摘要:
The present invention provides an active matrix substrate in which a peripheral can be narrowed or a gap between adjacent wirings increased to improve a yield. The present invention is an active matrix substrate in which a peripheral region is provided outside a display region. In the active matrix substrate, a first, a second, and a third transistor, a floating wiring, a switching wiring, a main wiring, and a branch wiring electrically connected with the main wiring are arranged in the peripheral region. The floating wiring and branch wiring each electrically connect the first and second transistors and comprise an intersecting portion intersecting with the switching wiring, with the third transistor being provided at the intersecting portion. A gate electrode of the third transistor includes the switching wiring, one of a source electrode and a drain electrode thereof includes the branch wiring, and the other of the source electrode and the drain electrode includes the floating wiring.
摘要:
A functional panel (FP) includes a COM substrate (4) and an SEG substrate (3) that face each other. The functional panel (FP) is combined with a display panel (LP) via an adhesive. The COM substrate (4), which is provided farther from the display panel (LP) than the SEG substrate (3) is, has edges (E1, E2) that face each other. The SEG substrate (3), which is provided closer to the display panel (LP) than the COM substrate (4) is, has (i) an edge (E3) provided along and inside the edge (E1) when viewed from above and (ii) an edge (E4) provided along and inside the edge (E2) when viewed from above. This effectively prevents the occurrence of a defective external shape.
摘要:
An active matrix substrate is provided with first inspection wirings (70, 75) capable of inputting inspection signals to first switching wirings that are not adjacent to each other among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other among the second switching wirings (69, 74), and second inspection wirings (72, 77) capable of inputting inspection signals to first switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the second switching wirings (69, 74).
摘要:
Provided are a display device and a method of manufacturing same, whereby deterioration in image display quality due to display unevenness or shadowing is avoided. An open region is disposed in a source driver mounting region in a position thereof that corresponds to a remaining output region 15 of a source driver 4. Next, a common signal line 30, which connects an FPC connecting region 19 to a common transfer electrode 20a, is formed passing through the open region. It is thus possible to shorten the length of the common signal line 30, and to position the common transfer electrode 20a in a desired location. Consequently, variation in the common signal rounding for each position on a common electrode is mitigated, making it possible to minimize image display unevenness. The width of the open region is also increased, allowing the width of the common signal line 30 to also be increased. Consequently, the load on the common signal line 30 can be reduced.
摘要:
A scan signal line drive circuit (32) for driving switching elements is provided in a frame area (24) of an active matrix substrate (20). A driver TFT element (42) is provided in each circuit section (36) which is part of a scan signal line drive circuit (32). The frame area (24) has a branch line (43) as a second line for supplying a signal to the driver TFT element (42) and a connecting line (44) as a first line connected to the branch line (43). The connecting line (44) and the branch line (43) are connected to each other in a connecting section (60). Both of the sides of the branch line (43), which specify the width of the branch line (43), are disposed in a contact hole (61) in planar view, the contact hole (61) being provided in a second insulating layer.
摘要:
Provided is an active matrix substrate having improved display quality without forming an inspection line in a terminal arrangement region for inspecting short circuit between connection lines. Scanning lines (40) include first scanning lines having input ends for a scanning signal on one end side, and second scanning lines having input ends for a scanning signal the other end side. In a display region (4), the first scanning lines and the second scanning lines are formed alternately one by one. An active matrix substrate (2) includes a first inspection line (70) and a second inspection line (72) that cross each of a plurality of first connection lines (61), and a third inspection line (75) and a fourth inspection line (77) that cross each of a plurality of second connection lines (64). The first to the fourth inspection lines (70, 72, 75, 77) are formed in a frame-shaped wiring region (6), excluding the terminal arrangement region (5) and the display region (4).
摘要:
A stem wiring (13a) having a broad line width is formed above branch wirings (13b) having a narrow line width. In a region where the stem wiring (13a) is connected to the branch wiring (13b), the stem wiring (13a) overlaps with the branch wiring (13b) via a gate insulating film when seen in a plan view, a contact hole is provided in the gate insulating film so as to uncover the branch wiring (13b), and the stem wiring (13a) is electrically connected to the branch wiring (13b) via a connecting conductor formed in the contact hole. Consequently, a TFT array substrate can be achieved, in which a disconnection failure or an abnormal line width is reduced without enlarging the dimension of a driving circuit region.
摘要:
An active matrix substrate is provided with first inspection wirings (70, 75) capable of inputting inspection signals to first switching wirings that are not adjacent to each other among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other among the second switching wirings (69, 74), and second inspection wirings (72, 77) capable of inputting inspection signals to first switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the second switching wirings (69, 74).
摘要:
An active matrix display device is equipped with: a first auxiliary wiring line (700) that intersects a second common wiring line (230) through an insulation film, and that intersects with any of a plurality of first connecting wiring lines (900) through an insulating film; and a second auxiliary wiring line (710) that intersects, across an insulation film, any of a plurality of redundant portions (101), which are the other end portions of each of a plurality source wiring lines (100) and are located outside of a display region (60), and that, in a plan view, is positioned outside of a plurality of second lead-out wiring lines (250) and a first driver circuit, and is capable of being connected electrically to the second common wiring line (230). On each of the plurality of first connecting wiring lines (900), a plurality of intersections (901), where the first auxiliary wiring line (700) and the plurality of first connecting wiring lines (900) intersect, are located closer to the side of a plurality of source terminals (110, 120) than first obstructing portions.
摘要:
An active matrix display device has: a first auxiliary wiring line (700); a second auxiliary wiring line (710) positioned outside of a plurality of second lead-out wiring lines (250) and a first driver circuit in a plan view; and an external auxiliary wiring line (790). Along each of a plurality of connecting wirings (900) are disconnected portions (91) inhibiting electrical connections between a plurality of transmission terminals and first common wiring lines (130). A plurality of intersections (901), where the first auxiliary wiring line (700) and the plurality of connecting wirings (900) intersect, are positioned more to the side of the plurality of transmission terminals than to the disconnected portions (91) in each of the plurality of connecting wiring lines (900).