L21/823814 ,  H01L21/8249 ,  H01L27/0623 ,  H01L27/0826 ,  H01L27/0922 ,  H01L29/0653 ,  H01L29/1045 ,  H01L29/1083 ,  H01L29/167 ,  H01L29/66659 ,  H01L29/7835

Abstract: An asymmetric insulated-gate field-effect transistor (100 or 102) has a source (240 or 280) and a drain (242 or 282) laterally separated by a channel zone (244 or 284) of body material (180 or 182) of a semiconductor body. A gate electrode (262 or 302) overlies a gate dielectric layer (260 or 300) above the channel zone. A more heavily doped pocket portion (250 or 290) of the body material extends largely along only the source. The source has a main source portion (240M or 280M) and a more lightly doped lateral source extension (240E or 280E). The drain has a main portion (242M or 282M) and a more lightly doped lateral drain extension (242E or 282E). The drain extension is more lightly doped than the source extension. The maximum concentration of the semiconductor dopant defining the two extensions occurs deeper in the drain extension than in the source extension. Additionally or alternatively, the drain extension extends further laterally below the gate electrode than the source extension. These features enable the threshold voltage to be highly stable with operational time.

Abstract translation: 不对称绝缘栅场效应晶体管（100或102）具有由主体材料（180或182）的沟道区（244或284）横向隔开的源（240或280）和漏极（242或282） 半导体体。 栅电极（262或302）覆盖在沟道区上方的栅介电层（260或300）。 主体材料的更加重掺杂的袋部分（250或290）主要仅沿着源头延伸。 源极具有主源部分（240M或280M）和更轻掺杂的侧向源延伸部（240E或280E）。 漏极具有主要部分（242M或282M）和更轻掺杂的侧向漏极延伸部（242E或282E）。 漏极延伸比源极延伸更轻的掺杂。 限定两个延伸的半导体掺杂剂的最大浓度在漏极延伸中比在源极延伸中更深。 另外或替代地，漏极延伸部在栅极电极之下进一步横向延伸，而不是源极延伸部分。 这些特性使得阈值电压在运行时间内稳定。

公开(公告)号：US08415752B2

公开(公告)日：2013-04-09

申请号：US13348577

申请日：2012-01-11

Applicant: Jeng-Jiun Yang ,  Constantin Bulucea ,  Sandeep R. Bahl

Inventor： Jeng-Jiun Yang ,  Constantin Bulucea ,  Sandeep R. Bahl

IPC: H01L29/78

CPC classification number: H01L29/7835 ,  H01L21/26513 ,  H01L21/2652 ,  H01L21/26586 ,  H01L21/823807 ,  H01L21/823814 ,  H01L21/823892 ,  H01L27/0922 ,  H01L29/0653 ,  H01L29/0847 ,  H01L29/1045 ,  H01L29/105 ,  H01L29/1083 ,  H01L29/665 ,  H01L29/66659

Abstract: An asymmetric insulated-gate field effect transistor (100U or 102U) provided along an upper surface of a semiconductor body contains first and second source/drain zones (240 and 242 or 280 and 282) laterally separated by a channel zone (244 or 284) of the transistor's body material. A gate electrode (262 or 302) overlies a gate dielectric layer (260 or 300) above the channel zone. A pocket portion (250 or 290) of the body material more heavily doped than laterally adjacent material of the body material extends along largely only the first of the S/D zones and into the channel zone. The vertical dopant profile of the pocket portion is tailored to reach a plurality of local maxima (316-1-316-3) at respective locations (PH-1-PH-3) spaced apart from one another. The tailoring is typically implemented so that the vertical dopant profile of the pocket portion is relatively flat near the upper semiconductor surface. As a result, the transistor has reduced leakage current.

Abstract translation: 沿着半导体主体的上表面设置的非对称绝缘栅场效应晶体管（100U或102U）包含由沟道区（244或284）横向隔开的第一和第二源/漏区（240和242或280和282） 的晶体管的主体材料。 栅电极（262或302）覆盖在沟道区上方的栅介电层（260或300）。 比主体材料的横向相邻材料更重掺杂的主体材料的口袋部分（250或290）在很大程度上仅延伸到第一个S / D区域并进入通道区域。 口袋部分的垂直掺杂剂轮廓被调整为在彼此间隔开的相应位置（PH-1-PH-3）处达到多个局部最大值（316-1-316-3）。 通常实施定制，使得袋部分的垂直掺杂剂分布在上半导体表面附近相对平坦。 结果，晶体管具有减小的漏电流。

公开(公告)号：US08410549B2

公开(公告)日：2013-04-02

申请号：US12382968

申请日：2009-03-27

Applicant: Constantin Bulucea ,  Jeng-Jiun Yang ,  William D. French ,  Sandeep R. Bahl ,  D. Courtney Parker

Inventor： Constantin Bulucea ,  Jeng-Jiun Yang ,  William D. French ,  Sandeep R. Bahl ,  D. Courtney Parker

IPC: H01L29/66

CPC classification number: H01L29/0847 ,  H01L21/26513 ,  H01L21/2652 ,  H01L21/2658 ,  H01L21/26586 ,  H01L21/823807 ,  H01L21/823814 ,  H01L21/823892 ,  H01L27/0922 ,  H01L29/0653 ,  H01L29/1045 ,  H01L29/105 ,  H01L29/1083 ,  H01L29/518 ,  H01L29/665 ,  H01L29/66659 ,  H01L29/7833 ,  H01L29/7835

Abstract: Insulated-gate field-effect transistors (“IGFETs”), both symmetric and asymmetric, suitable for a semiconductor fabrication platform that provides IGFETs for analog and digital applications, including mixed-signal applications, utilize empty-well regions in achieving high performance. A relatively small amount of semiconductor well dopant is near the top of each empty well. Each IGFET (100, 102, 112, 114, 124, or 126) has a pair of source/drain zones laterally separated by a channel zone of body material of the empty well (180, 182, 192, 194, 204, or 206). A gate electrode overlies a gate dielectric layer above the channel zone. Each source/drain zone (240, 242, 280, 282, 520, 522, 550, 552, 720, 722, 752, or 752) has a main portion (240M, 242M, 280M, 282M, 520M, 522M, 550M, 552M, 720M, 722M, 752M, or 752M) and a more lightly doped lateral extension (240E, 242E, 280E, 282E, 520E, 522E, 550E, 552E, 720E, 722E, 752E, or 752E). Alternatively or additionally, a more heavily doped pocket portion (250 or 290) of the body material extends along one of the source/drain zones. When present, the pocket portion typically causes the IGFET to be an asymmetric device.

Abstract translation: 对称和非对称的绝缘栅场效应晶体管（IGFET）适用于为模拟和数字应用（包括混合信号应用）提供IGFET的半导体制造平台，利用空井区域实现高性能。 相对少量的半导体阱掺杂剂在每个空的孔的顶部附近。 每个IGFET（100,102,112,114,124或126）具有由空井（180,182,192,194,204或206）的主体材料的通道区横向隔开的一对源/排出区 ）。 栅极电极覆盖在沟道区上方的栅极电介质层。 每个源/漏区（240,242,282,282,520,522,550,552,720,722,752或752）具有主要部分（240M，242M，280M，282M，520M，522M，550M， 552M，720M，722M，752M或752M）和更轻掺杂的侧向延伸部（240E，242E，280E，282E，520E，522E，550E，552E，720E，722E，752E或752E）。 替代地或另外地，主体材料的更加掺杂的凹穴部分（250或290）沿着源极/漏极区域中的一个延伸。 当存在时，口袋部分通常使IGFET成为非对称装置。

公开(公告)号：US20120184077A1

公开(公告)日：2012-07-19

申请号：US13100192

申请日：2011-05-03

Applicant: Sandeep R. Bahl ,  William D. French ,  Constantin Bulucea

Inventor： Sandeep R. Bahl ,  William D. French ,  Constantin Bulucea

IPC: H01L21/336

CPC classification number: H01L29/7835 ,  H01L21/26513 ,  H01L21/26586 ,  H01L21/82285 ,  H01L21/823807 ,  H01L21/823814 ,  H01L21/8249 ,  H01L27/0623 ,  H01L27/0922 ,  H01L29/0653 ,  H01L29/0847 ,  H01L29/1045 ,  H01L29/1083 ,  H01L29/167 ,  H01L29/6659 ,  H01L29/66659

Abstract: An insulated-gate field-effect transistor (100) provided along an upper surface of a semiconductor body contains a pair of source/drain zones (240 and 242) laterally separated by a channel zone (244). A gate electrode (262) overlies a gate dielectric layer (260) above the channel zone. Each source/drain zone includes a main portion (240M or 242M) and a more lightly doped lateral extension (240E or 242E) laterally continuous with the main portion and extending laterally under the gate electrode. The lateral extensions, which terminate the channel zone along the upper semiconductor surface, are respectively largely defined by a pair of semiconductor dopants of different atomic weights. With the transistor being an asymmetric device, the source/drain zones constitute a source and a drain. The lateral extension of the source is then more lightly doped than, and defined with dopant of higher atomic weight, than the lateral extension of the drain.

Abstract translation: 沿着半导体主体的上表面设置的绝缘栅场效应晶体管（100）包含由沟道区（244）横向隔开的一对源极/漏极区（240和242）。 栅电极（262）覆盖沟道区上方的栅介电层（260）。 每个源极/漏极区域包括主要部分（240M或242M）和与主要部分横向连续并在栅电极下方横向延伸的更轻掺杂的横向延伸部（240E或242E）。 沿着上半导体表面终止沟道区的横向延伸部分分别由不同原子量的一对半导体掺杂剂限定。 在晶体管是非对称器件的情况下，源极/漏极区域构成源极和漏极。 源极的横向延伸比起漏极的横向延伸稍微掺杂，并且由原子量较高的掺杂剂限定。

公开(公告)号：US20120181619A1

公开(公告)日：2012-07-19

申请号：US13198601

申请日：2011-08-04

Applicant: Jeng-Jiun Yang ,  Constantin Bulucea

Inventor： Jeng-Jiun Yang ,  Constantin Bulucea

IPC: H01L27/06 ,  H01L27/082

CPC classification number: H01L27/0623 ,  H01L21/82285 ,  H01L21/8249 ,  H01L27/0826

Abstract: A semiconductor structure contains a bipolar transistor (101) and a spacing structure (265-1 or 265-2). The transistor has an emitter (241), a base (243), and a collector (245). The base is formed with an intrinsic base portion (243I), a base link portion (243L), and a base contact portion (245C). The intrinsic base portion is situated below the emitter and above material of the collector. The base link portion extends between the intrinsic base portion and the base contact portions. The spacing structure includes an isolating dielectric layer (267-1 or 267-2) and a spacing component. The dielectric layer extends along the upper semiconductor surface. The spacing component includes a lateral spacing portion (269-1 or 269-2) of largely non-monocrystalline semiconductor material, preferably polycrystalline semiconductor material, situated on the dielectric layer above the base link portion. Opposite first and second upper edges of the lateral spacing portion (275-1 and 277-1) laterally conform to opposite first and second lower edges (297-1 and 299-1) of the base link portion so as to determine, and thereby control, its length.

Abstract translation: 半导体结构包含双极晶体管（101）和间隔结构（265-1或265-2）。 晶体管具有发射极（241），基极（243）和集电极（245）。 基部形成有本征基部（243I），基部连接部（243L）和基部接触部（245C）。 本征基部位于发射极之下和集电极材料之上。 基部连接部在本征基部与基部接触部之间延伸。 间隔结构包括隔离电介质层（267-1或267-2）和间隔部件。 电介质层沿着上半导体表面延伸。 间隔部件包括位于基部连接部分上方的电介质层上的大部分非单晶半导体材料（优选多晶半导体材料）的侧向间隔部分（269-1或269-2）。 横向间隔部分（275-1和277-1）的相对的第一和第二上边缘横向地与基部连杆部分的相对的第一和第二下边缘（297-1和299-1）相一致，以便确定，从而 控制，其长度。

公开(公告)号：US08148777B1

公开(公告)日：2012-04-03

申请号：US12883147

申请日：2010-09-15

Applicant: Constantin Bulucea

Inventor： Constantin Bulucea

IPC: H01L29/02

CPC classification number: H01L21/823892 ,  H01L21/823807 ,  H01L21/823878 ,  H01L27/1203 ,  H01L29/1045 ,  H01L29/665 ,  H01L29/66659 ,  H01L29/7835

Abstract: An insulated-gate field-effect transistor (100, 100V, 140, 150, 150V, 160, 170, 170V, 180, 180V, 190, 210, 210W, 500, 510, or 530; or 220, 220W, or 540) is provided with a hypoabrupt vertical dopant profile below one (104; or 264 or 564) of its source/drain zones for reducing the parasitic capacitance along the pn junction between that source/drain zone and adjoining body material (108; or 268 or 568). In particular, the concentration of semiconductor dopant which defines the conductivity type of the body material increases by at least a factor of 10 in moving from that source/drain zone down to an underlying body-material location no more than 10 times deeper below the upper semiconductor surface than that source/drain zone.

Abstract translation: 绝缘栅场效应晶体管（100,100V，140,150,150V，160,170,170V，180,180V，190,210,210W，500,510或530;或220,220W或540） 在其源极/漏极区的一个（104或264或564）的下方设置有低破坏的垂直掺杂剂轮廓，用于减小沿着该源极/漏极区与相邻主体材料（108;或268或568）之间的pn结的寄生电容 ）。 特别地，限定主体材料的导电类型的半导体掺杂剂的浓度在从该源极/漏极区向下移动到下面的物体 - 物质位置之前至少增加10倍，不超过上部的10倍 半导体表面比该源/漏区。